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tel:2173529330mailto:sales@artisantg.comhttps://artisantg.comhttps://www.artisantg.com/TestMeasurement/83321-1/Teradyne-AI-710-00-Analog-Test-Instrument-Subsystem-VXI-Modulehttps://www.artisantg.com/TestMeasurement/83321-1/Teradyne-AI-710-00-Analog-Test-Instrument-Subsystem-VXI-Module

Ai7- Series Analog Test Instrument SubsystemHigh-Density VXI C-Size Options for Parallel Analog Test

� Tester-Per-Pin analogtesting architecture

� Six independentinstruments behindevery one of the 32analog channels

� Highest densityanalog capabilitiesavailable in a fullycompliant C-sizeVXI instrument

� VXI plug and playdriver supports allWindows NTFramework Appli-cation DevelopmentEnvironments

� High-throughput test-ing of complex mixedsignal modules,boards, and boxes

Teradyne’s Ai7-Series offers a break-through in analog test for C-size VXI.Now VXI system integrators can build testequipment for advanced mixed-signal test-ing using Teradyne’s revolutionary tester-per-pin analog subsystem architecture.

The Ai7-Series of VXI Analog TestInstrument Subsystems offers Teradyne’slatest innovation in capabilities for analogfunctional test in a compact C-size format.It combines superior performance with allthe advantages of a standard, commercial-off-the-shelf (COTS) architecture—flexibili-ty, configurability, high reliability, and loweracquisition and life-cycle costs.

With a VXI plug and play software driverand hardware that is compliant with VXIinterface standards, Ai7-Series instrumentsare easily integrated with other instrumentsin VXI-based test systems.

The functional test capabilities provided bythis Teradyne technology are field-proven ina wide range of commercial and mil/aeroapplications. Teradyne high performanceinstruments have been integrated in testequipment supplied to the U.S. Departmentof Defense and all branches of our armedforces, for years. They are also designed intoa number of third-party test systems.

The Ai7-Series combines superior performance with all the advantages of a standard,commercial-off-the-shelf (COTS) architecture – flexibility, configurable, high reliability,and lower acquisition and life-cycle costs

Tester-Per-Pin Analog Testing Architecture Teradyne’s Ai710 Analog Test Subsystem isthe industry’s first mixed signal subsystemon a card designed specifically to addressthe requirements for real-time signal simu-lation at functional test.

Each channel has 6 independent instru-ments behind each test pin. Each instru-ment can be activated at will, and is con-nected through a unique system tr igger-ing scheme. The test system configura-tion can now be determined by howmany individual Ai7 10 VXI C-size cardsare placed within a test system design.Each Ai7-Series card contains 32 inde-pendent channels for a total of 192instruments in a single VXI C-size slot.

Parallel System Signal Simulation You can now achieve real-time signal emu-lation in a full system functional transferutilizing the parallel nature of a test systemdesigned with the Ai7-Series as its analogcore. Many changes in test technology hadto take place in order for this breakthroughto occur.

A single Ai7 VXI C-size card provides 32 fully functional I/O channels

Every one of the 32 channels has 6 independent instruments that are all available simultaneously. System integration is simplified byreducing the need for switching. Simultaneous stimulus and meas-urement on every channel.

• System integration is sim-plified by reducing theneed for switching

• Simultaneous stimulus andmeasurement on everychannel

Incredible advances in packaging technolo-gies for analog components have led tohuge integration benefits for both DACsand ADCs. Integrated mixed signal func-tions like 32 bit sine wave generation nowcosts much less and comes in very smallpackages. New low-voltage mixed signalmanufacturing processes have provided astep function change in analog designs.

The result is a highly integrated analog test-ing subsystem architecture that providestester-per-pin resources and matrix-freetest system designs.

Each Analog Channel Is Packed withFunctionality Every one of the 32 channels on the Ai710Analog Test Instrument is a testing subsys-tem in itself. Each channel consists of sixindependent test resources available, at allthe times, to provide stimulus and meas-urement capabilities.

� Function GeneratorProviding all standard waveforms, including sine,square, triangle wave at speeds up to 5 MHz.

� Arbitrary Waveform GeneratorA full 2 M-sample of RAM on each channel pro-vides both complex wave forms and a digital testmode capability up to 1 MHz.

� DigitizerEvery channel has 2 M of data for capture andanalysis at a rate up to 1M s. Use this in normaltesting, diagnostics, and debug.

� DMMA full feature 12 Bit DMM with DC/AC, voltage,and current measure capabilities.

� Limit DetectorThis dual threshold detector is useful for peaksignal and glitch detection across the full 200volts measurement range.

� Timer CounterThe Timer Counter measures frequency andpulse widths and provides triggers for start andstop between channels at speeds up to 10 Mhz.

� Source RangesAi-710 +/- 12VAi-712 -1V to +20V

This rounds out the full complement ofeach channel capability.

Easy program integration, application level software tools

Ai7-Series soft front panel provides applicatonlevel “Bench Top” tools.

Every Channel Has Phase SynchronousOperationOne of the unique architectural advantagesdesigned into the Ai7-Series is its full inter-channel triggering cababilities. Each chan-nel can share trigger events with everyother channel, providing a high reliabilitytriggering mechanism useful across a widevariety of applications.

The Ai7-Series VXI plug and play software driv-er supports a soft front panel and programminginterface for all Windows NT® applicationsdevelopment environments (ADEs):

� The soft front panel provides interactive, graphi-cal instrument control for access to all applica-tions level instrument functions.

� Every instrument on every channel can be accessedfor “bench top” testing and program debug.

� The Applications Programing Interface providesprogrammatic access to the Ai7-Series hardwareand supports the popular ADEs, includingNational Instruments LabView™, VEE™ andMicrosoft’s C++™.

Faster Programing and DebuggingRapid test program development starts withthe Ai7-Series full featured software driverand intuitive graphical user interface. Giventhe complexity in today’s mixed signal testrequirements, fast programing developmentand a quick response to hardware changes area critical part of any project success.

With the Ai7-Series, all of your analog testprograming can be accomplished through asingle driver package and user interface and

all of your support can come from a singlephone call. With the Ai7-Series, you have agreat opportunity to reduce product cost andbetter meet the challenges of today’s function-al test environments.

Test Development is Easy UsingTestStud io for t he Ai7-Ser iesTight integration of Teradyne’s open-architec-ture ATE operating environment, TestStudio,provides a flexible and modular approach formanaging the test development process.

Programming the Ai7-Series functions withinTestStudio becomes as easy as a push of a but-ton with the web-based user interface. Analogtests are defined within TestStudio as highlevel applications functions such as MeasureVoltage between two pins or Provide a sinewave on five pins. Teradyne provides themeans to minimize complex programing stepswith fast test program development andrepeatable results.

Industry Standard Format, BreakthroughArchitectureThe Ai7-Series is fully compliant with C-sizeVXI standard ( IEEE Std 1155-1992) interfacespecifications. The VXI bus supports externalcommunications, including synchronizationand triggering for precise digital testing.

TestStudio Integration makes test development quick and easy

www.teradyne.com/cbti

Founded in 1960, Teradyne is the world's largest supplier of automatic testequipment and high-performance interconnection systems for the electronics,telecommunications, and Internet industries.

Teradyne engineers real-world solutions with leading edge technology to over-come today’s design, manufacturing and test challenges, so customers candeliver technologically differentiated products to their markets faster and morecost effectively than the competition.

Our worldwide operations include more than 50 regional centers, offeringconvenient local resources for sales, service, and applications engineering sup-port to Teradyne customers throughout the world.

Teradyne – Because Technology Never Stops

TEL: +1.978.589.7000FAX: +1.978.589.2064

Teradyne reserves the r ight to change specifications without notice. Appearanceof the final, delivered product may vary from the photographs shown herein.The appearance of the actual shipped product may vary from the product pho-tography shown here. Spectrum, TestStudio, M9-Series, LASAR, PRISM, Ai7-Series, and VICTORY are trademarks of Teradyne, Inc.

Other product names are trademarks of their respective manufacturers.

© 2002 Teradyne, Inc. All Rights Reserved. Printed in USA. 000C043-0402

Teradyne is proud of its long history ofproviding test and inspection equipment,software and support to meet the mostdemanding specifications for all of ourcustomers. Teradyne has applied 40 yearsof experience in the electronics test indus-try to ensure the reliability of the Ai7-Series and minimize support costs:

� Shake and vibration testing and electrical stresstesting ensure that the Ai7-Series is ruggedenough for shipboard or mobile environments.

� Rigorous reliability testing maximizes MeanTime Between Failures (MTBF), and high-densi-ty packaging reduces the number of components and interconnections.

� To minimize Mean Time To Repair (MTTR),complete board assemblies are replaced, not submodules. With only one assembly type to stock,spares provisioning is simplified.

Self-test software efficiently verifies hard-ware performance using only internalresources:

� Confidence testing verifies functionality auto-matically, in seconds, to confirm basic instru-ment capabilities.

� Self-test software isolates instrument failures to asingle line replaceable unit, a process that takesless than one minute.

On-board calibration hardware and soft-ware in the Ai7-Series Driver and SFP pack-age make it easy to insure your systemremains in calibration. Instrument calibra-tion can be performed semi-automaticallyin the field by connecting NIST-traceableinstrument standards to an Ai7-Series front-panel connector.

Worldwide support for Ai7-Series hardwareand software A leading supplier of commercial-off-the-shelf (COTS) test equipment for mil/aeroapplications, Teradyne has extensive experi-ence in providing integrated hardware andsoftware support to customers worldwide.

Teradyne support services include:

� 24-hour repair-and-return of defective parts.

� Access to ATD customer telephone assistance.

� Comprehensive training and documentation.

� Expert field applications team for on-site support.

The Ai7-Seriesminimizes costin every stageof test

Teradyne, Inc.Assembly Test Division7 Technology Park DriveWestford, MA 01886

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