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AFM course & SMM
- Calibration- Applications (semicon, materials, bio)
- Advanced solutions
Ferry Kienberger
Keysight Labs Austria
SPM2.0, Montpellier,
Jan 20187500 SMM
Page
Overview- Keysight background in SPM2.0
- Goal of this course and summary
- AFM overview:- Basics- AFM high resolution topographical imaging- AFM single molecule force measurements- AFM demo on the 5500
- GHz modeling EMPro overview and demo
- GHz network test with VNA (Fieldfox demo and antenna)
- SMM:- Technology overview including calibration and dopant density- SMM demo on complex impedance and semicon dopant profiling
Linz JKU
LinzKeysight
Nano-AFM
microscopy
Electrical, bio-
and materials
science
RF/microwave
equipment
Cell phone,
WiFi, Radar,
defense
Modeling
software
EMPro, ADS
for semicon
devices
The past
RF engineersNano & materials
Theory & modeling
Current, the SMM
Nano-AFM
microscopy
Electrical, bio-
and materials
science
RF/microwave
equipment
Cell phone,
WiFi, Radar,
defense
Modeling
software
EMPro, ADS
for semicon
devices
Future: the SMM for new
science
Nano-AFM
microscopy
Electrical, bio-
and materials
science
RF/microwave
equipment
Cell phone,
WiFi, Radar,
defense
Modeling
software
EMPro, ADS
for semicon
devicesCondensed matter
physics (eg topological
Insulators): phycisists & materials science
Semicon materials
(eg spintronics):Semicon industry
Single ion-channel
@ GHz frequency:Bio-experts
MD/Atomistic/quantum
Mechanic modeling
(nano-sec vs GHz)3D inverse scattering
Imaging: mathematicians
Current, the SMM
Nano-AFM
microscopy
Electrical, bio-
and materials
science
RF/microwave
equipment
Cell phone,
WiFi, Radar,
defense
Modeling
software
EMPro, ADS
for semicon
devices
Eigler, IBM
On-wafer
Probing Free-Space
Propagation
RF instrumentation
5G
VNA
VNA
www.agilent.com/find/backtobasic
sPage 9
Grundlagen der vektoriellen
Netzwerkanalyse VNA
learning@agilent
What Types of Devices are Tested?
Device type ActivePassive
Inte
gra
tio
nH
igh
Low
Antennas
Switches
Multiplexers
Mixers
Samplers
Multipliers
Diodes
Duplexers
Diplexers
Filters
Couplers
Bridges
Splitters, dividers
Combiners
Isolators
Circulators
Attenuators
Adapters
Opens, shorts, loads
Delay lines
Cables
Transmission lines
Waveguide
Resonators
Dielectrics
R, L, C's
RFICs
MMICs
T/R modules
Transceivers
Receivers
Tuners
Converters
VCAs
Amplifiers
VCOs
VTFs
Oscillators
Modulators
VCAtten’s
Transistors
VNA
Page
Handset antennas & compliance testing
e.g SAR (specific absorption rates)
High speed connectors
Aerospace and defense,
Radar applications
What EMPro
is typically
used for…
EMPro
Agilent EEsof
EMPro
Agilent EEsof
Antenna integration
3D EM modelingEMPro
Agilent EEsofRADAR and defense applications
3D EM modelingEMPro
University of LinzAltenbergerstr. 69, A-4040 Linz, Austria
1. Atomic force microscopy basics
Dr. Ferry Kienberger
Agilent LaboratoriesPage 16
Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM)
Dr. Ferry Kienberger
Agilent LaboratoriesPage 19
How does an AFM work?
In the dark you scan with your finger over the table
• high and round
• hard and soft
• sticky
• warm and cold
Brain convolutes the sensations into an image
Breakfast Table
AFM convolutes nanoscale objects on the surface into a3D topography map plus different material properties
Atomic Force Microscopy (AFM)
Atomic Force Microscope (AFM)
Atomic Force Microscope (AFM)
Atomic Force Microscope (AFM)
Dr. Ferry Kienberger
Agilent LaboratoriesPage 24
AFM Imaging and Tips
Dr. Ferry Kienberger
Agilent LaboratoriesPage 25
Agilent AFM Product - Modularity
Large StageEnvironmental
ControlVideo Microscopy
Stand Alone
Inverted Light
Microscope
Dr. Ferry Kienberger
Agilent Laboratories
Guangzhou, June 17Page 26
11 µm scan
Approx. 2400X
90 x 90 µm scan
Cell imaging:
(top) Erythrocytes(red blood cells)
(bottom) mouse lung
Endothelial cells
Integration with optics Simply put the AFM on top of inverted light mic- Standard optics from top, fluorescence from bottom
Dr. Ferry Kienberger
Agilent Laboratories
Guangzhou, June 17Page 27
Imaging in Liquid:Design Consideration of the AFM Scanner
• Top down scanning:
-> no electronics under the sample plate
• Pendulum design and separated piezo plates for unperturbed scanning in xyz, low mechanical noise, fast scanning
• Atomic and Molecular Resolution
• Open liquid cell / closed cell /flow-through cell
Dr. Ferry Kienberger
Agilent Laboratories
Guangzhou, June 17Page 28
Scanner: Balanced Pendulum – Ultimate Resolution
Y scan
Laser tracking spot remain fixed relative to AFM cantilever
Balanced pendulum Scanner: scanning faster, more accurate control in XYZ, less noise
Traditional Tube ScannerSimple pendulum: scanning slower, less accurate during turn around, more noise
Atomic Force Microscope (AFM)
Atomic Force Microscope (AFM)
Contact Imaging Mode Dynamic Imaging Mode