ccem.mcmaster.ca/outreach-and-events A HALF-DAY WORKSHOP on focused ion beam techniques. FIB SEMs are core instruments in most microscopy facilities for imaging and analysis and particularly for precision microma- chining applications. New instrument classes and sophisticated automation software options are rapidly expanding their range of potential uses. This workshop will discuss some of these latest developments, such as automated serial sectioning tomography and helium ion microscopy. Four speakers at the cutting edge of FIB development in Canada will present their perspectives on the future of the ﬁeld. Tuesday June 20, 2017 13:00-17:00 University of Ottawa, SITE Building, Room C0136 REGISTRATION Workshop is held in association with the 29th Canadian Materials Science Conference at the University of Ottawa. Registration is done through the conference. Advanced FIB Characterization KEYNOTE SPEAKERS Nabil Bassim Canadian Centre for Electron Microscopy, McMaster University Tong Leung WATLab, Chemistry,University of Waterloo Mike Phaneuf President, Fibics Incorporated, Ottawa Brandon Van Leer FEI

Advanced FIB Characterization - CCEM · Mag- 435KX EHT= 4.7 mm 500 w FIB Imaging SEM FIB Image Probe 30Kv:eo PA Signal A = SE2 Date Sep 2010 ntCern ZEISS MAGNIFYING NANOSCIENCE FoMation

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Page 1: Advanced FIB Characterization - CCEM · Mag- 435KX EHT= 4.7 mm 500 w FIB Imaging SEM FIB Image Probe 30Kv:eo PA Signal A = SE2 Date Sep 2010 ntCern ZEISS MAGNIFYING NANOSCIENCE FoMation

ccem.mcmaster.ca/outreach-and-events

A HALF-DAY WORKSHOP on focused ion beam techniques. FIB SEMs are core instruments in most microscopy facilities for imaging and analysis and particularly for precision microma-chining applications. New instrument classes and sophisticated automation software options are rapidly expanding their range of potential uses. This workshop will discuss some of these latest developments, such as automated serial sectioning tomography and helium ion microscopy. Four speakers at the cutting edge of FIB development in Canada will present their perspectives on the future of the field.

Tuesday June 20, 201713:00-17:00University of Ottawa, SITE Building, Room C0136

R E G I S T R A T I O NWorkshop is held in association with the 29th Canadian Materials Science Conference at the University of Ottawa.Registration is done through the conference.

Advanced

FIB Characterization

K E Y N O T E S P E A K E R S

Nabil BassimCanadian Centre for Electron Microscopy, McMaster UniversityTong LeungWATLab, Chemistry,University of WaterlooMike PhaneufPresident, Fibics Incorporated, OttawaBrandon Van Leer FEI