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1ADMOL, Dresden, Germany February 2004
Konstantin LikharevStony Brook University
Acknowledgments: W. Chen, E. Cimpoiasu, S. Fölling
J. Lee, X. Liu, J. Lukens, X. Ma, A. Mayr, I. Muckra, Ö. Türel
Discussions: P. Adams, J. Barhen, L. Chua T. Ishii, V. Protopopescu, T. Sejnowski
Support: DOE, NSF
References: - K. L., “Electronics Below 10 nm”, in Giga and Nano Challenges in Microelectronics (Elsevier, Amsterdam, 2003), pp. 27-68- Ö. Türel et al., “Nanoelectronic Neuromorphic Networks: New Results”,
http://rsfq1.physics.sunysb.edu/~likharev/nano/Budapest.pdf
CMOL: Devices, Circuits, and ArchitecturesCMOL: Devices, Circuits, and Architectures
2ADMOL, Dresden, Germany February 2004
CMOS TECHNOLOGY
Pentium 4 processor:
• 42 million transistors
• 0.13 m design rules
• > 3 GHz clock frequency
DRAM memories:
4 Gb chips demonstrated
(~ 109 transistors/cm2)
3ADMOL, Dresden, Germany February 2004
VOLTAGE GAIN
(!)
V. Sverdlov, T. Walls, and KKL, IEEE T-ED 50, 1926 (2003)
4ADMOL, Dresden, Germany February 2004
PROBLEM: FAB SENSITIVITY
ND = 31020 cm-3
~0.4nm
50 mV
V. Sverdlov, T. Walls, and KKL, IEEE T-ED 50, 1926 (2003)
5ADMOL, Dresden, Germany February 2004
ULTIMATE CMOS PROSPECTSRANGE
Pessimistic Optimistic
Minimum half-pitch: 45 nm 20 nm
(Yr. 2010) (Yr. 2016)Transistor density:
5109 cm-2 31010 cm-2
5-transistor device density: 1109 cm-2 6109 cm-2
6ADMOL, Dresden, Germany February 2004
CORTICAL CIRCUITRY
Brain:
~ 21010 neural cells
~ few1014 synapses
Areal density: Cells: ~ 1.5107 cm-2
Synapses: ~ 1.01011 cm-2 axon
dendrite
synapse
Each synapse is an “active device”!
7ADMOL, Dresden, Germany February 2004
TRANSISTORS: SET vs FET
gate
drainsource
Choice: G e2/
FET SET
G G
8ADMOL, Dresden, Germany February 2004
SINGLE-ELECTRON TRANSISTOR
Averin and Likharev, 1985 (theory)
Fulton and Dolan, 1987 (experiment)
source drain
islandC1
C2
C0
Vg
V
gate
-2 -1 0 1 2-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
Vt (for Q
0 = 0)
Qe = 0
Qe = e/2
C1 = C
2 = C/2
R1 = R
2 = R/2
kBT = 0.01 e
2/C
-2 -1 0 1 2-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
-2 -1 0 1 2-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
-2 -1 0 1 2-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
-2 -1 0 1 2-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
Cur
rent
I (e
/RC
)
-2 -1 0 1 2-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
Source-drain Voltage V (e/C)
(b)
9ADMOL, Dresden, Germany February 2004
0.1 1 10 100 100010
-19
10-18
10-17
10-16
10-15
C
Isla
nd
Ca
paci
tan
ce (
F)
Island Diameter (nm)
0.1 1 10 100 10001E-3
0.01
0.1
1
10
Ec
En
erg
y (e
V)
Island Diameter (nm)
0.1 1 10 100 10001E-3
0.01
0.1
1
10
Ek
En
erg
y (e
V)
Island Diameter (nm)
0.1 1 10 100 10001E-3
0.01
0.1
1
10
Ea
En
erg
y (e
V)
Island Diameter (nm)
SET PROBLEM #1: FABRICATION
kB300 K
Ec 102 kBT
10ADMOL, Dresden, Germany February 2004
SINGLE-ELECTRON SINGLE-MOLECULE TRANSISTORS
see also:
- E. S. Soldatov et al. JETP Lett. 64, 556 (1996)
- H. Park et al. Nature 407, 57 (2000)
- N. Zhitenev, H. Meng, and Z. Bao PRB 88, 226801 (2002)
J. Park et al. Nature 417, 722 (2002)
11ADMOL, Dresden, Germany February 2004
1
-ne
VS VD
2
single-electron transistor
C0
single-electron trap-0.1 0.0 0.1 0.2 0.3
-0.1
0.0
0.1
0.2
0.3
Curr
en
t (e
/RC
)
Voltage (e/C)
Cc/C = 2C0/C = 1Q1 = -0.425eQ2 = -0.2ekBT/(e2/C) = 0.001
n = 0
n = 1
Vinj
S. Fölling, Ö. Türel, and K.L., 2001
“quasi-fuzzy”dynamics: dp/dt = (1-p) -p,
= 0 exp{e(V-S)/kBTef},
Cc
SINGLE-ELECTRON LATCHING SWITCH
12ADMOL, Dresden, Germany February 2004
P. Dresselhaus et al., 1994
Al/AlOx/Al structure stored an electron for > 12 hrs (at T < 1 K)
SINGLE-ELECTRON LATCHING SWITCH:
low-T prototype
13ADMOL, Dresden, Germany February 2004
SINGLE-ELECTRON LATCHING SWITCH:
possible molecular implementation
N
O
O
N
O
O
R
NN
O
O
O
O
R
R
N
R
C
R
R
N
R
R
C
O
R
N
R
C
R
R
O O
O
R = hexyl
naphthalenediimide group as a transistor
perylenediimide group as a trap
Courtesy A. Mayr (SBU/Chemistry)
(C6H13-)
14ADMOL, Dresden, Germany February 2004
CMOL CONCEPT
CMOSstack
CMOSwiringand
plugs
goldnanowire
levels(nanoimprint)
MOSFET
self-assembledmolecular devices
I/O pin
Si wafer
15ADMOL, Dresden, Germany February 2004
- memories (both embedded and stand-alone)
CMOL: POSSIBLE APPLICATIONS
16ADMOL, Dresden, Germany February 2004
TOWARD CMOL-TYPE MEMORIES
J. Heath and M. Ratner, Phys. Today, May 2003
(picture F. Krausz, HPL)
Y. Chen et al. APL 82, 1610 (2003)
17ADMOL, Dresden, Germany February 2004
- memories (both embedded and stand-alone)
- Boolean logic (??)
- neuromorphic circuits (“CrossNets”)
CMOL: POSSIBLE APPLICATIONS
18ADMOL, Dresden, Germany February 2004
CROSSNET: GENERAL STRUCTURE(feedforward option)
somaj
somak
jk+
jk-
+
+-
-
wjk = {-1, 0, +1}
19ADMOL, Dresden, Germany February 2004
CROSSNET SPECIES
x = y = const = M = 1/tan2x = y = Mx = y = const = M
FlossBar RandBar InBar
Maximum Connectivity: 4M (for RandBar, on the average)
20ADMOL, Dresden, Germany February 2004
Synapse footprint (33 switches per synapse):
As = 2(8F8F)2 for F = 2 nm: As ~ 500 nm2
Synapse density: ~ 21011 cm-2 (@ 61012 cm-2 bits/cm2)
Neural cell density (recurrent network, connectivity 104):
~5107 cm-2 (cf. 1.5107 cm-2 in bio)
Speed (intercell latency): ~ 20 ns @ 100 W/cm2 (R ~ 1010 )
or: ~ 2,000 ns @ 1 W/cm2 (R ~ 1012 )
(cf. ~10 ms in bio)
Performance (for 100 W/cm2):
~ 31012 cm-2 / 20 ns ~ 1020 ops/cm2-s
(cf. ~1016 bits/cm2-s for Prescott)
CROSSNETS: ULTIMATE PERFORMANCE ESTIMATE
21ADMOL, Dresden, Germany February 2004
- binary synaptic weight (for single device)
- randomness (“fuzziness”) of switching
- synaptic weight adjustment• two-terminal devices,• access via 2 nanowires (+ global back gate)
CROSSNET TRAINING CHALLENGES
dp/dt = (1-p) -p, = 0 exp{e(V-S)/kBTef},
22ADMOL, Dresden, Germany February 2004
“GRAY CELL” (SOMA)(fire-rate model, feedforward network)
effective linear gain:g = GRL/R
Training mode: Working mode:
+
-
G
RL
from external tutor
+-
23ADMOL, Dresden, Germany February 2004
WEIGHT IMPORTINTO RECURRENT INBAR
operation mode:
+-
+-
rowselect/unselect
(i) column select/unselect(ii) data to write
semi-selected
fullyselected
semi-selected
un-selected
un-selected
24ADMOL, Dresden, Germany February 2004
HOPFIELD-MODE IMAGE RECOGNITION: DYNAMICS
original B/W image
(1 of 3 taught)
random 40% bits flipped(t = 0)
t/0 = 1 2 3 4 5
where 0 MRLC0
25ADMOL, Dresden, Germany February 2004
HOPFIELD-MODE OPERATION:DEFECT TOLERANCE
InBar CrossNetN = 1664M = 25g/gt = 5
99% fidelity @ 85% bad
devices!
26ADMOL, Dresden, Germany February 2004
FEEDFORWARD NETWORKS:SYNAPSE DISCRETENESS EFFECT
O. Turel et al., 2004
100 cells per layer
averaged over 100 random weight vectors
>98% fidelity at L = 37
27ADMOL, Dresden, Germany February 2004
MULTI-VALUED SYNAPSES
Training mode: Working mode:
Iout = (Vj /R)iniNumber of levels: L = 2n2+1
V0xj
V0xj
Vd V0
RL
(V0)j +Vs
(V0)j +Vs
(V0)j
(V0)k
28ADMOL, Dresden, Germany February 2004
CROSSNET SYSTEM HIERARCHY
I/O SYSTEMSENSOR/
ACTUATOR SYSTEM
WORLD
TUTOR
HIGH SPEED BUS SYSTEM
SOMA SOMA SOMA
“flat”CrossNet
array
Self-evolution possible ?
29ADMOL, Dresden, Germany February 2004
CONCLUSIONS
CMOS: - approaching the end of Moore’s Law
CMOL: - the future of microelectronics?
CrossNets:- natural for CMOL
- ultimately high density @ high speed
- “quasi-fuzzy” (controlled randomness)
- may reproduce: Hopfield networks, feedforward perceptrons
- suitable for globally reinforced training ?
- (promise of) self-evolution ?
30ADMOL, Dresden, Germany February 2004
THANK YOU!THANK YOU!
Suggestions/comments to:
31ADMOL, Dresden, Germany February 2004
CANDIDATE MOLECULES FOR SELF-ASSEMBLING SET
oligo(phenyleneethynylene) wirediimide groupthiol group
N
R
R
NN
O
O
O
O
R = hexyl
N
R
R
C C
n n
n = 3
NN
O
O
O
O
R2
R2
R1
R1
SH
R1
R1
R2
R2
R1
R1
HS
R1
R1
NN
O
O
O
O
R2
R2
R1
R1
R2
R2
R1
R1
NN
O
O
O
O
R2
R2
R2
R2
NN
O
O
O
O
R2
R2
R2
R2
SHHS
R1 = n-hexyl; R2 = i-Pr
32ADMOL, Dresden, Germany February 2004
SELF-ASSEMBLING SETs first results
supporting nanowire structure(Au on Si/SiO2)
I-V curves typical for single-electron transistors
33ADMOL, Dresden, Germany February 2004
RECURRENT CROSSNET
somaj
somak
+
+-
-
+
+-
-
“synaptic plaquettes”
(each serves 4 cell pairs)
34ADMOL, Dresden, Germany February 2004
CROSSNETs: TRAINING
Njal (>72 GFLOPS Linpack) - 165 processors
- 81 node Ethernet - 40 node Myrinet
Acknowledgment: DoD’s DURIP program, AFOSR
Challenges… …and means
-deeply recurrent network (backprop, etc. impossible)
-no access to individual synaptic weight
- possibly, large system sizenecessary for interesting tasks
35ADMOL, Dresden, Germany February 2004
CROSSNET STATISTICS
“Small-world” networks: l ln(N/Mlong)
The World Wide Web: l 3
InBar: l L/3M = (N/9M)1/2
RandBar: l (N/4M)1/2/ln(L/2)
Example:N =107, M = 103
l 5 (cf. the Web)
L2 = (M+1)N
36ADMOL, Dresden, Germany February 2004
RECURRENT CROSSNETS: CHAOTIC DYNAMICS
Effective gain g
xj(t)
g/gc = 1.0
1.1
2.0
3.0
O. Turel, I. Muckra & K.L., 2003
time (R0C0)
M = 16
axon saturation level
256256 InBarg/gc =1.5
M = 16
37ADMOL, Dresden, Germany February 2004
GLOBAL REINFORCEMENT TRAINING (PLANS ONLY)
- Self-evolution: xj = xj(t)
- Inputs: xj(t) = xj
i(t) + xje(t)
- Outputs: xk (t)
- Training:
change (quasi-) global shift S
INPUT
OUTPUT
“HIDDENCELL
FIELD”
38ADMOL, Dresden, Germany February 2004
INBAR-BASED BLOCK
column address decoder
and drivers
line
address
decoder
and
drivers
sense
amps
and
address
coder
bus
drivers
high speed, long distance bus system
bus
drivers