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AAI Corporation J-STD-001F & IPC-A- 610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc.

AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

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Page 1: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

AAI Corporation

J-STD-001F & IPC-A-610FImpacts of a New Revision

Frank Honyotski, Master IPC Trainer (MIT)

STI Electronics, Inc.

Page 2: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Agenda

• J-STD-001F– What’s New– Additions

• IPC-A-610F– What’s New – Additions

• Training

Page 3: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

A New Revision of J-STD-001

• What’s New?– Format

• Removed Space Shuttle symbol– Layout

• Some requirements relocated for readability– Revised Requirements

• Where data supported a change– New Requirements

• To support industry advance

Page 4: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

J-STD-001 Terms & Definitions FOD

• 1.8.3 FOD (Foreign Object Debris) – A generic term for a substance, debris, particulate matter or article

alien to the assembly or system.

Page 5: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

J-STD-001 Requirements Flowdown

• 1.9 Requirements Flowdown…– When an assembly, e.g., daughterboard, is procured, that

assembly should meet the requirements of this standard. The connections from the procured assembly to the manufactured assembly shall [D1D2D3] meet the requirements of this standard.

– If the assembly is manufactured by the same manufacturer, the solder requirements are as stated in the contract for the entire assembly.

– The design and workmanship of COTS items should be evaluated and modified as required to ensure the end-item meets contract performance requirements.

– Modifications shall [D1D2D3] meet the applicable requirements of this standard.

Page 6: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Table 3-1 Maximum Limits of Solder Bath Contaminant

• The balance of an SAC305 lead-free bath shall [N1D2D3] be the items listed in Table 3-1.

• Use of other lead-free solder alloy contamination limits shall [N1D2D3] be on agreement between Manufacturer and User.

Page 7: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

3.8.1 Component and Seal Damage

• Loss of silver-palladium metallization shall [D1D2D3]:– Not expose ceramic on the terminal end face.– Be no greater than 25% of width or thickness on any

termination side (not the end face).– Be no more than 50% on top of a 5 or 3 sided

termination component.

Page 8: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

4.5.1 Gold Removal

• Except as noted above, gold shall [N1PD2D3] be removed:– a. From at least 95% of the surfaces to be soldered of the through-

hole component leads with >2.54 μm [100 μin] gold thickness and all through-hole leads that will be hand soldered regardless of gold thickness.

– b. From 95% of all surfaces to be soldered of surface mount components regardless of gold thickness.

– c. From the surfaces to be soldered of solder terminals plated with >2.54 μm [100 μin] of gold thickness and from all solder cup terminals, regardless of gold thickness.

Page 9: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Solder Connection Anomalies

• Table 4-1 added to include solder anomalies not just defects.Table 4-1 Solder Anomalies

Note 1: Solder in the bend radius is not cause for rejection provided the lead is properly formed and the topside bend radius is discernible.

Criteria Class 1 Class 2 Class 3Fractured solder DefectDisturbed solder DefectIncomplete reflow of solder paste DefectCold or rosin solder DefectEvidence of dewetting that causes the solder connection to not meet the solder fillet requirements

Defect

Solder has not wetted to the land or termination where solder is required

Defect

Solder that violates minimum electrical clearance DefectSolder that contacts the component body (except as noted in other clauses)

Defect

Does not comply with wetting criteria of 4.18 DefectSolder bridging except when path is present by design DefectBlowholes and pinholes providing the solder connection meets all other requirements

Acceptable Process Indicator

Solder that obscures the stress relief bend of through-hole components, Note 1

Acceptable Defect

Page 10: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Jumper Wires

• 5.6 Jumper Wires Jumper wires shall [N1D2D3] be permitted only by drawing(s)/engineering documentation or other contractual action. When the criteria for jumper wires is not specified by engineering documentation, the requirements of 5.6.1 through 5.6.6.4 shall [N1D2D3] apply. See IPC-7711/7721 and IPC-A-610 for additional information.

• Jumper wire information now matches 610.

Page 11: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Through-Hole Mounting and Terminations

• Table 6-2 Components with spacers added to through-hole.Table 6-2 Components with Spacers

Page 12: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Hold Down of Surface Mount Leads/Components

• 7.4 Hold Down of Surface Mount Leads/Components – Surface mounted device leads or components shall not [N1N2D3]

be pressed down against the PCB land or other mating surface during the soldering operation or during solder solidification.

– NOTE: Mechanically constrained devices such as connector securing tabs or holding a part over a pad from the sides during soldering is not the same as pressing the component down to the land.

Page 13: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Butt/I Connection-Solder Charged Termination (NEW)

• 7.5.10.2 Butt/I Connections – Solder Charged Terminations– These criteria are for components designed with a hole or holes in

the lead, a bump on the bottom to assure a good (G) fillet thickness across most of the bottom, and an attached solder slug to control the amount of solder. Connections formed to solder-charged leads positioned perpendicular to a circuit land in a butt/I configuration shall [D1D2D3] meet the dimensional and solder fillet requirements of Table 7-11; see Figure 7-11.

Page 14: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Butt/I Connection-Solder Charged Termination (NEW)

Page 15: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

P-Style Terminations(NEW)

• 7.5.18 P-Style Terminations – Connections formed to components having the P-Style

termination (Figure 7-19) shall [D1D2D3] meet the dimensional and solder fillet requirements of Table 7-21. This termination style is typically found on edge mounted connectors that will be soldered on both sides of the board.

Page 16: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

P-Style Terminations(NEW)

Table 7-21 Dimensional Criteria – P-Style Terminations

Page 17: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

10 Coating, Encapsulation and Staking(Adhesive)

• Entire section reworded and new criteria added.

Page 18: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Witness (Torque/ Anti-Tampering) Stripe (NEW)

• 11 Witness (Torque /Anti-Tampering) Stripe – If torque (witness/anti-tampering) stripe is required, the

following criteria shall [N1N2D3] be used:– a. Be continuous between the fastener and the

substrate.– b. Be undisturbed.– c. Extend from the top of the fastener onto the adjacent

substrate (at minimum).– d. Be aligned with the center line of the fastener.

Page 19: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Appendix C(NEW)

• J-STD-001 Guidance on Objective Evidence of Material Compatibility– Overview

• Most electronics assembly operations are a series of mechanical, thermal, and chemical processes, each having a potentially adverse effect on the long term functionality and reliability of the assembled product.

• The average electronic assembly will have been subjected to at least 20 different chemical processes, many employing especially aggressive chemicals.

• To accurately determine that mixtures of these various chemicals do not produce adverse effects, the Manufacturer needs to have examined chemical interactions within their chosen material sets. J-STD-001 has always required that “objective evidence” of “chemical compatibility” be on hand for review.

• This appendix was generated by a focus group of the J-STD-001 committee to generate guidance on this issue.

Page 20: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

IPC-A-610F

Page 21: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Personnel Proficiency(NEW)

• 1.3 Personnel Proficiency – All instructors, operators, and inspection personnel shall be

proficient in the tasks to be performed. – Objective evidence of that proficiency shall be maintained and

available for review. • Objective evidence should include records of training to the

applicable job functions being performed, work experience, testing to the requirements of this standard, and/or results of periodic reviews of proficiency.

– Supervised on-the-job training is acceptable until proficiency is demonstrated.

Page 22: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Supported Holes- Solder

• Added criteria for Class 2 vertical fill for components with 14 or more leads and Less than 14 leads.

Page 23: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Chip Components – Billboarding

• Changed the Class 3 Acceptable criteria.– For components size 1206 or smaller:

• Component has 3 or more termination faces (metallization).

Page 24: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

8.3.5 Flat Gull Wing Leads

• Maximum Toe Overhang for Class 2,3– Not permitted when (L) is less than 3 (W)

Page 25: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Butt/I Connections- Solder Charged Terminations(NEW)

• Same as J-STD-001F

Page 26: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

P-Style Connections(NEW)

• Same as J-STD-001F

Page 27: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

9.2 Chip Resistor Element

• Acceptable – Class 1, 2, 3– No damage to the resistive element or glass coating.– No exposure of the resistive element.

• Reference to 1206 size component removed.

Page 28: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

9.13 Threaded Items and Hardware (NEW)

• Defect - Class 1,2,3– Evidence of damage resulting from over-tightening of

the threaded item.

Page 29: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

10.2.4 Laminate Conditions - Haloing

• Criteria separated from edge delamination.• Edge delamination combined with Nicks and crazing.

Page 30: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

10.4 Flexible and Rigid-Flex Printed Circuitry

• Criteria changed to more closely align with IPC-A600.

Page 31: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

10.5.5.2 Marking – Labels – Readability

• Removed the laser and wand type scanner and replaced with code can be read with 3 or fewer attempts.

Page 32: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

10.8.4 Electrical Insulation Coating (NEW)

• This material is used to provide insulation to an exposed conductor when conformal coating is insufficient to provide enough protection and encapsulation is too much.

• All of the considerations used for conformal coating are applicable for insulation coating, except the surface where insulation coating is applied is generally not smooth enough for a uniform coating surface.

• Thin coating is not a target attribute. See 10.5.2.2

Page 33: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

10.8.4 Electrical Insulation Coating (NEW)

• The material used is frequently a conformal coat like material with a thickener added.

• Example:– Bolted solder lugs where the edge surface is not fully protected by

conformal coating– Component cases that are electively active– Wire termination, particularly moveable wires

Page 34: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

TRAINING

Page 35: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

J-STD-001F Certification CourseIPC-A-610F Certification Course

• J-STD-001 Certified IPC Trainer (CIT) and Certified IPC Application Specialist (CIS) Training Courses– Currently under development– CIT Beta class to be held December 8-12, 2014

• IPC-A-610 CIT and CIS Training Courses– Currently under development– CIT Beta class to be held February 2-6, 2015

Page 36: AAI Corporation J-STD-001F & IPC-A-610F Impacts of a New Revision Frank Honyotski, Master IPC Trainer (MIT) STI Electronics, Inc

Questions?