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a HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications (+44) 7785-305598 [email protected]

A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications (+44) 7785-305598 [email protected]

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Page 1: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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HIGH SPEED LINEAR DESIGN SEMINARSWITZERLAND – NOVEMBER 2001

EurIng James M. Bryant – Head of European Applications

(+44) 7785-305598

[email protected]

Page 2: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

Several different factors are encouraging the use of low voltage analog circuits:-

High density (sub-micron) IC processes have low breakdown voltages(these processes are valuable for their higher speed and smaller size – which leads to lower cost)

Battery powered equipment is more easily designed with low supply voltages

Low supply voltage tends to result in lower power dissipation,leading to fewer thermal problems, slower ageing, and longer battery life

Page 3: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

Present sub-micron processes have breakdowns of 7 V or less

There are both bipolar and CMOS processes with these feature sizes

The bipolar processes (XFCB and others) are used to manufacturehigh speed analog circuitry such as amplifiers and transceivers

CMOS processes make digital circuits, but are also used to makehigh speed and/or high performance data converters (ADCs and DACs)

and related products such as Direct Digital Synthesis (DDS) circuits

Page 4: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

Present sub-micron processes have breakdowns of 7 V or less

As circuit densities become higher breakdown voltages will be even lower

These processes allow very complex circuitsto be made very cheaply so the trend will continue

Smaller feature sizes also permit faster operation

Page 5: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

But low voltage analog circuits have some problems:-

Reducing the supply voltage does not reduce noise

Techniques to improve headroom affect circuit performance

Low voltage circuitry is often single supply – which complicatesthe design of circuits which work with bipolar signals

Page 6: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

Reducing the supply voltage does not reduce noise

Classical precision analog circuitry used ±15 V supplieswhich allowed signal swings of ±10 V or 20 V pk-pk

Circuits operating from a modern 2.7 V supply will have a signalswing of a little over 2 V pk-pk – a 20 dB loss of dynamic range

Some users cannot tolerate this(Professional audio designers continually request amplifiers and converters with much higher supply voltages!)

Page 7: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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BIT SIZES FOR 2.5 V FULLSCALE CONVERTERS

RESOLUTION

N

2-BIT

4-BIT

6-BIT

8-BIT

10-BIT

12-BIT

14-BIT

16-BIT

18-BIT

20-BIT

22-BIT

24-BIT

2N

4

16

64

256

1,024

4,096

16,384

65,536

262,144

1,048,576

4,194,304

16,777,216

VOLTAGE

(10V FS)

625 mV

156 mV

39.1 mV

9.77mV

2.44 mV

610 V

153 V

38 V

9.54 V

2.38 V

596 nV

149 nV*

ppm FS

250,000

62,500

15,625

3,906

977

244

61

15

4

1

0.24

0.06

% FS

25

6.25

1.56

0.39

0.098

0.024

0.0061

0.0015

0.0004

0.0001

0.000024

0.000006

dB FS

-12

-24

-36

-48

-60

-72

-84

-96

-108

-120

-132

-144

*149nV is the Johnson Noise in a 27kHz BW of a 50 Resistor @ 25°C

Remember: 10-bits and 2.5 V FS yields an LSB of 2.5mV, 1000ppm, or 0.1%.All other values may be calculated by powers of 2.

Page 8: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

Techniques to improve headroom affect circuit performance

The commonest is to make low-voltage analog circuitry “rail-rail”

The term “rail-rail” can apply to input or output circuitry, or both

Rail-rail input stages have disadvantages over classical types

Rail-rail output stages have disadvantages too, but minor ones

Page 9: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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ISSUES WITH RAIL-RAIL INPUT STAGES

CLASSICAL BIPOLAR TRANSISTOR INPUT STAGE

VIN

Low Offset: As Low as 10V

Low Offset Drift: As Low as 0.1V/ºC

Temperature Stable Ibias

Well-Matched Bias Currents

Low Voltage Noise: As Low as 1nV/Hz

High Bias Currents: 50nA - 10A (Except Super-Beta: 50pA - 5nA, More

Complex and Slower)

Medium Current Noise: 1pA/Hz

Page 10: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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ISSUES WITH RAIL-RAIL INPUT STAGES

BIAS-CURRENT COMPENSATED BIPOLAR INPUT

VIN

Low Offset Voltage: As Low as 10V

Low Offset Drift: As Low as 0.1V/ºC

Temperature Stable Ibias

Low Bias Currents: <0.5 - 10nA

Low Voltage Noise: As Low as 1nV/Hz

Poor Bias Current Match (Currents May Even Flow in Opposite Directions)

High Current Noise

Not Very Useful at HF

Page 11: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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ISSUES WITH RAIL-RAIL INPUT STAGES JUNCTION FIELD EFFECT TRANSISTOR (JFET) INPUTOP AMP STAGE SHOWING OFFSET AND DRIFT TRIMS

Offset as Low as 50V

Offset TC ~ 5V/°C

Low Current Noise

Bias Current as Low as 20fA

Ib doubles every 10°C

Tradeoff Between Voltage Noise and Input Capacitances

1

DRIFTTRIM

2

OFFSETTRIM

Page 12: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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RAIL-TO-RAIL INPUT STAGES

Require two long-tailed pairs with inputs in parallel:

Vos, Ib, and CMRR vary over their common mode range

An on-chip inverter may be used to generate a power rail outside the external power supplies, but this adds noise.

It is often possible to use a ‘single-supply” op ampwhich allows the input signal to go to only one ofthe rails (usually ground).

OR

One with NPN BJTs (or P-Channel FETs)One with PNP BJTs (or N-Channel FETs)

Page 13: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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OP-90 PNP INPUT STAGE ALLOWSINPUT TO GO TO THE NEGATIVE RAIL

(“SINGLE-SUPPLY” INPUT)+VS

-VS

+VBIAS

Page 14: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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RAIL-RAIL INPUT STAGE

+VS

-VS

Bias compensation impossible

Bias current changes polarity with common-mode voltage

CMRR is poor at changeover

Circuit is more complex(it is actually two input stages)

Page 15: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

Techniques to improve headroom affect circuit performance

The commonest is to make low-voltage analog circuitry “rail-rail”

The term “rail-rail” can apply to input or output circuitry, or both

Rail-rail input stages have disadvantages over classical types

Rail-rail output stages have disadvantages too, but minor ones

Page 16: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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CLASSICAL OP AMP OUTPUT STAGE

+VS

-VS

OUTPUT

NPN

PNP Unity (X1) voltage gain

Poor headroom

Page 17: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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RAIL-TO-RAIL OUTPUT STAGESHave very small headroom but high gain – which may cause stability problems

SWINGS TO RAILS LIMITEDBY SATURATION VOLTAGE

SWINGS TO RAILS LIMITEDBY FET “ON” RESISTANCE (~100)

+VS

-VS

OUTPUT

PNP

+VS

OUTPUT

NPNNMOS

PMOS

-VS

Page 18: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

A basic problem with modern low voltage analog circuitsis that their supplies are generally unipolar

Classic precision analog circuits had bipolar supplies (usually ±15 V)

Unsurprisingly unipolar supplies complicate systems with bipolar signals

Page 19: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

There are three simple ways of handling bipolar signalsin a system with a unipolar power supply

Generate a negative supply

Provide an offset reference

Use differential signals

Page 20: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

There are three simple ways of handling bipolar signalsin a system with a unipolar power supply

Generate a negative supply

Provide an offset reference

Use differential signals

ADM660

Positivesupply

Negativeoutput

Capacitors are 10 µFlow-ESR types

Page 21: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

There are three simple ways of handling bipolar signalsin a system with a unipolar power supply

Generate a negative supply

Provide an offset reference

Use differential signals

VoltageReference OR

POSITIVE SUPPLY

Page 22: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LOW VOLTAGE, HIGH SPEEDPRECISION ANALOG CIRCUITRY

There are three simple ways of handling bipolar signalsin a system with a unipolar power supply

Generate a negative supply

Provide an offset reference

Use differential signals

ADC

POSITIVE SUPPLY

AD8138

Page 23: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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BASIC PROBLEMS OF HIGH-SPEEDPRECISION ANALOG CIRCUITRY

Most problems with the applications ofprecision high-speed analog circuitry

arise from overlooking basic laws of physics

Page 24: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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MURPHY’S LAW

Any effect which you think can be disregarded, can’t.

Nature always sides with the hidden flaw.

IN ANY SET OF CIRCUMSTANCESTHE WORST THING THAT CAN HAPPEN - WILL

Page 25: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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IMPORTANT COROLLARIES TO MURPHY’S LAW

After it has worked successfully for two weeks, it will fail during the first public demonstration.

Equipment blows to protect fuses.

Interchangeable parts aren’t.

Fail-safes don’t.

Page 26: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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BASIC LAWS INVOLVED IN THE DESIGNOF HIGH SPEED MIXED SIGNAL CIRCUITRY

Ohm’s Law

Kirchoff’s Law

Faraday’s Laws

Lenz’s Law

MURPHY’S LAW!

Page 27: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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PRINTED CIRCUIT BOARD TRACK RESISTANCEOHM’S LAW PREDICTS 1 LSB DROP IN

5cm OF STANDARD PCB TRACK — BUT WHO BELIEVES OHM’S LAW?

FOR 1 OZ. COPPER:

= 1.724 X 10-6 = CM, Y = 0.0038cm

R = 0.45 m

= “NUMBER OF SQUARES”

R = SHEET RESISTANCE FOR 1 SQUARE (Z - X),R = 0.45m/SQUARE

ZX

ZX

Page 28: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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SKIN EFFECT

TOP

BOTTOM

COPPER CONDUCTOR

HF Current flows onlyin thin surface layers

-7

Skin Depth: 6.61 f cm, f in Hz

Skin Resistance: 2.6 x 10 f ohms per square, f in Hz

Since skin currents flow in both sides of a PC track, the value ofskin resistance in PCBs must take account of this

Page 29: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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SKIN EFFECT

GROUND PLANE

PC BOARD(DIELECTRIC)

MICROSTRIPCONDUCTOR(CURRENT FLOW NORMALTO DIAGRAM)

HF CURRENT FLOWS IN ONESIDE OF THE CONDUCTOR ONLY

REGION OF RETURNCURRENT FLOW

Page 30: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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LEAKAGE RESISTANCE ON PC BOARDS

SURFACE LEAKAGE ON A PCB IS UNPREDICTABLE. R1 IS NOT NECESSARILY LESS THAN R2.

IF A VULNERABLE CONDUCTOR IS SURROUNDED BY A GUARD RING (ON BOTH SIDES OF THE BOARD) WHICH IS AT THE SAME POTENTIAL AS THE CONDUCTOR IT IS GUARDING, THE EFFECT OF LEAKAGE RESISTANCE WILL BE MINIMIZED.

LEAKAGE RESISTANCE BETWEEN SURFACE TRACKS ON A PCB IS GENERALLY MUCH LARGER THAN BETWEEN PLATED HOLES.

Page 31: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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A VIRGIN TEFLON STANDOFF INSULATORHAS MUCH LOWER LEAKAGE THAN A

PRINTED CIRCUIT BOARD TRACK

Page 32: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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ELECTROSTATIC DISCHARGE (ESD)

All ICs are vulnerable to ESD damage – sub-micron circuits are especially so

Internal ESD protection circuits may degrade performance: This is a design tradeoff

ESD damage may not be catastrophic, but may degrade performance

Keep IC out of potential discharge paths:Touch conductive foam or the equipment chassisbefore removing or inserting an IC

Page 33: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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THE EQUIVALENT CIRCUITOF A RESISTOR IS NOT

BUT

++

Page 34: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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GAIN OF 100 STAGE

-

+

100 9.9k

INPUT0 - 100mV

OUTPUT0 - 10V

Resistor mismatch due to mismatch of temperature coefficients, mismatch of temperature (possibly due to self-heating), or both, can cause errors.

Ideally, all resistors whose matching can affect accuracy should be fabricated on a single substrate.

Page 35: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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HIGH VALUE RESISTORS

Likely to be Less Stable

and

Non-Linear with Voltage

Page 36: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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RESISTOR JOHNSON NOISE

All Resistors Have Noise: Vn = (4kTBR)

It is possible to reduce the noise of a resistor by reducing T, B, or R but it is NOT possible to reduce k because Boltzmann is dead.

T is Absolute TemperatureB is Bandwidth in HertzR is the Resistance in Ohmsk is Boltzmann’s Constant

(1.38E-23 J/K)

Page 37: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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RESISTOR CAPACITANCE

All Resistors Have Capacitance

There is capacitance between the terminals -there is also capacitance to nearby circuitry

Page 38: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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CAPACITANCE

d

0.00885 E A

dr

r

r

2

2A

Commonest type of PCB uses 1.5mmglass-fiber epoxy material with E = 4.7

Capacity of PC track over ground planeis roughly 2.8pF/cm

C = pF

A = plate area in mm

d = plate separation in mm

E = dielectric constant relative to air

Page 39: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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CAPACITIVE COUPLING EQUIVALENT CIRCUIT

CIN

VN Z1

+

VCOUPLED

-

Z1 = CIRCUIT IMPEDANCE

Z2 = 1/jC

VCOUPLED = VN

Z1

Z1 + Z2

Page 40: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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CAPACITIVE SHIELDING

CAPACITIVE SHIELD INTERRUPTS THE COUPLING ELECTRIC FIELD

EQUIVALENT CIRCUIT ILLUSTRATES HOW A CAPACITIVE SHIELD CAUSES THE NOISE CURRENTS TO RETURN TO

THEIR SOURCE WITHOUT FLOWING THROUGH Z1

Page 41: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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CAPACITIVE EFFECTS DUE TO METAL LIDS

METAL (KOVAR) LID

CERAMIC

SIDEBRAZE CERAMIC D.I.L. PACKAGES SOMETIMES HAVE ISOLATED METAL LIDS.

THESE ARE VULNERABLE TO CAPACITIVE INTERFERENCE AND SHOULD BE GROUNDED (IF POSSIBLE).

Page 42: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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STRAY CAPACITY BETWEEN CHIP BONDWIRES

0.2pF

Page 43: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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WITH A HIGH PERFORMANCE CONVERTER ON AHIGH SPEED DATA BUS, IT IS NOT POSSIBLE TO SHIELD

THE ANALOG PORT FROM THE DIGITAL NOISE

IC

ANALOG PORTFASTDATABUS

Page 44: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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BUFFER LATCH IN A SEPARATE PACKAGEUSED AS A FARADAY SHIELD

LATCH/BUFFER

ANALOG PORTFASTDATABUS

CONVERTER

A BUFFER/LATCH CAN ACT AS A FARADAY SHIELD BETWEEN A FAST DATA BUS AND A HIGH PERFORMANCE CONVERTER.

IT ADDS COST, BOARD AREA, POWER CONSUMPTION, RELIABILITY REDUCTION, DESIGN COMPLEXITY, AND IMPROVED PERFORMANCE.

Page 45: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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EQUIVALENT CIRCUITS OF A REAL CAPACITOR

IDEAL CAPACITOR

MOST GENERAL MODEL OF A REAL CAPACITOR

LEAKAGE CURRENT MODEL

HIGH CURRENT MODEL

HIGH FREQUENCY MODEL

DIELECTRIC ABSORPTION (D.A.) MODEL

Page 46: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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HIGH FREQUENCY DECOUPLING(REQUIRED EVEN BY LF ANALOG CIRCUITS)

SURFACE MOUNTCAPACITOR

IDEAL HF DECOUPLING HAS

1. LOW INDUCTANCE CAPACITOR (MONOLITHIC CERAMIC) 2. MOUNTED VERY CLOSE TO THE IC 3. WITH NO LEADS (SURFACE MOUNT) OR VERY SHORT LEADS 4. AND SHORT, WIDE PC TRACKS

IT MAY BE SHUNTED WITH A TANTALUM BEAD ELECTROLYTIC TO PROVIDE GOOD LF DECOUPLING AS WELL

Page 47: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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CAPACITORS HAVING SIGNIFICANT DIELECTRICABSORPTION ARE USELESS FOR

SAMPLE-AND-HOLD APPLICATIONS

VC

B

+V AV

CAPACITORVOLTAGE

OA B C

SWITCH POSITION

TIME

DIELECTRIC ABSORPTION CAUSES A BRIEFLY DISCHARGED CAPACITOR TO RECOVER A PERCENTAGE OF ITS PREVIOUS

CHARGE ON BEING OPEN CIRCUITED

Page 48: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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INDUCTANCE

L

2R L, R in mm

L

W H

EXAMPLE: 1cm of 0.5mm o.d. wire has an inductance of 7.26nH(2R = 0.5mm, L = 1cm)

2L

R

2L

LW+HW+H

( )

)WIRE INDUCTANCE = 0.0002L ln - 0.75 H

)

(

STRIP INDUCTANCE = 0.0002L ln + 0.2235 + 0.5 H(

EXAMPLE: 1cm of 0.25 mm PC track has an inductance of 9.59 nH

(H = 0.038mm, W = 0.25mm, L = 1cm)

Page 49: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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NONIDEAL AND IMPROVED SIGNAL ROUTING

LOAD

LOAD

LOAD

NONIDEAL SIGNAL TRACE ROUTING

IMPROVED TRACE ROUTING

LOAD

LOAD

LOAD

Page 50: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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BASIC PRINCIPLES OF INDUCTIVE COUPLING

INTERFERENCE CIRCUIT SIGNAL CIRCUIT

M = MUTUAL INDUCTANCEB = MAGNETIC REFLUX DENSITYA = AREA OF SIGNAL LOOP

N = 2fN = FREQUENCY OF NOISE SOURCE

V = INDUCED VOLTAGE = NMIN = wAB

Page 51: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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PROPER SIGNAL ROUTING REDUCESMUTUAL INDUCTANCE

V1

V2

Z1

Z2

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MUTUAL INDUCTANCE AND SIGNAL COUPLINGIN RIBBON CABLE

FLAT RIBBON CABLE WITH SINGLE RETURN HAS LARGE MUTUAL INDUCTANCE BETWEEN CIRCUITS

SEPARATE AND ALTERNATE SIGNAL AND RETURN LINES FOR EACH CIRCUIT REDUCE MUTUAL INDUCTANCE

TWISTED PAIRS REDUCE MUTUAL INDUCTANCE STILL FURTHER

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MAGNETIC SHIELDING

Magnetic shielding is not as easily accomplished as electrostatic shielding, but may be done at HF with a simple conducting screen, and at LF and DC with a screen of high

permeability material such as Mu-metal.

PC Copper foil is effective as a magnetic shield above 20 MHz

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RESONANT CIRCUITS FORMED BYDECOUPLED POWER LINES

SMALL SERIES RESISTANCECLOSE TO THE IC REDUCES THE Q

EQUIVALENT CIRCUITOF DECOUPLED POWERLINE - RESONANT AT

f =1

2 LC

IC IC

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SATURATION

Inductors with solid cores (magnetic alloy or ferrite) will behave non-linearly if required to carry too much current

This is unlikely to be a direct problem in precision circuitry but may affect power supply noise performance and thus affect precision circuitry indirectly.

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STRAY CAPACITANCE MAKES ALL INDUCTORSINTO TUNED CIRCUITS

1

2 LC

RESONANT FREQUENCY =

f =

L

STRAY C

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Q OR “QUALITY FACTOR”

The Q of an inductor or resonant circuit is a measure of the ratio of its reactance to its resistance.

The resistance is the HF and NOT the DC value.

The 3 dB bandwidth of a single tuned circuit is Fc/Q where Fc is the center frequency.

Q = 2f L/R

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KIRCHOFF’S LAW

I

IGROUND RETURN CURRENT

SIGNALSOURCE

ADC

AT ANY POINT IN A CIRCUITTHE ALGEBRAIC SUM OF THE CURRENTS IS ZERO

ORWHAT GOES OUT MUST COME BACK

WHICH LEADS TO THE CONCLUSION THATALL VOLTAGES ARE DIFFERENTIAL

(EVEN IF THEY’RE GROUNDED)

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THE IDEAL GROUND

SIGNAL

INFINITE CONDUCTIVITYZERO VOLTAGE

SIGNALSOURCE

ADC

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A MORE REALISTIC GROUND

SIGNAL

EXTERNALCURRENTSOURCE

SIGNALSOURCE

ADC

VOLTAGE DUE TO SIGNAL CURRENT AND (PERHAPS)

EXTERNAL CURRENT FLOWING IN GROUND IMPEDANCE

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SUPPLY AND GROUND NOISE

Digital circuitry is noisy

Analog circuitry is quiet

Circuit noise from digital circuitry carried by power and ground leads can corrupt precision analog circuitry

It is advisable to separate the power and ground of the digital and analog parts of a system

Analog and digital grounds must be joined at ONE point

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ANALOG AND DIGITAL GROUND

Monolithic and hybrid ADCs frequently have separate AGnd and Dgnd pins which must be joined together at the device.

This is not done from a desire to be difficult, but because the voltage drop in the bondwires is too large to allow the connection to be made internally.

The best solution to the grounding problem arising from this requirement is to connect both pins to system “analog ground.”

It is likely that neither the digital noise so introduced in the system Agnd, nor the loss of digital noise immunity, will seriously affect the system performance.

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Grounding ADCs & DACs

Data Converters (ADCs and DACs)are accurate and sensitive analog devices whose

analog ports are vulnerable to unwanted noise(most advice in this lecture applies to both ADCs & DACs)

Mixed Signal Systems(systems with both analog and digital processing)

often have separate analog and digital ground planesin order to isolate their sensitive analog signals fromthe noise which is often present on the digital ground

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Grounding ADCs & DACs

ADCs & DACsfrequently have separate analog and digital ground pins

(labelled, respectively, AGND and DGND)

These should be connected together andto the analog ground plane of the system

Even if the data sheet suggests otherwise!

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AGND

CONVERTER

DGND

ANALOGCIRCUITRY

DIGITALCIRCUITRY

Grounding ADCs & DACs

A PHILOSOPHICAL PROBLEM!

AGND and DGND should bothbe connected to the analogground plane of the system

The pin description DGND doesNOT imply that this pin shouldgo to the system digital ground

Systemanalogground

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Grounding ADCs & DACs

WHY NOT USE ONE PIN?At high current or high frequency the

impedance of the converter leadsprevents the use of a single ground pin

Low current/low frequency convertersoften do have just one

CONVERTER

AGND DGND

LEAD IMPEDANCES

DIGITALCIRCUITRY

ANALOGCIRCUITRY

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Grounding ADCs & DACs

SO WHY MUST THEY BEJOINED AT THE PACKAGE?

Ground noise at X can affect theanalog circuitry of the converter

via stray capacitances

This noise can be minimisedby minimising the impedancebetween DGND, AGND and the

system analog ground

CONVERTER

AGND DGND

XSTRAYCAPACITANCE

DIGITALCIRCUITRY

ANALOGCIRCUITRY

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Grounding ADCs & DACs

SUPPLY DECOUPLINGThe supply to the digital part of theconverter must be decoupled to the

DGND pin with a low inductancecapacitor having minimum possible

lead and PC track impedance

Digital VDD may be fed from thesystem analog or digital supplies,but should be isolated by a small

impedance in either case

AGND

CONVERTERAnalogVdd

DigitalVdd

ANALOGCIRCUITRY

DIGITALCIRCUITRY

DGND

Analog ordigital supply

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Grounding ADCs & DACs

GROUND RETURN CURRENT

The only current which flowsbetween Analog and digital

system grounds is the returncurrent of the digital interfaces

AGND

CONVERTER

DGND

DIGITALCIRCUITRY

SYSTEMANALOGGROUND

SYSTEMDIGITALGROUND

CIRCULATINGDIGITALCURRENTS

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Grounding ADCs & DACs

BEWARE OF THE BUS!NEVER connect a major data bus

directly to an ADC or DAC

It is a source of noise and mostADCs cannot drive the load

AGND

CONVERTER

DGND

SYSTEMANALOGGROUND

MAJORDATA BUS

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Grounding ADCs & DACs

BUFFER ITPut a buffer between a

data bus and a converter

Even if the converter hasan internal buffer

It minimisesnoise feedthrough

And may improve ADCaccuracy by lowering

power dissipation

AGND

CONVERTER

DGND

SYSTEMANALOGGROUND

SYSTEMDIGITALGROUND

BUFFERBETWEENCONVERTER&ACTIVEOR LOWIMPEDANCEDATA BUS

MINIMALCIRCULATINGDIGITALCURRENTS

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Grounding ADCs & DACs

SLOW DOWN!(If you can)

Fast logic edges at aconverter’s digital portsare a source of noise

Slowing them down withRC networks canreduce this noise

But system timing maynot allow it – take care

AGND

CONVERTER

DGND

SYSTEMANALOGGROUND

R

R

C

C

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Grounding ADCs & DACs

SAMPLINGCLOCKS

In order to minimise phasenoise (jitter), which can

devastate the performanceof a sampled data system,

the sampling clock oscillatorshould be built on the system

analog ground

AGND

CONVERTER

DGND

SYSTEMANALOGGROUND

SAMPLINGCLOCKGENERATOR

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MicroConverter®ANALOGCIRCUITRY

DIGITALCIRCUITRY

AGND DGND

8052MICROCONTROLLER

Grounding ADCs & DACs

THIS GROUNDING SCHEMEIS ALMOST UNIVERSAL

If a converter contains nocomputation, or draws lessthan 30mA supply currentit should use this scheme

If the data sheet suggestsotherwise the data sheet is

probably incorrect

Even the MicroConverter® should be grounded this way System

analogground

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Grounding ADCs & DACsANALOGCIRCUITRY

DIGITALCIRCUITRY

AGND DGND

BIG DSP with CODEC

DSPPROCESSOR

Systemanalogground

Systemdigitalground

BIG DSP DEVICESWITH CODECS

AREAN EXCEPTION

These devices have high(>100 mA) transient current

on DGND and are usuallydesigned to have goodnoise isolation between DGND and the analog

circuitry – they should have DGND and AGND separately

grounded unless thedata sheet says otherwise

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Grounding ADCs & DACs

If in doubt – join AGND & DGND

and connect them tosystem analog ground

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System AGND & DGND

Sometimes it is not possible to reducecommon-mode ground noise to a levelcompatible with the noise immunity of

ADCs and the digital circuitry that they drive

In the past this problem was solved byoptical isolators – today there is a faster

cheaper and lower-powered solutionusing surface micromachine technology

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Introducing iCoupler Technology

Magnetic RatherThan Optical Transmission

High-Fidelity Galvanic Isolation Performance, Power, and Cost

Improvements Over Optocouplers

Magnetic RatherThan Optical Transmission

High-Fidelity Galvanic Isolation Performance, Power, and Cost

Improvements Over Optocouplers

ADuM1100 Digital Isolator

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Magnetic-Based Isolation Technology

Standard CMOS Driver and Receiver Circuits iCoupler Channels Integrated Easily With Other

Semiconductor Circuits Optocoupler Mechanical and Electrical Limitations

Eliminated

Driver Chip Receiver Chip

Driver

IN OUT

Semiconductor Top Metal Coil

Insulation LayerChip-to-ChipBond Wires

Receiver

Micromachined Low Loss Coil

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ADuM1100 Receiver Chip

CMOS Circuitry

-- Insulation --

MEMS Coil

Coil/Insulation Cross-Section

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iCoupler Product Offerings to Provide Performance and Integration Benefits

Performance Benefits:

iCoupler

Technology

Optocoupler Technology

Max. Data Rate (MBd, min.)

100 25

Prop. Delay (ns, max.)

18 40

Pulse Width Distortion (ns, max.)

2 8

Trans. Immunity (kV/s, min.)

25 10

Power @25 MBd (mW, max.)

23 105

Integration Benefits:

Multi-Channel:

Multi-Function:

OptocouplerSolution

µmIsolationSolution

µmIsolationSolution

OptocouplerSolution

ADC optos Isolated ADC

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GROUND PLANES

One entire side or layer of a PCB is continuous grounded conductor.

This gives minimum ground resistance and inductance but is not always sufficient to solve all grounding problems.

Breaks in ground planes can improve or degrade circuit performance — there is no general rule.

Twenty years ago ground planes were difficult to fabricate. Today they are not.

If your PCB facility objects to fabricating ground planes — GET A NEW PCB FACILITY!

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A SLIT IN THE GROUND PLANE CAN RECONFIGURE CURRENT FLOW FOR BETTER ACCURACY

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MICROSTRIP TRANSMISSION LINE

DIELECTRIC

GROUND PLANE

CONDUCTOR

wh

o377h

Z = ohms

rw E

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BREAKS IN GROUND PLANE RAISE RESISTANCE

VIEW FROMCONDUCTORSIDE OF PCB

BREAK IN GROUND PLANE

CROSSOVER ONGROUND PLANE SIDE

SIGNALCURRENT A

SIGNAL CURRENT B

RETURN CURRENT ADIVERTS AROUND BREAKIN GROUND PLANERAISING INDUCTANCE

RETURN CURRENT BDIVERTS AROUNDBREAK IN GROUNDPLANE RAISINGINDUCTANCE

RETURN CURRENTS A AND B MAY INTERACT

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DIFFERENTIAL TRANSMISSIONMINIMIZES GROUND ERRORS

ONE CARD ANOTHER CARD

SIGNALYOUWANT

WHEREYOUWANT IT

DIFFERENTIAL SIGNAL

RECEIVER:DIFFERENTIAL

TO

SINGLE-ENDED,HIGH C.M.R.R.

GROUND NOISE

At DC and LF the receiver will be an instrumentation amplifier

At HF the receiver will be a transformer

There is no ideal receiver for video signals which have components from DC to HF

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POWER SUPPLY NOISE

Long-term variation (Long-term variations in voltage or AC line voltage)

AC Line noise (Both 100/120 Hz ripple on rectifier output and transient noise on the AC line which passes to the DC output)

Switching Noise (Digital noise from switching-mode power supplies)

Power line noise transfer (Unwanted signals which pass from one part of a circuit to another via the common power supply)

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SWITCHING-MODE POWER SUPPLIES

Generate every imaginable type of noise and some inconceivable ones as well

DO NOT USE THEM WHERE NOISE IS IMPORTANT

If their use is unavoidable, do not relax and enjoy it, but take extreme precautions against all forms of noise

Remember that a manufacturer’s design change in a bought-in switching mode power supply may alter its effects on your system noise without altering its published specification.

When developing a system using a switching mode supply, it is instructive and often frightening to temporarily replace the switching supply with a battery or a linear supply and to remeasure the system noise!

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ELECTROMAGNETIC NOISE GENERATION

Circuits must be designed so that external E/M fields are minimized.

This is done by shielding, decoupling, minimizing the area of HF current loops, and designing circuits which generate as little EMI as possible.

IT’S NOT JUST A GOOD IDEA

IT’S THE LAW!!

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ELECTROMAGNETIC NOISE INTERFERENCE

The world is full of radio transmitters.

Police, taxis, broadcast, amateur, CB, cellular and cordless telephones, telemetry, and garage door openers.

Do not imagine that your circuit will never encounter one!

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EMI PREVENTION

PCB

FERRITEBEAD

INTEGRATEDPI-FILTER

SINGLE CERAMIC CAPACITOR

FERRITE BEAD AND CAPACITOR

INTEGRATED PI-FILTER

WHERE HIGH E-M FIELDS ARE ENCOUNTERED,CIRCUITRY SHOULD BE SCREENED BY AGROUNDED CONDUCTING ENCLOSURE

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Clock Noise in Sampled Data Systems

Input signal

Sampling clock

Samples

Sampled Data System

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Clock Noise in Sampled Data Systems

Basic Sampled Data Systemconsists of an ADC and a DSP

Both require clocks, which may or may not be synchronised to each other – but using the clock oscillator in the DSP to

drive the ADC can cause severe problems

ADC DSP

Clock

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Clock Noise in Sampled Data Systems

Clock timing errors (jitter) produce amplitude errors

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Clock Noise in Sampled Data Systems100pS

10pS

1nS

10nS

100nS

20-Bit

16-Bit

12-Bit

8-Bit

4-Bit

ENOB

10KHz 30KHz 100KHz 1MHz300KHz

120

100

80

40

20

0

60

SNR(dB)

FULLSCALE SINEWAVE INPUT FREQUENCY

j10 ft2

1log20SNR

SNR & ENOB vs tj

for various input frequencies

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Clock Noise in Sampled Data Systems

SOURCES OF JITTERJitter in the converter and its SHA

The sampling clock generator itself

The signal route from the clock to the converter(s)

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Clock Noise in Sampled Data Systems

SOURCES OF JITTERJitter in the converter and its SHA

The sampling clock generator itself

The signal route from the clock to the converter(s)

Twenty years ago one of the most important specifications of a sample and hold circuit (SHA) was its jitter, today, although jitter is still as important as ever, the circuitry used in SHAs and converters has

improved so much that circuit jitter is rarely a problem, although jitter due to power supply noise can still occur when decoupling is

inadequate

You should still check the data sheet carefully for this specification!

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Clock Noise in Sampled Data Systems

SOURCES OF JITTERJitter in the converter and its SHA

The sampling clock generator itself

The signal route from the clock to the converter(s)

There are two types of clock generator with poor phase noise:-

Oscillator circuits which are intrinsically noisy

Low-noise oscillators which have been affected by interference

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Clock Noise in Sampled Data Systems

Vref

V+

Relaxation Oscillators(such as the well-known 555)

are vulnerable to noise, which causes their threshold circuit to operate early or late and thus

causes jitter

Do not use themas sampling clocks

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Clock Noise in Sampled Data Systems

Phase-shift & tuned-circuit oscillatorsare much more stable, and the ones using

LC tuned circuits have higher Q, and thereforeless phase noise, than ones with RC networks

But both sorts can be used as sampling clocks

Resonant (LC) orphase-shift (RC)

circuitry

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Clock Noise in Sampled Data Systems

V+A Crystal Oscillatoris a resonant oscillator using a quartz crystal, which has a Q of many thousand, as a resonator

This results in better phase noise

They may be built with ICs but a single bipolar transistor or FET may give better performance

than an IC

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Clock Noise in Sampled Data SystemsA Crystal Oscillator

built with logic gates is not nearly such a good oscillator as a

purpose-built one

Especially if other gates on the same chip are handling high-

speed digital signals which are not synchronous with the

oscillator – cross-talk in such a case can cause very bad phase

noise

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Clock Noise in Sampled Data Systems

Power Line Interference

Any Crystal Oscillatormust have its power supply adequately decoupled lest

power line noise causesevere phase modulation

This is a very common causeof poor oscillator performanceand great care is needed to

avoid it

V (Plus noise!)

OSCILLATOR

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Clock Noise in Sampled Data Systems

SOURCES OF JITTERJitter in the converter and its SHA

The sampling clock generator itself

The signal route from the clock to the converter(s)

As the sampling clock goes from the clock oscillatorto the ADC/SHA it can be affected by two noise sources:-

Cross-talk from other digital lines

Common-mode noise between analog and digital ground

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Clock Noise in Sampled Data Systems

RETURN

RETURN

RETURN

RETURN

RETURN

RETURN

SIGNAL 1

SIGNAL 2

SIGNAL 3

SIGNAL 4

SIGNAL 5

SIGNAL 1

SIGNAL 2

SIGNAL 3

SIGNAL 4

SIGNAL 5

SIGNAL 6

SIGNAL 7

SIGNAL 8

RETURN

Crosstalk between linesDigital signal lines couple capacitively and magnetically if they run in parallel

Because of logic noise immunity this is not too serious for most digital signals (unless the lines are too long) but it isa problem for analog signals – and for

sampling clocks

A ground return path between each signal line and the next minimises

this effect at the cost of an increasein board area

A better solution for a sampling clockis to run the line well away from all

other digital signals

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Clock Noise in Sampled Data Systems

CLOCK ADC

Ground

Noise

Ground noise

(Internal) Clock with Jitter

Clock

(Internal) Clock

Clock + Ground noise

ADC ClockThresholdLevel

WITHGROUNDNOISE

WITHOUTGROUNDNOISE

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Clock Noise in Sampled Data SystemsCLOCK ADC

GroundNoise

CLOCK ADC

Ground Noise

The best way to eliminatejitter caused by ground

noise is to put the sampling clock on the system analog

ground

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Clock Noise in Sampled Data Systems

Ground Noise

Other ways to eliminatejitter caused by ground

noise include minimising common-mode noise bythe use of a transformeror a differential amplifier

CLOCK ADC

CLOCK ADC

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Clock Noise in Sampled Data Systems

Noisy External Clock

If a sampled data system must be operated with an externally-provided clock which has intolerable amounts of jitter it is possible to

remove the jitter by reconstructing the clock signal with a carefully designed PLL

PLL ADCCleaned-upClock

External Clockwith Jitter

Page 110: A HIGH SPEED LINEAR DESIGN SEMINAR SWITZERLAND – NOVEMBER 2001 EurIng James M. Bryant – Head of European Applications  (+44) 7785-305598  james.bryant@analog.com

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HIGH SPEED LINEAR DESIGN SEMINAR

EurIng James M. Bryant – Head of European Applications

(+44) 7785-305598

[email protected]