A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

    Udo D. Schwarz and Hendrik Hlscher1

    Department of Mechanical Engineering, Yale University1 Also: Center for Nanotechnology, University of Mnster

    Frontiers of SPM Workshop, Purdue University, October 6th, 2006

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    Udo Schwarz Department of Mechanical Engineering Yale University

    External oscillation of thecantilever

    Driven at or close to resonance

    Measured quantities:- Amplitude A- Phase

    Amplitude-modulation AFM"dynamic force microscopy", "tapping mode"

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    Udo Schwarz Department of Mechanical Engineering Yale University

    => B. Anczykowski et al., Appl. Phys. A66, S885 (1998)

    => B. Anczykowski et al., Appl. Phys. A66, S885 (1998)

    External oscillation of thecantilever

    Driven at or close to resonance

    Measured quantities:- Amplitude A- Phase

    Additional driving with feedbackloop

    Amplitude-modulation AFMwith Q-Control

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Conditions:

    Sinusoidal oscillation

    Optimal time delay t0 = 1/4f0(90)

    => active control of Q-value

    ( ) ( )4444444444 34444444444 21

    &&&

    driving-selfbydampingofoncompensati

    0dd0 2cos)()(

    2)( ttzgctfcatzctz

    Q

    mftzm zzz +=+

    + ( )0ttzgcz ( )tz

    Q

    mf&0

    2

    Compensation of damping by self-driving

    => B. Anczykowski et al., Appl. Phys. A

    66, S885 (1998)

    => B. Anczykowski et al., Appl. Phys. A

    66, S885 (1998)

    0

    1

    1/effQ

    Q g=

    Basic principle of Q-Control

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    Udo Schwarz Department of Mechanical Engineering Yale University

    J. Tamayo, A. D. L. Humphris, M. J. Miles, Appl. Phys. Lett. 77, 582 (2000)

    S. Gao, L. Chi, S. Lenhert, B. Anczykowski, C. M. Niemeyer, M. Adler, H.Fuchs,

    App. Phys. Lett. 82, 4821 (2001)

    R. D. Jggi, A. Franco-Obregon, P. Studerus, K. Ensslin, Appl. Phys. Lett. 79,135 (2001)

    B. Pignataro, L. F. Chi, S. Gao, B. Anczykowski, C. Niemeyer, M. Adler, H.

    Fuchs, Appl. Phys. A. 74, 447 (2002)

    A. Grant and L. McDonnell, Ultramicroscopy97, 2919 (2003)

    R. W. Stark, G. Schnitter, A. Stemmer, Phys. Rev. B68, 085401 (2003)

    T. R. Rodriguez, R. Garcia, Appl. Phys. Lett. 82, 4821 (2003). J. Kokavecz, Z. L. Horvth, A. Melcher, Appl. Phys. Lett. 85, 3232 (2004).

    J. Tamayo, J. Appl. Phys. 97, 044903 (2005).

    AM-AFM with Q-Control: Existing literature

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    Udo Schwarz Department of Mechanical Engineering Yale University

    J. Tamayo, A. D. L. Humphris, M. J. Miles, Appl. Phys. Lett. 77, 582 (2000)

    S. Gao, L. Chi, S. Lenhert, B. Anczykowski, C. M. Niemeyer, M. Adler, H.Fuchs,

    App. Phys. Lett. 82, 4821 (2001)

    R. D. Jggi, A. Franco-Obregon, P. Studerus, K. Ensslin, Appl. Phys. Lett. 79,135 (2001)

    B. Pignataro, L. F. Chi, S. Gao, B. Anczykowski, C. Niemeyer, M. Adler, H.

    Fuchs, Appl. Phys. A. 74, 447 (2002)

    A. Grant and L. McDonnell, Ultramicroscopy97, 2919 (2003)

    R. W. Stark, G. Schnitter, A. Stemmer, Phys. Rev. B68, 085401 (2003)

    T. R. Rodriguez, R. Garcia, Appl. Phys. Lett. 82, 4821 (2003). J. Kokavecz, Z. L. Horvth, A. Melcher, Appl. Phys. Lett. 85, 3232 (2004).

    J. Tamayo, J. Appl. Phys. 97, 044903 (2005).

    AM-AFM with Q-Control: Existing literature

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    Udo Schwarz Department of Mechanical Engineering Yale University

    improve your signal-to-noise ratioJ. Tamayo, J. Appl. Phys. 97, 044903 (2005).

    improve your feedback loop (D-A curves has same slope)J. Kokavecz, Z. L. Horvth, A. Melcher, Appl. Phys. Lett. 85, 3232 (2004).

    So why would anybody want to use Q-Control to enhance Q?

    Sales pitch: Lower tip-sample interaction forces

    Better "contrast"

    Q-Control does NOT

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Procedure:Solve the equation of motion

    Ansatz: z(t) = d+ A cos(2fdt+ )

    ( ) ( )[ ] ( ) ( )0exitationexternal

    ddts0 2cos,)()(

    2)( ttzgctfcatztzFtzctz

    Q

    mftzm zzz ++=+

    +

    44 344 21&&&& ( )

    43421control

    0

    Q

    z ttzgc( ) ( )[ ]4434421&

    ninteractio

    ts , tztzF

    ( ) ( ) ( )( ) ( ) ( )( )20d00d2

    0d20

    20

    2d

    d

    2sinf2cos, tfgQftfgAdIfff

    aA

    ++++=

    ( )0d2sin tfg ( )0d2cos tfg ( )AdI ,

    ( ) [ ] ( ) =d1

    0

    dtsd 2cos...

    2,

    f

    z

    dttfFAc

    fAdI => H. Hlscher, D. Ebeling, U. D. Schwarz,

    J. Appl. Phys. 99, 084311 (2006)

    => H. Hlscher, D. Ebeling, U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    For conservative forces:

    Analysis of Q-Control with conservativetip-sample interaction

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Tip-sample interaction in airCombines van der Waals forces and DMT-M model

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Instability and hysteresis prevented by Q-Control!

    symbols = simulation, dashed line = analytical solutionA

    0

    = 10 nm, cz

    = 40 N/m, E* = 1 GPa

    Amplitude curve with tip-sample interaction

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    silicon cantilever (300 kHz, 40 N/m) on DPPC filmData: D. Ebeling, University of Mnster

    20

    15

    10

    5

    0

    amplitude(nm)

    Q = 1040approachretraction

    AM-AFM with Q-control20

    15

    10

    5

    0

    amplitude(nm)

    Q = 306approachretraction

    conventional AM-AFM("tapping")

    -120

    -90

    -60

    phase(deg)

    20151050

    distance (nm)

    -120

    -90

    -60

    phase(deg)

    20151050

    distance (nm)

    Prevention of instability by Q-Control in airExperimental data

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    => H. Hlscher, D. Ebeling,and U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    => H. Hlscher, D. Ebeling,

    and U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    Interaction forces likely

    too low for molecularresolution!

    Amplitude curve with tip-sample interaction

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Procedure:Solve the equation of motion

    Ansatz: z(t) = d+ A cos(2fdt+ )

    ( ) ( )[ ] ( ) ( )0exitationexternal

    ddts0 2cos,)()(

    2)( ttzgctfcatztzFtzctz

    Q

    mftzm zzz ++=+

    +

    44 344 21&&&& ( )

    43421control

    0

    Q

    z ttzgc( ) ( )[ ]4434421&

    ninteractio

    ts , tztzF

    => H. Hlscher, D. Ebeling, U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    => H. Hlscher, D. Ebeling, U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    cos2

    0

    22

    0

    A

    aI

    f

    ffd

    even

    d +=

    sin1

    00A

    aIff

    Q

    d

    odd

    d +=

    General analysis of AM-AFM (I)

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Coupled equations:

    Definition of integrals:

    cos2

    0

    22

    0

    A

    aI

    f

    ffd

    even

    d +=

    sin1

    00A

    aI

    f

    f

    Q

    d

    odd

    d +=

    ( ) ( )

    1/

    0, ( )

    2

    cos 2

    d

    ts

    f

    deven d

    z

    f

    I F z f t dt tc tA z + = &

    ( ) ( )1/

    0

    2s, ( ) in 2

    d

    t

    f

    dodd d

    z

    sF z t zf

    I f t dt c A

    t + = &

    2

    3/ 2

    2 tsD A

    z Ddzc A z D

    F

    +

    2

    z

    c A

    E

    =

    => H. Hlscher, D. Ebeling, U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    => H. Hlscher, D. Ebeling, U. D. Schwarz,J. Appl. Phys. 99, 084311 (2006)

    General analysis of AM-AFM (II)

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Iodd is related to energy dissipation:

    Energy dissipation per cycle:

    see also Cleveland et al. Appl. Phys. Lett 72, 2613 (1998)

    2

    Ac

    EI

    z

    odd

    =

    2

    0

    sin1

    AcA

    a

    f

    f

    QE

    z

    dd

    +=

    Analysis of the integral Iodd

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Definition of an integral equation:

    Invertion yields:

    H. Hlscher,Appl. Phys. Lett.,

    in press.

    H. Hlscher,Appl. Phys. Lett.,

    in press.

    Reconstruction of the tip-sample force

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    -4

    -2

    0

    2

    4

    tip-sam

    pleforce(nN

    )

    2.01.51.00.50.0-0.5

    tip-sample distance (nm)

    DMT modelreconstructed

    40

    30

    20

    10

    0

    energyd

    issipation(eV

    )

    2.01.51.00.50.0-0.5

    tip-sample distance (nm)

    dissipation modelreconstructed

    10

    9

    8

    7

    6

    5

    amplitude(nm)

    121086

    cantilever position (nm)

    -120

    -110

    -100-90

    -80

    -70

    -60

    -50-40

    phas

    e(degree)

    121086

    cantilever position (nm)

    Numerical simulation of the method

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    integration restricted until first instability occurs!

    Limited integration range!

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    parameters: fd = f0 = 328.61 kHz, cz = 33.45 N/m, Q= 537

    Experimental application on silicon in air

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    height increaseswith Q-Control!

    AM-AFM:Q= 39height: 3.3 0.4 nm

    Q-Control:Q= 209height: 5.2 0.4 nm

    silicon cantilevercz = 3 N/mf0 = 75 kHz

    A0=0.67 VAset=0.5 V

    D. Ebeling, H. Hlscher, B. Anczykowski, H. Fuchs, and U. D. Schwarz,

    Nanotechnology 17, S221 (2006)

    D. Ebeling, H. Hlscher, B. Anczykowski, H. Fuchs, and U. D. Schwarz,

    Nanotechnology 17, S221 (2006)

    DPPC bilayer in water

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    D. Ebeling, H. Hlscher, B. Anczykowski, H. Fuchs, and U. D. Schwarz,

    Nanotechnology 17, S221 (2006)

    D. Ebeling, H. Hlscher, B. Anczykowski, H. Fuchs, and U. D. Schwarz,

    Nanotechnology 17, S221 (2006)

    height increaseswith Q-Control!

    AM-AFM:Q= 26height: 0.9 0.2 nm

    Q-Control:Q= 223height: 1.6 0.2 nm

    silicon cantilevercz = 3 N/mf0 = 75 kHz

    A0=0.53 VAtap=0.48 VAQ=0.27 V

    DNA in liquid (EB buffer)

    A li d d l i AFM i li id

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Esubstrate = 20 GPaEisland = 1 GPa

    Amplitude-modulation AFM in liquidsSoft island on hard substrate: Model interactions

    A lit d d l ti AFM i li id

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    symbols = simulation

    red = active Q-Control

    blue = conventional AM-AFM

    Esubstrate = 20 GpaEisland = 1 GPa

    1.8 nm

    1.1 nm

    Amplitude-modulation AFM in liquidsAmplitude vs. distance curves

    Th f Q C l i li id

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    driving at eigenfrequency (fd = f0)

    optimal time delay (90) => increased Qeff

    Hertz model with large amplitude approximation

    Bielefeldt, Giessibl, Surf. Sci. Lett. 440, L863 (1999)

    reduction of indentation depth with Qeff

    ( )2 2

    0*

    2( ) z

    eff

    A A AcD AQ E R

    =

    => H. Hlscher and U. D. Schwarz,Appl. Phys. Lett. 89, 073817 (2006).

    => H. Hlscher and U. D. Schwarz,Appl. Phys. Lett. 89, 073817 (2006).

    Theory of Q-Control in liquids

    Dynamic force microscopy in liquids

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Esubstrate = 20 GPa; Eisland = 1 GPa

    Red: active Q-Control

    Blue: without Q-Control

    Symbols: simulation

    Lines: analytical model

    => H. Hlscher andU. D. Schwarz,

    Appl. Phys. Lett. 89,073817 (2006).

    => H. Hlscher and

    U. D. Schwarz,Appl. Phys. Lett. 89,

    073817 (2006).

    1.1 nm 1.8 nm

    Dynamic force microscopy in liquidsSoft island on hard substrate: Indentation depth

    Dynamic force microscopy in liquids

  • 8/7/2019 A fresh look to amplitude-modulation AFM:Force minimization, interaction measurement, and the quest for high resolution

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    Udo Schwarz Department of Mechanical Engineering Yale University

    Esubstrate = 20 GPaEisland = 1 GPa

    Red: active Q-Control

    Blue: without Q-Control

    Symbols:simulation

    Lines:analytical model

    Dashed lines:soft island

    Solid lines:hard substrate

    Dynamic force microscopy in liquidsSoft island on hard substrate: Interaction force

    C l i

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    Udo Schwarz Department of Mechanical Engineering Yale University

    AM-AFM:Reconstruction of interaction force possible

    Q-ControlActive modification of apparent Qvalue

    Ambient conditions:

    Q-Control prevents repulsive forces, butresulting attractive forces might be too lowfor molecular resolution

    Operation in liquids:Reduced interaction forces, but still too high

    ( )2 20*

    2( ) z

    eff

    A AcD A

    Q E R

    =

    Conclusions