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P-Channel Enhancement Mode Field Effect Transistor
D S
S G
G
ABSOLUTE MAXIMUM RATINGS(TA=25℃ unless otherwise noted)
Parameter Symbol Limit Unit Drain-Source Voltage VDS -30 V
Gate-Source Voltage VGS ±20 V Drain Current-Continuousª@Tj=125℃
- Pulse bd
ID -2.6 A
IDM -10 A
Drain-source Diode Forward Currentª IS -1.25 A Maximum Power Dissipationª PD 1.25 W Operating Junction and Storage Temperature Range TJ,TSTG -55 to 150 ←
THERMAL CHARACTERISTICS Thermal Resistance, Junction-to Ambientª Rth JA 100 ℃/W
©2005 Mos-Tech Semiconductor 1 h t t p : / / w w w . m a t e y m o r e . c o m
FEATURES ● Super high dense cell design for low RDS(ON)
● Rugged and reliable ● Simple drive requirement ● SOT-23 package
PRODUCT SUMMARY VDSS ID RDS(ON) (mΩ) Typ
-30V -2.6A 95@ VGS=-10V
125 @ VGS=-4.5V
NOTE:The MT3401 is available in a lead-free package
MT3401Mos-Tech Semiconductor Co.,LTD. 茂钿半導體股份有限公司
D
ELECTRICAL CHARACTERISTICS (TA=25℃ unless otherwise noted)
Parameter Symbol Condition Min Typ Max Unit
OFF CHARACTERISTICS
Drain-Source Breakdown Voltage BVDSS VGS=0V,ID=-250µA -30 V
Zero Gate Voltage Drain Current IDSS VDS=-16V,VGS=0V 1 µA
Gate-Body Leakage IGSS VGS=±10V,VDS=0V ±100 nA
ON CHARACTERITICS
Gate Threshold Voltage VGS(th) VDS=VGS,ID=-250µA -1.0 -3.0 V
Drain-Source On-State Resistance RDS(ON) VGS=-10V,ID=-2.6A 95 130
mΩVGS=-4.5V,ID=-2.0A 125 180
Forward Transconductance ɡFS VGS=-10V,ID=-1.7A 2.4 S
DAYNAMIC CHARACTERISTICS
Input Capacitance CISS
VDS=-15V,VGS=0V f=1.0MHZ
226 pF
Output Capacitance COSS 87 pF
Reverse Transfer Capacitance CRSS 19 pF
SWITCHING CHARACTERISISTICS
Turn-On Delay Time tD(ON) VDD=-15V ID=-1.0A,
VGEN=-10V RL=15ohm
RGEN=6ohm
9 ns
Rise Time tr 9 ns
Turn-Off Delay Time tD(OFF) 18 ns
Fall Time tf 6 ns
Total Gate Charge Qg
VDS=-15V,ID=-1.7A VGS=-10V
5.8 nC
Gate-Source Charge Qgs 0.8 nC
Gate-Drain Charge Qgd 1.5 nC
©2005 Mos-Tech Semiconductor 2 h t t p : / / w w w . m a t e y m o r e . c o m
MT3401Mos-Tech Semiconductor Co.,LTD. 茂钿半導體股份有限公司
ELECTRICAL CHARACTERICS (TA=25℃ unless otherwise noted)
Parameter Symbol Condition Min Typ Max Unit
DRAIN-SOURCE DIODE CHARACTERISTICS
Diode Forward Voltage VSD VGS=0V,IS=-1.25A -0.8 -1.2 V
Notes a. Surface Mounted on FR4 Board, t≦10sec b. Pulse Test: Pulse Width≦300Us, Duty Cycle≦2% c. Guaranteed by design, not subject to production testing.
- VDS, Drain-to-Source Voltage (V) -VGS, Gate-to-source Voltage (V)
Figure 1.Output Characteristics Figure 2.Transfer Characteristics
- VGS, Drain-to Source Voltage
Figure3.Capacitance Figure4. On-Resistance Variation with
Temperature
©2005 Mos-Tech Semiconductor 3 h t t p : / / w w w . m a t e y m o r e . c o m
-ID
, Dra
in C
urre
nt (A
)
-ID
,Dra
in C
urre
nt(A
)
C,C
apac
itanc
e(pF
)
VGS=-10V
ID=-1.7A
RD
S(O
N),
On-
Res
ista
nce(
mΩ
)
MT3401 Mos-Tech Semiconductor Co.,LTD. 茂钿半導體股份有限公司
--50 -25 0 25 50 75 100 125
0.5
0.4
0.3
0.2
0.1
0.0
-0.1
-0.2 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
21
18
15
12
9
6
3
0
20
10
1
0
0 5 10 15 20 25 30 0.6 0.8 1.0 1.2 1.4 1.6
0 1 2 3 4 5 6 7
-
©2005 Mos-Tech Semiconductor 4 h t t p : / / w w w . m a t e y m o r e . c o m
Vth
, Nor
mal
ized
Gat
e-So
urce
Thr
esho
ld V
olta
ge
Is-S
ourc
e C
urre
nti(A
)
10
1
Tj,. Junction Temperature(℃)
Figure5.Gate Threshold Variation With Temperature
VSD-Soures-to-Drain Voltage(V)
ɡFS,Transconductance(S)
-Is,S
ourc
e-dr
ain
curr
ent(A
)
-IDS, Drain-Source Current (A)
Figure7.Transconductance Variation With Drain Current
-VG
S,Gat
e to
Sou
rce
Volta
ge
50
10
1
0.1
0.03
-VSD, Body Diode Forward Voltage
Figure8.Body Diode Forward Voltage Variation with Source Current
0
2
4
6
8
10
0.1 1 10 20 50
Qɡ, Total Gate Charge(nC)
Figure9. Gate Charge -VDS, Drain-Source Voltage(V)
Figure10.Maximum Safe Operating Area
-ID
,Dra
in C
urre
nt(A
)
ID=-250uA TJ=150℃
VGS=-5V Tj=25℃
VDS=-15V
ID=-1.7A
TJ=25℃
MT3401Mos-Tech Semiconductor Co.,LTD. 茂钿半導體股份有限公司