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1 A proposal of new simple system for testing a large number of MPPC for the R&D phase of GLD calorimeter 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO On behalf of the GLD calorimeter group

2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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A proposal of new simple system for testing a large number of MPPC for the R&D phase of GLD calorimeter. 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO On behalf of the GLD calorimeter group. Summary as Contents. A large number of MPPCs are made in coming years - PowerPoint PPT Presentation

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Page 1: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

1

A proposal of new simple system for testing a large number of MPPC

for the R&D phase of GLD calorimeter

2007/Feb/6ACFA ILC Workshop

ICEPP , University of TokyoHidetoshi OTONO

On behalf of the GLD calorimeter group

Page 2: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

2

Summary as Contents

Improvement points;-HardwareDeveloped a serializer (with optical relay) in order to reduce the number of expensive devices such as amplifiers and ADCs.-SoftwareSimplification of measurement method for basic properties; A way to simultaneously evaluate the

• dark noise rate• noise rate due to cross-talk (double pulse height) • gain of each MPPC .

of each MPPCs.

A large number of MPPCs are made in coming years in R&D. Checking them would be required for sharing the task among many universities; thus simple, robust, cheap and precise system is preferable.

Page 3: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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• Several calorimeter beam tests with increasing number of MPPCs are expected before the real ILC experiment. • We have to check basic properties (gain, noise rate, etc.) of brand-new MPPCs in each phase of R&D.•The simple, robust and cheap measurement method is preferable.

MotivationN

um. o

f MP

PC

s

Time

1k10k

100k

10M

Expe

rimen

t

R&D PeriodNow

In near future, we would hopefullytest a prototype with orderof 100K MPPCs.

Page 4: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

4

Hardware : A development of signal serializer in order to reducethe number of expensive amplifiers and so on.

•Present method•A proposal of new method

Page 5: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Issue of Present Method

MPPCMPPCMPPCMPPC

Control PCHV

RS232C Present method uses parallel AMPs and ADCmodules.

Sequential process

Modules

AMP

AMP

AMP

AMPAMPMulti-plexer Module

Page 6: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

6

Our Method

MPPCMPPC relayOn

MPPC relayOFF

MPPC relayOFF

DC Supply

AMP modules

relayOFF

Measurementtarget

relayOFF

Control PCHV

RS232C

For this purposeWe have chosen optical relay.

About 5$

Page 7: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

7

Picture of the Circuit with Relay

Supply voltage for a relay

AMP

OFF OFF OFF ONSupply voltage for a relay

MPPC output before a relay

MPPC output after a relay

Page 8: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Requirement and Choice of Relay

relayOFF

relayOn

High isolation is required.

Low insertion loss is required.

Isolation (how well the pulse can be stopped when a relay OFF)

Insertion loss (how well the pulse can be passed when a relay ON)

10ns

?

?Isolation Insertion loss

1GHz

Isol

atio

n

Inse

rtion

loss

GOOD GOOD 30dB

10dB

0.6dB

0.3dB

1GHz100MHz100MHz

Orange’s propertiesbetween

100MHz ~ 1GHz Isolation:10dB~30dBInsertion loss:0.3dB~0.6dB

[dB][dB]

Page 9: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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The effects of serializer on 10 samples

%10

Noise rate Noise rate due to Cross-talk

Gain

No relay [10^5]No relay [kHz]

With

rela

y [k

Hz]

With

rela

y [k

Hz]

With

rela

y[10

^5]

No relay [kHz]

There is no effect on noise rate and Cross-talk rate.Gain measurement with a relay is shifted a few percents, because of insertion loss →Correction is needed for gain measurement.

Noise rate and cross-talk rate spreads are about 10%,gain spread is 3%, due to large temperature variation.

A few %

%10 %10%3

Page 10: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Plan

• The relay elements is quite effective in reducing the number of AMP and costs.

• Our 4ch circuit is still noisy, we need more improvement.• We are going to make a circuit with many r

elays.• In parallel, we are searching another candi

date for serializer.

Page 11: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Software : We applied MPPC’s photon counting capabilities to simplify and the measurement of noise rate, cross-talk rate and gain.Moreover we raise the precision of measurement.

•Present method •A proposal of new method

Page 12: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Present Measurement

LED on Gain

measurementLED off

Threshold searching

Adjusting threshold for noise rateScaler counting for

Noise rate measurement

Adapting threshold for noise rate

(double pulse height)

Scaler counting forNoise rate measurement (double pulse height) Setting MPPC

Page 13: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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A proposal of new method

Change MPPC •Using dark noise for gain measurement•Threshold is fixed for noise rate

Taking ADC histogram OFFLINE analysis

•Noise rate•Noise rate (double pulse height)•Gain

Page 14: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Our Circuit

MPPC

Dark Box

CAMAC

AMP

ChargeADC

CCNET

x 63

Scaler

Disc.

G.G

40ns gate

Clock

Outputregister

NIM

Disc.

vetolatch

x 10

The number of MPPCs will be increasing .

AMPrelayOn

DC Supply

Control PCHVRS232C

latch

Coin.

For the measurement of DAQ dead-time

Page 15: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Our MethodGAIN

Channel

Num

. of e

vent Gate = 40ns

Noise rate(to be corrected

for DAQ dead time)Noise rate (double pulse height)

(to be correctedfor DAQ dead time)

Accidental coincidence rate of Noise is negligible.So the second peak is due to Cross-talk.

THRESHOLD

Page 16: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Results

Bias Voltage

Bias Voltage

Bias Voltage

Noi

se ra

te [k

Hz]

Noi

se ra

te [k

Hz]

Gai

n [1

0^5]

• OURS• HPK

• OURS• HPK • OURS

• HPK

Noise rate Noise rate (double pulse hight)

Gain We compared our measurement with HPK data

•Noise rate and Gain is good correlation with HPKdata.•Difference can be seen for noise rate (double pulse height) → We are studying now.

Page 17: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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The Picture of Pulses

We show several pulses which we are studying now.

• Very closing pulses• Curious pulses like discharge whose

reason is completely unknown.We took all pictures at 78.8V which is typical

voltage for MPPC uses and they can be frequently shown .

Page 18: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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40ns

40ns

40ns

40ns

Very closing pulses

Page 19: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Curious Pulses40ns

40ns

40ns

40ns

Page 20: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Plans• Our method can be use for very closing pulses, and ours is more precise than present method.

• Accidental coincidence of noises is negligible at 100kHz noise rate, thus the closing pulses can’t explain the difference between measurement method.

• We guess that the closing pulses are due to cross-talk, though cross-talk induces ONLY the double pulse height output by present view. we are studying now.

• The origin of curious pulses is unknown, thus we are studying too.

Page 21: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Summary

A large number of MPPCs are made in coming years in R&D. Checking them would be required for sharing the task among many universities; thus simple, robust,

cheap and precise system is preferable.

Our system is suitable for this purpose.

Improvement points;-Hardware Developed a serializer (with optical relay) in order to reduce the number of expensive device such as amplifiers and ADCs-Software Simplification of measurement method for basic properties; a way to simultaneously evaluate the dark noise rate, noise rate (double pulse height) and gain .

Page 22: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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backup

Page 23: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Result (cont’d)

• OURS• PRESENT• HPK

Noise rate due to cross-talk

A significant differencecan be seen .The difference is about2 times.

Comparison with the resultof the same MPPC by present system

at another university

It’s our guess that the reason is understanding of cross-talk.

Page 24: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Our Idea of Cross-talk

MPPC signalMPPC signal MPPC signal

Present idea Our idea

OR

MPPC outputs two types of pulse due to cross-talk; two times pulse height of normal noise and

double closed normal noiseThe present method judges the latter as single normal noise

(c.f)normal noise

Page 25: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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A Candidate of Difference between Measurement Methods

MPPC signal

Disc. out

Present measurement method

Our measurement methodMPPC signal

ADC date

THR

scaler

ADC

2 noises

3 noises

Accidental coincidence rate of Noise is negligible.These can’t perfectly explain the difference.

Page 26: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Typical Pulse

DarkBlue : raw pulseLightBlue : pulse via ONrelayPink : pulse via OFFrelay

Page 27: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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Gain Measurement Method Test

Gain

Gain(10^5)

Measurement with light source = 2.75 (10^5)

Measurement without light source = 2.7 + 0.07 (10^5)_

We checked 10 MPPCs

Thus we decide to use Dark noise for Gain.

Page 28: 2007/Feb/6 ACFA ILC Workshop ICEPP , University of Tokyo Hidetoshi OTONO

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•30oC•25oC•20oC•15oC•10oC•0oC•-20oC

• 30 oC• 25 oC• 20 oC• 15 oC• 10 oC• 0 oC• -20 oC

1p.

e ra

te

Dependence on temperature