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Institute of Solid State Physics
bipolar transistorsTechnische Universität Graz
collector base emitter
np
n+
lightly doped p substrate
npn transistor
Used in front-end high-frequency receivers (mobile telephones), low input impedance amplifier.
p+n+
Ebers-Moll model
/ /1 1be B bc BeV k T eV k TC F ES CSI I e I e
/ /1 1be B bc BeV k T eV k TE ES R CSI I e I e
IE
IB
IC
/ 1be BeV k TF ESI I e / 1bc BeV k T
R CSI I e
R RI F FI
B E CI I I
Common base configuration
/ /1 1be B bc BeV k T eV k Tc F ES CSI I e I e
/ /1 1be B bc BeV k T eV k TE ES R CSI I e I e
solve for Vbe
saturation
active
cutoff IE < 0
http://lamp.tu-graz.ac.at/~hadley/psd/L13/commonbase/pnp_current.html
Common base configuration
Ic
IC ~ IE buffer circuit: the output current is constant over a wide range of output voltages
0 0
0
be p e be n bES
eb e bc be
be n bR CS
bc be
eA D p eA D nIW x W WeA D nIW W
Ebers - Moll Model
0
0 0
bc n bF ES
bc be
bc p c bc n bCS
c c bc be
eA D nIW W
eA D p eA D nIx W W W
Common emitter configuration
/ /1 1be B bc BeV k T eV k TE ES R CSI I e I e
/ /1 1be B bc BeV k T eV k Tc F ES CSI I e I e
B E CI I I
http
://la
mp.
tu-g
raz.
ac.a
t/~ha
dley
/psd
/L13
/com
mon
emitt
er.p
hp
current amplification ~100
Transconductance
Cm
be
IgV
The transconductance can be very high.
/ /1 1be B bc BeV k T eV k Tc F ES CSI I e I e
/be BeV k TF ES C Bm
B B B
e I eI e Ig ek T k T k T
The first term depends on Vbe
Early effect
/ /1 1be B bc BeV k T eV k Tc F ES CSI I e I e
/ /1 1be B bc BeV k T eV k TE ES R CSI I e I e
B E CI I I
Ebers - Moll:
0 0be p e be n bES
eb e bc be
eA D p eA D nIW x W W
0 0bc p c bc n bCS
c c bc be
eA D p eA D nIx W W W
IES and ICS are treated as constants but the depletion widths Wbc, Wbe, Wc,and We depend on the voltages.
pe0
nb0 pc0
xe We Web WbcxcWc
0 exp beb
B
eVnk T
0 exp bcb
B
eVnk T
0 exp bee
B
eVpk T
0 exp bcc
B
eVpk T
Minority carrier concentration
pe0
pc0
xe xc
0 exp beb
B
eVnk T
0 exp bcb
B
eVnk T
0 exp bee
B
eVpk T
0 exp bcc
B
eVpk T
xn1 xp1 xn2xp2
Early effect
Common emitter configurationBase width modulation: smaller width increases the diffusion current and increases the gain.
Punchthrough: The neutral base width goes to zero and all gain is lost.Lightly dope the collector -> voltage drops in collector. Makes circuit slower.
Small signal response
input conductance: cm
EB
igv
transconductance:
c B EB EBi i g v transistor man
BEB
EB
igv
HBT current gain
0
0
(npn)1
B
E
np
C BI I
Higher doping in the emitter makes the minority carrier concentration lower in the emitter.
2
0
exp( / )C V gB BiB
A A
N N E k TnnN N
2
0
exp( / )C V gE BiE
D D
N N E k TnpN N
If the emitter and the base have different band gaps
exp 100000gc vE
B c v B
EN NNN N N k T
HBT current gain
A HBT has an emitter bandgap of 1.62 and a base bandgap of 1.42.A BJT has an emitter bandgap of 1.42 and a base bandgap of 1.42.Both have an emitter doping of 1018 cm-3 and a base doping of 1015cm-3. How much larger is the gain in the HBT?
HBT 1.62 1.42exp exp 2257BJT 0.0259
g
B
Ek T
HBT
Trade off gain for higher speed
Higher base dopinglower base resistancereduced Early effectless trouble with punch throughbase can be made thinner -> faster transistors
Because of higher base doping, a higher collector doping is possible without punch through
lower collector resistance
HBT current gain
band discontinuity reduces emitter efficiencyGraded layer emitter and base improve performance
Si/SiGeAlInAs/InGaAs
Heterojunction bipolar transistors
Fastest InP/InGaAs HBT's have an fT of 710 GHz.
Higher doping in the base allows for a thinner base without punch through and lower base resistance and thus higher frequency operation
Microwave engineering
Electronics: L<< f <~ 10 GHz
Microwave: L 10 GHz < f < 1 THz
TeraHertz: L 1 THz < f < 100 THz
Optics: L 100 THz
Latch-up
http://www.ece.drexel.edu/courses/ECE-E431/latch-up/latch-up.html
Both BJT's conduct, creating a low resistance path between Vdd and GND. The product of the gains of the two transistors in the feedback loop, is greater than one. The result of latchup is at the minimum a circuit malfunction, and in the worst case, the destruction of the device.