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KelvinConnections
VOLTECHNOTES
VPN 104-104/4
FOUR-WIRE KELVIN CONNECTIONS
Making low-resistance measurements, under 1ΩΩ,, is subject to sources
of error including lead resistance and contact resistance. This tech
note describes these problems and how they are overcome.
Two-wire Connections
To measure the resistance of a component, a test current is forced through
the component via a set of test leads. The meter then measures the voltage
across its terminals to give the component’s resistance value. This is known
as a two-wire measurement. In a two-wire measurement, the value of resis-
tance is subject to the resistance of the test leads. The lead resistance
causes a small volt drop, which can usually be considered negligible.
The problem with the two-wire method is that, when measuring small values
of resistance, typically 1Ω or less, the resistance of the test leads causes a
relatively significant volt drop in addition to the volt drop across the compo-
nent (Figure 1). The voltage measured by the meter will therefore not be the
true value of the voltage across the component.
Figure 1. Two-wire test connection showing leadresistance affecting measurement accuracy
VOLTECHNOTES
2© 2002 Voltech Instruments. All rights reserved.
Four-wire Connections
Given the limitations of the two-wire method, the four-wire (Kelvin) method is gener-
ally preferred for low-resistance measurements. These measurements can be
made using a separate current source and voltmeter (Figure 2).
With this configuration, the test current is forced through the test resistance via one
set of test leads (power leads), while the voltage across the component under test
is measured through a second set of leads (sense leads). Although some small
current may flow through the sense pair, it is usually negligible (pA or less) because
the impedance of the sense terminals is high. The volt drop measured by the meter
is therefore essentially the same as the voltage across the test resistance.
Consequently, the resistance value can be determined much more accurately than
with the two-wire method.
Degrees of Kelvin
Many test and equipment manufacturers use connections to the device
under test which are not in fact ‘true’ Kelvin, but ‘semi’ Kelvin. This can best
be illustrated in Figure 3a, where ‘spring’ probes are used. It can be seen
that the spring probe does not provide a true Kelvin connection, as the four
wires are terminated at the probe receptacle.
VOLTECHNOTESKELVIN CONNECTIONS
Figure 2. Diagram showing 4-wire Kelvin connection
3© 2002 Voltech Instruments. All rights reserved.
VOLTECHNOTES KELVIN CONNECTIONS
4
In order to be ‘true’ Kelvin, each ‘power’ and ‘sense’ lead needs to make the
connection directly to the test component lead and as close as possible to
the test component itself.
Semi Kelvin Versus True Kelvin
When using a fixture, the fastest method of connecting and disconnecting the
component under test, while still maintaining a true, four-wire Kelvin connection
to the component, is to use Kelvin blades. Kelvin blades consist of two spring
blades held in an insulating body (Figure 3b).
As previously explained, true Kelvin provides the most ideal connection method
when measuring resistances <1Ω. However, when designing a test fixture, the
mechanical aspect of the connection method must be considered. In this case,
spring probes may provide an alternative to Kelvin blades. However, the
current through the component under test must then also pass through the
spring probe itself, introducing an additional, undesirable voltage drop.
Figure 3a.. Semi Kelvin connection Figure 3b. True Kelvin connection
© 2002 Voltech Instruments. All rights reserved.
Fixtures made using spring probes have the advantage of being easier to
construct, easier to maintain, and they have a longer life span than Kelvin blades,
which are subject to wear from the action of inserting and removing the test
component. However, because spring probes can only offer semi-Kelvin connec-
tion, they should not be used when measuring a resistance of less than 1Ω.
VOLTECHNOTESKELVIN CONNECTIONS
5© 2002 Voltech Instruments. All rights reserved.
VPN 104-104/4
www.voltech.com
Note: While every care has been taken in compiling the information for this publication, Voltech Instruments cannot accept legal liabil-ity for any inaccuracies. Voltech Instruments reserves the right to alter product specifications without notice and whenever necessaryto ensure optimum performance from its product range.
VOLTECHNOTES
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