biometrics.gr.jpbiometrics.gr.jp/newsletter/all/kaiho18.pdfJ. M. Lachin and M. A. Foulkes 6. pp....
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biometrics.gr.jpbiometrics.gr.jp/newsletter/all/kaiho18.pdfJ. M. Lachin and M. A. Foulkes 6. pp. 521-530 Linear rank tests for interval-censored data with application to PCB levels