9

biometrics.gr.jpbiometrics.gr.jp/newsletter/all/kaiho18.pdfJ. M. Lachin and M. A. Foulkes 6. pp. 521-530 Linear rank tests for interval-censored data with application to PCB levels

  • Upload
    haquynh

  • View
    215

  • Download
    0

Embed Size (px)

Citation preview