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© Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2 , class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication (24x5) Access to external services Technological parameter supervising system MES / PPS based planning and documentation ISO 9001 certification

© Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

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Page 1: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 1

MEMS CLEAN ROOM

1500 m2, class 10

150 mm (6”) Wafer line

3 shift preparation for R&D and pilot fabrication (24x5)

Access to external services

Technological parameter supervising system

MES / PPS based planning and documentation

ISO 9001 certification

Page 2: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 2

MEMS Clean Room LayoutAktuelle Clusterung

HIGHTEMPERATURE

LITHOGRAPHY

WET ETCH / CLEANING

DRY ETCH / PVD

BA

CK

EN

D

BA

CK

EN

D

CVD

INLINE METROLOGY

CHARACTERIZATION&

TEST

LAB

CMP

EXTERNALPARTNERS

SEM

LOGISTICS

GOWNING AREA

Page 3: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 3

MEMS Clean Room: Characterization & Test

Page 4: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 4

MEMS Clean Room: Lithography

Page 5: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 5

MEMS Clean Room: Wet Etch / Cleaning

Page 6: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 6

MEMS Clean Room: Wet Etch / Cleaning

Page 7: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 7

MEMS Clean Room: Dry Etch / Strip Resist

Page 8: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 8

MEMS Clean Room: Backend (Bonding, Dispense)

Page 9: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 9

MEMS Clean Room: Inline Metrology

Page 10: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 10

MEMS Clean Room: Inline Metrology

Page 11: © Fraunhofer IPMS T. Zarbock I 05.04.2013 I slide 1 MEMS CLEAN ROOM 1500 m 2, class 10 150 mm (6”) Wafer line 3 shift preparation for R&D and pilot fabrication

© Fraunhofer IPMST. Zarbock I 05.04.2013 I slide 11

MEMS Clean Room: SEM