© Copyright 2014, NCSL International · April 2014: Metrologist 3 Raleigh, North Carolina Board Meeting. The NCSL International Board of Directors held its winter board meeting on

NCSLI WORLDWIDE NEWS

Publisher NCSL InternationalEditor Linda Stone, NCSL InternationalContributing Editors Prof. Horst Czichos, BHT Berlin, University of Applied SciencesMark Kuster, Pantex MetrologyMichael Lombardi, NISTEditorial Committee Craig Gulka, NCSLI Executive DirectorTim Osborne, Trescal How to Reach Us:NCSL International2995 Wilderness Place, Suite 107Boulder, CO 80301-5404 USAPhone 303-440-3339 • Fax 303-440-3384

© Copyright 2014, NCSL International. Permission to quote excerpts or to reprint any articles should be obtained from NCSL International. NCSLI, for its part, hereby grants permission to quote excerpts and reprint articles in this magazine with acknowledgment of the source. Individual teachers, students, researchers, and libraries in nonprofit institutions and acting for them are permitted to make hard copies of articles for teaching or research purposes. Copying of articles for sale by document delivery services or suppliers, or beyond the free copying allowed above is not permitted. Reproduction in a reprint collection, or for advertising or pro-motional purposes, or republication in any form requires permission from NCSL International.

®

Publication ISSN #1940-2988Vol. 7, No. 2, April 2014

Metrologist is published byNCSL International and distributedto its member organizations.

www.ncsli.org April 2014: Metrologist 1

From the President 2

From the Boardroom 3

NCSLI New Members 4

NCSLI Calendar 5

World Metrology Day 16

In Memoriam 19

NCSLI Technical Exchange 32

Regional News 40

International News 44

Advertisers’ Index 48

Measurement UnitsChristopher L. Grachanen

Toward a MeasurementInformation InfrastructureMark Kuster

Measurements and the global energy challenge2014

Metrology

World Metrology Day20 May

www.worldmetrologyday.org

IN THIS ISSUE

SPECIAL FEATURES

NCSLI WORLDWIDE NEWS APR2014

20

26

New Electrical SafetyLaboratory TestingBeverly Garcia

36

Education OutreachBill Hinton22

16

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19

2 Metrologist : April 2014 www.ncsli.org

Greetings! The first major event of this year was the NCSLI Technical

Exchange, which was held Wednesday through Friday, February

5-7, 2014 in Raleigh, North Carolina at the Raleigh Marriott

Crabtree Valley Hotel. This year’s Technical Exchange consisted

of 16 tutorials, the testing summit and an exhibit hall, where

exhibitors shared information on their products and services.

The Technical Exchange offers attendees an opportunity to

learn techniques and innovations and exchange ideas in a hands-

on learning environment, taught by metrology experts. On Friday,

the Testing Summit focused on the communication challenges

which can sometimes occur among testing and calibration

laboratories. Attendees were asked to brainstorm ideas on how to

improve communication, so that client needs may be successfully

met.

Overall this year’s Technical Exchange was a resounding

success and plans are underway for next year’s event which has

been scheduled for February 11-12, 2015 at the Raleigh Marriott

Crabtree Valley Hotel. Don’t miss this great opportunity to learn

and network with industry experts!

As we head into spring, it is important to acknowledge

World Metrology Day, the event which catalyzed the science of

measurement – the signing of the Metre Convention, also known as

the Treaty of the Metre. On May 20, 1875, The Convention set the

framework for global collaboration in the science of measurement

and its industrial, commercial and societal application, as well

as coordinating the development of the metric system. In 1960

the system of units was redefined as the International System of

Units (SI). The original aim of the Metre Convention remains as

important today as it was in 1875. This treaty provides the basis for

a coherent measurement system worldwide.

The theme chosen for this year’s World Metrology Day is

Measurements and the Global Energy Challenge. Metrologists

are faced with even greater challenges in assuring accurate

measurements in the field of energy, as needs have become highly

diversified – from growing energy demands to rising fuel costs

to the need to reduce greenhouse gases. On this day every year,

organizations all around the world celebrate with presentations,

educational events and informal parties. I hope you plan a great

event to celebrate World Metrology Day.

On the topic of energy and the environment, it is relevant to

note this year’s conference theme is Measurement Science and

the Environment. Join us in Orlando, Florida, from July 25-31,

2014. Conference highlights include keynote speaker Dr. Martin

Milton, Director of the BIPM. Also, there will be technical papers,

including a new track, “Pressing Problems – Real Research,”

presented by NIST and NRC-Canada, centered on pressing

societal issues and the importance of measurements in addressing

them. Also included this year will be a day centered on energy,

which will focus on measurements associated with smart energy,

infrastructure and measurements associated with power systems.

We will also feature 25 tutorials, and there will be 120+ exhibitors

and poster presentations in the exhibit hall! We hope you will be

able to attend this year’s conference, which will provide you with

an opportunity to network with colleagues old and new, enhance

your professional knowledge and learn about the most current

measurement science products and services on the market. I will

look forward to seeing you there!

[email protected]

Lonnie Spires, NCSLI President

FROM THE PRESIDENT


Raleigh, North Carolina Board Meeting.

The NCSL International Board of Directors held its winter board

meeting on February 2-4, 2014 in Raleigh, North Carolina, in con-

junction with the 2014 Technical Exchange. A group of 19 board

members and two guests were in attendance. Topics of discussion

included a focus on key organizational measures for continued suc-

cess of the organization, a review of the 2013 financial performance,

approval of the 2014 budget and focused on 2014 conference topics.

The first board meeting of the year is always one of transition as

current board members moved into new positions as well as new

appointees to the board were placed into open positions. Board ap-

preciation was noted to the outgoing past president, Georgia Harris,

as she retires from the board.

Roger Burton, Sandia National Laboratories, transitioned to the

NCSLI Executive Vice President position. Ingrid Ulrich, Ulrich Me-

trology, has taken on the NCSLI Treasurer position and Dr. Malcolm

Smith rejoins the board to fill the Canadian Division Vice President

position. Jeff Gust, Fluke Calibration, also rejoins the board as the

Vice President of Standards and Practices. Tim Osborne, Trescal,

transitions into the Vice President of Operations. Dr. Hy Tran, San-

dia National Laboratories, joins the board as the Central Division

Vice President. Paul Packebush, National Instruments Corporation,

moved into the Conference Vice President position. Lastly, Rob

Knake, A2LA, moved into the Vice President of Measurement Re-

quirements and Analysis position. A big thank you to the past, pres-

ent and new board members!

The remaining board of director meetings are scheduled for May

in Puerto Rico; July in Orlando and October in Mexico. The board

meetings are open to everyone and we would welcome your atten-

dance. Information regarding the meeting details can be found on

the NCSLI website, ncsli.org.

[email protected]

Dana Leaman, NCSLI Secretary

FROM THE BOARDROOM


Haris Al AfaqP.O. Box 841 Kamal Hamsa Building Salahuddin Road Deira, Dubai United Arab Emirates Contact: Arjun Mukerje, +971 4 2719285, [email protected]

Haris Al Afaq LLC (HAA) was formed in the United Arab Emirates in 1968 and has expanded into the rest of the Arabian Gulf. It has become the premier one-stop supplier for solutions to test and measurement problems and requirements. The company has three divisions: Chemical, Electrical and Instrumentation. The mission of the Instrumentation Division is to provide premium brand name products, services and solutions relating to Testing, Measurement and Calibration towards installation and maintenance customers. HAA provides full pre- and post-sales support for all products and also runs periodic introductory and mid-level technical courses in most countries in the Southern Arabian Gulf, including Qatar, Oman and Bahrain.

Etalons, S.A. de C.V.Sierra del Fraile No. 117, Col. Arroyo SecoMonterrey, Nuevo Leon 64740MexicoContact: Roberto Benitez Chavez52-81-83982950, [email protected]

Etalons, S.A. de C.V. is a calibration laboratory that offers high-quality metrological services according to international standards, using technological innovation and more than 25 years of experience in measurement science. Etalons Metrology Lab provides calibration services using a wide range of instru-ments and covers the needs of the pharmaceutical, aerospace and automotive industries. In addition, Etalons provides services for the health sector in the calibration and verification of instru-ments for hospitals, clinical laboratories and institutions.

ABTech, Inc.126 Monadnock HighwayP.O. Box 10296Swanzey, NH 03446Contact: Matthew Keenan603-358-6431, [email protected]

Founded in 1998, ABTech designs and manufactures metrology gages, rotary and linear air bearings and custom motion systems for aircraft and aerospace, semiconductor, optical and other ultra-precision applications. Our in-house team of air bearing metrology and motion experts works with sub-micron accuracies and complex geometric measurement principles. We emphasize performance, simplicity and value in electrical, mechanical and software design and throughout the precision manufacturing process. We are committed to delivering Pride in Precision with every job.

MSI Viking Gage, LLC321 Tucapau RoadP.O. Box 537Duncan, SC 29334Contact: Walt Lehmus, 864-433-9771, [email protected]

MSI-Viking Gage’s mission is to be the most valuable and cost-ef-fective resource for their customers to purchase and service di-mensional and electronic precision measurement, torque and pressure equipment at competitive prices, and with an excep-tional level of expertise and customer service. They sell a tremen-dous array of types and brands of gages and measuring instru-ments, plus they offer complete gage calibration, repair, training and management services.

BMW Manufacturing Co. LLC1400 Highway 101 SouthGreer, SC 29304-1100Contact: David Gary, 864-989-4711, [email protected]

BMW Manufacturing Co. LLC is the only BMW manufacturing plant in the United States. With its manufacture of premium vehicles, BMW Manufacturing practices corporate sustainabili-ty as well as social and economic responsibility. The company demonstrates environmental responsibility with its waste treat-ment processes, green manufacturing techniques and recycling programs. Furthermore, the company has a positive impact on the community with its support of non-profit organizations and its commitment to education.

Presys Instrumentos e Sistemas Ltda Rua Luiz da Costa Ramos 26004157-020 Sao Paulo, BrazilContact: Vinicius Nunes, 55 11 5073 1900, [email protected]

Presys is dedicated to produce world class products and services at competitive prices. The company is focused on producing instru-ments and systems in two main areas: Process Control and Cali-bration. They integrate the increasingly stringent demands of the process market so their products meet the needs of their customers as well as their expectations for safety, reliability and accuracy.

Space Dynamics Laboratory / USU Research Foundation1695 North Research Park WayNorth Logan, UT 84341Contact: Alan Thurgood, 435-713-3539, [email protected]

As a not-for-profit unit of the Utah State University Research Foundation, SDL solves the technical challenges faced by the military, science community, and industry. It serves MDA and the DoD as the University Affiliated Research Center (UARC) for electro-optical sensor systems research and development and has pioneered efficient and effective calibration and characterization techniques and facilities.

WelcomeNCSLI NEW MEMBERS

For information regarding NCSLI membership opportunites, please visit ncsli.org, or call 303-440-3339.


NCSLI WORKSHOP & SYMPOSIUM 2014July 28-31, 2014Measurement Science and the Environment Walt Disney World Swan and Dolphin Orlando, FloridaJuly 25-27 Tutorial Program July 27-30 Exhibition Hall

NCSLI TECHNICAL EXCHANGE 2015February 11-12, 2015Raleigh Marriott Crabtree Valley Hotel Raleigh, North Carolina

NCSLI BOARD OF DIRECTORS MEETINGSFebruary 3-6, 2014Raleigh, North CarolinaRaleigh Marriott Crabtree Valley Hotel

May 4-7, 2014Puerto RicoEmbassy Suites Dorado Del Mar Beach Hotel

July 26-27, 2014Orlando, FloridaSwan and Dolphin Hotel

October 19-22, 2014Queretaro, MexicoGran Hotel de Queretaro

NCSLI TRAINING EVENTSMay 12, 2014Albuquerque Regional Training Event Seminar on Surface Metrology for the Americas [email protected]

MAY 20 – 21, 2014Northwestern Region Measurement Training Summit [email protected]

INTERNATIONAL EVENTSAugust 24-29, 2014CPEM29th conference on Precision Electromagnetic Measurements Rio De Janeiro www.inmetro.gov.br/cpem2014

October 6-10, 2014CENAM Simposio DE Metrologia Santiago de Queretaro, Qro. Mexico www.cenam.mx/simposio

For complete meeting information visit: the NCSLI Metrology and Calibration events calendar at www.ncsli.org.

NCSLI CALENDAR

UPCOMING EVENTS

WorkPlace Training/Measurement Technology Network Wayzata MN, Boca Raton FL, USA 1-612-308-2202 www.wptraining.com [email protected]

TRAINING •E-learning: 250+ Hours for Technicians and Engineers •Workshops and Web Events

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cd

kg

K

m

WorkPlace TrainingMetrology Academy

Boca Raton, FL

WorkPlace Training, Emc3 Solutions and Quality Systems Laboratory bring you aWorld Class Training Facility: 11,600 sq ft, ISO 17025 accredited cal labwith state of the art measurement instruments and standards

•Pre-Audit and Gap Analysis •Measurement Uncertainty for Calibration and Test Labs•Achieving Accreditation •17025/Z540.3 •All ParametersCONSULTING

MeasurementTechnologyN e t w o r k I n t l

Dr. Martin Milton took over as Director of the International Bureau of Weights and Measures (BIPM) in 2013 after a long career at the UK’s National Physical Laboratory.

His time at the NPL began in 1981, shortly after he earned a BA in physics from the University of Oxford. Over the next 31 years, he earned both a PhD from the University of Southampton and an MBA from London Business School and rose to become an NPL Fellow.

Dr. Milton led NPL’s work in gas metrology and also conducted research into isotope dilution mass spectrometry and raman spectroscopy. He was one of the founding members of the Consultative Committee for Amount of Substance (CCQM) and published early work on the nature of primary methods in chemistry. He has always had a special interest in the applications of standard gas measurements to environmental measurements, and was involved in the assessment of global emissions of methane for the Inter-governmental Panel on Climate Change (IPCC).

In 2013 he was awarded an honorary professor-ship in chemistry by the University of York.

Measurement Science and the EnvironmentThe increasing demands for measurements to quantify the state of the environment and the environmental performance of new technologies pose interesting challenges for measurement science. Such measurements are typically required at lower levels, over longer timescales and covering wider areas than are generally required in other fields of measurement science. When applying measurement science to the environment, the basic principles are the same as in other fields. In order for environmental data to be traceable to the SI, it must have the following traits:

• Stability over time, so that long-term trends can be evaluated;

• comparability, so that data acquired by different laboratories can be compared consistently; and

• coherence, so that measurements made against different references and using different methods will be equivalent.

The nature of the challenges in applying measurement science to the environment also dictates engagement with new stakeholder communities. These include laboratories that have monitored the atmosphere and oceans very successfully for decades. In many cases, these laboratories have developed their own methods of producing stable and comparable measurements, although their measurements are generally not truly coherent. The increasing requirement for environmental data and monitoring brings the opportunity to demonstrate that measurements traceable to the SI can be developed, and that our new environmental goals may be met in a cost-effective and robust way.

NCSL INTERNATIONALWORKSHOP & SYMPOSIUM

Walt Disney World Swan and Dolphin HotelOrlando, Florida

JULY 28 – 31, 2014

July 25 – 27 Tutorial ProgramJuly 27 – 30 Exhibition Hall

NCSLI Welcomes Keynote SpeakerDr. Martin Milton, Director of the BIPM, France

2014 NCSL INTERNATIONAL WORKSHOP & SYMPOSIUM

Conference Sponsors MEDIA Sponsors

Keynote SpeakerSponsors


REGISTER TODAYncsli.org

2014 NCSL International Workshop & Symposium Rates

FULL CONFERENCE Regular Rate Ends May 31

Late Rate Begins June 1

Member / Non-Member $995 / $1,150 $1,155 / $1,275

One Day Registration $550 $550

Extra Luncheon Tickets $35 $35

Banquet Ticket $50 $50

TUTORIAL PROGRAM Regular Rate Ends May 31

Late Rate Begins June 1

2 Day Tutorial Member / Non-Member $700 / $800 $750 / $850

1 Day Tutorial Member / Non-Member $450 / $550 $475 / $575

1/2 Day Tutorial Member / Non-Member $275 / $375 $300 / $400

CONFERENCE Hotel

Walt Disney World Swan AND Dolphin Hotel1500 Epcot Resorts Blvd | Lake Buena Vista, Florida | 1-888-828-8850

NCSLI Group Rate $178 + tax

Resort Service Package including In-Room High-Speed Internet Access is available at an additional charge.

BANQUET Night with Entertainment by

The Smokin' TorpedoEs!The Smokin’ Torpedoes consist of experienced musicians committed to providing an entertaining, live performance based on a variety of blues influences. Each member brings their own unique style to the band, providing every listener with genuine blues rhythms, melodies and the charisma associated with bands paying tribute to the music we all love … the BLUES.

The Walt Disney World Swan and Dolphin Hotel is located in the heart of Walt Disney World Resort and just 20 minutes away from the Orlando International Airport. Taxi, van, towncar and limousine transportation is available 24-hours through Mears Transportation at 1-800-759-5219. A Mears desk is also located in the lobby of the Walt Disney World Swan and Dolphin Hotel. Reservations are required. Groups will enjoy sophisticated guest rooms featuring Westin Heavenly Beds, the luxurious Mandara Spa and 17 world-class restaurants and lounges.

VISIT NCSLI.ORG FOR THE COMPLETE PROGRAM

Registration InformationBanquet Night


TUtorialPROGRAM

T1 — 1 DayFriday, July 25, 2014

Train the Trainer Making Adult Learning Come to LifeJovie Masters, The Training Clinic

Learning environment a real snoozer? Wake up and engage your learners through easy proven techniques that you’ll learn during this fast moving, practical, hands-on session. After this workshop, you will have useful tools to effortlessly engage your learners and increase retention.

T2 — 2 DaySaturday, July 26 and Sunday, July 27, 2014

An Introduction to Instrument Control and Calibration Automation in LabVIEWLogan Kunitz, National Instruments Corporation

During this two day hands-on tutorial, session participants will explore the LabVIEW environment, learn to develop, instrument control, data-logging, and measurement analysis applications. At the end of the course, they will be able to create applications using basic design templates and architectures to automate processes, acquire, process, display, and store real-world data.

T3 — 1 DaySaturday, July 26, 2014

ASTM E617: Standard Specification for Laboratory Weights and Precision Mass Standards (2013 Revision)Mark Ruefenacht, Heusser Neweigh; Val Miller, NIST

Mass reference standards are used daily in metrology laboratories for calibration of weights, torque devices, force gauges, balances, and other gravimetric applications; and used extensively in measurement assurance and quality control programs for intermediate checks of weighing instruments for accuracy and proper functioning. New requirements resulting from the new tolerance classes ASTM Class 00 and Class 000 will be reviewed with application recommendations.


Fundamentals of Calibration in Dimensional Metrology Amosh Kumar, Mitutoyo Corporation; Gordon Skattum, QE Solutions

This tutorial provides an overview of calibration techniques and key issues in dimensional metrology. This tutorial will include a variety of hands-on practical calibration exercises. All the major types of dimensional calibrations will be discussed.

T5 — 1 Day Saturday, July 26, 2014

Understanding ISO/IEC 17025 Requirements and Most Common Deficiencies Pamela Wright, A2LAThis full-day tutorial covers highlights of ISO/IEC 17025 requirements. This course is applicable for organizations that are currently accredited, are in the process of obtaining their ISO/IEC 17025 accreditation or for those who are interested in applying the ISO/IEC 17025 requirements in their facility.


Fundamentals of Gas Flow MeasurementRobert DeRemer, CSA Group

The main thrust of the Fundamentals of Gas Flow Measurement tutorial will be the comparison of volumetric flow meters and mass flow meters used in gas flow measurement applications.


Pressure Metrology Michael Bair, Fluke Calibration

This full day tutorial covers all the fundamental challenges of calibrating pressure instruments. The first half of the tutorial concentrates on the physics that have an effect on pressure measurement, including measurement modes, engineering units, the equation for a dead weight pressure gauge, the ideal gas law, surface tension and viscosity. The second half applies those concepts to hands on exercises with equipment supplied by the instructor.


Running the Effective Laboratory Better – Data Driven Improvements that Matter Jesse Morse, Morse Metrology; Malcolm Smith, WesCan Calibration

This “How To” tutorial focuses on getting your calibration operation to maximum operational effectiveness, which will lead you directly to improvements in efficiencies. The tutorial covers five areas where performance measurement is critical in running an effective calibration operation. The five areas are: (1) customer satisfaction, (2) quality, (3) service levels, (4) productivity, and (5) finance.


Control Charts and Stability Analysis for Calibration Laboratory Reference Standards Jeff Gust, Fluke Calibration

This tutorial provides instruction on how to develop control charts for reference standards utilized in the calibration laboratory. The tutorial will primarily discuss electrical standards, but the application is valid for any metrological discipline. The primary focus will be an in-depth discussion of using linear regression to have a more complete understanding of all sources of uncertainty associated with reference standards.


Geometric Dimensioning & Tolerancing (GD&T) Basics WorkshopTony Bryce, Sandia National Laboratories

A basic introduction to the concepts of GD&T as defined in ASME Y14.5. Both the 1994 and 2009 standard will be covered. This course is suitable for those individuals needing a basic understanding of the concepts related to 2D drawings and CAD model definition.

Before the conference, immerse yourself in our Tutorial Program and earn 0.1 Continuing Education Units per hour with our hands-on courses!

July 25–July 27

WALT DISNEY WORLD DOLPHIN HOTEL


Tutorial Program


T11 — 1 Day Sunday, July 27, 2014

Pipette Calibration, Use, and Uncertainty for the Metrologist, Assessor and Laboratory UserMark Ruefenacht, Heusser Neweigh; George Rodrigues, Artel

This hands-on workshop will address proper pipette usage, pipette calibration, volume measurement methods, and uncertainty analysis.

T12 — 1 DaySunday, July 27, 2014

Root Cause AnalysisRob Knake, A2LA

This one day tutorial will focus on internationally recognized approaches to conducting effective internal audits. The techniques learned promote the involvement of laboratory personnel. It will include easy-to-implement methods for continual improvement and preparing for external assessments.


Applying LEAN techniques in a Calibration Laboratory EnvironmentDean Williams, Duke Energy; Tom Knight, Invistics

This hands-on and practical interactive one day tutorial provides participants with a basic knowledge of the history and principles of LEAN and how those principles might apply to a calibration laboratory environment. The tutorial will also present examples of actual recent LEAN initiatives applied at the Duke Energy Standards Lab and other industry Labs which reduced waste and calibration turn times while streamlining overall operations.


Auditing, Traceability and Auditing TraceabilityBarbara Belzer, NIST; Kari Harper, NVLAP; Isabelle Amen, NRC

This tutorial will be of interest to managers and staff of laboratories with new or mature quality systems. It will cover what constitutes objective evidence by stepping through the internal audit process, including skills that an auditor needs to have to be effective. The tutorial will emphasize the importance of records for all aspects of the management system including reference documents, method validation and their interdependency with metrological traceability and reporting results.

T15 — 1/2 Day AMSunday, July 27, 2014

Measurement UncertaintySuzanne Castrup, Integrated Sciences Group

This half-day tutorial provides an overview of important uncertainty analysis principles and methods contained in NCSLI RP-12-2013 Determining and Reporting Measurement Uncertainty. Best practices, procedures and guidelines for applying these principles and methods will be discussed and illustrated.


Fundamentals of Torque CalibrationHenry Zumbrun, Bill Lane, Morehouse Instruments, Inc.

This presentation is a review of the fundamentals of torque calibration. Topics include an overview of torque standards including ASTM-E2428 and BS7882, uncertainty of torque calibration standards, Type A and B uncertainty analysis, torque calibration equipment, calibration and testing of torque transducers, proper calibration techniques, error sources associated with torque calibration, and why proper torque measurement is more than just a traceable length and mass calibration.


Intermediate Dimensional MetrologyTed Doiron, NIST

There are a large number of books on dimensional metrology, and a few classes and tutorials, but nearly all of them are at the beginner level - how to use the instruments for inspection. This tutorial will be an overview of important techniques and concepts not covered in books and classes. Each concept will be presented with examples of how the techniques make measurements more accurate, and in some cases, more efficient.

T18 — 1/2 Day PMSunday, July 27, 2014

Interval Analysis Concepts and MethodsHoward Castrup, Integrated Sciences Corporation

This half-day tutorial provides an overview of calibration interval analysis concepts and methods. Attendees will be introduced to risk analysis concepts, measurement reliability modeling methods, statistical interval analysis techniques, calibration interval objectives and potential interval analysis spin-offs such as equipment outlier identification.


Force Calibration Henry Zumbrun, Morehouse Instruments, Inc

This course will cover applied force calibration techniques and will include live demonstrations using secondary standards to exhibit potential measurement errors made in everyday force measurement.


Fundamentals of Radiation Thermometry CalibrationFrank Liebmann, Fluke Calibration

This presentation is an overview of the basic knowledge necessary to perform radiation thermometer calibrations. The presentation is divided into two parts. The first part is a lecture covering the basics of radiation temperature measurement and infrared thermometry calibration.

The second part is a hands-on portion which covers the steps necessary to make a calibration measurement, plus a number of tests to determine measurement uncertainty, and the computation of uncertainties following international standards.


Fundamentals of Temperature Calibration Mike Coleman, Fluke Calibration

This presentation is a review of the fundamentals of temperature calibration. Topics include calibration equipment, calibration techniques, curve fitting issues, and the mathematics important to thermometry. Types of thermometers covered include platinum resistance thermometers, thermistors, thermocouples, and combined thermometer/readout systems.

T22 — 1/2 Day AMSaturday, July 26, 2014

A comprehensive Training Program for Bio-Pharma Laboratories Walter Nowocin, Medtronic, Inc.

A comprehensive training program is an important component for a calibration laboratory to maintain its best quality capabilities and to meet regulatory requirements. In this tutorial we will review best practice training techniques that are proven to meet regulatory requirements and effectively use precious resources.

T24 – 1/2 Day AMSunday, July 27, 2014

Humidity Calibration TutorialJeff Bennewitz, Thunder Scientific Corporation; Mike Hamilton, Thunder Scientific; Greg Scace, NIST; Bob Hardy, RH Systems

This tutorial will provide an overview of basic information regarding humidity definitions, dew point, frost point, and relative humidity. Participants will practice humidity calculations and conversions using the HumiCalc humidity conversion software. Instructions will be given for the humidity calibration technique using the 2 pressure humidity calibration standard.

T25 – 1/2 Day PMSunday, July 27, 2014

Microwave Measurement BasicsRon Ginley, NIST

Have you ever wanted to learn more about microwave measurement techniques? This session is the place to be! Specific topics covered will include transmission line theory, practical handling or the do’s and don’ts for transmission lines and microwave connectors, Vector Network Analyzer calibration/measurements and real world sources of uncertainties, microwave power detectors types, power measurements and uncertainties, and the session will conclude with a discussion of verification techniques for microwave measurements.

VISIT NCSLI.ORG FOR THE COMPLETE PROGRAMwww.ncsli.org April 2014: Metrologist 9

TECHNICAL PROGRAM

SESSION 1Monday, July 28, 201411:00 am - 12:00 pm

1A Panel: Educators ForumTrack: Management/DevelopmentEducator's ForumThis is a session to share ideas with and for metrology educators. Educators will share information about their programs, gather input and creative ideas from other educators, and gather input from industry and government participants about what new students need in the workplace. This will be an interactive and facilitated session among panel members and the attendees to discuss trends and challenges facing metrology education at the university level.

Participants will be able to contribute examples and personal experiences related to metrology education. Panelists and participants will be able to brainstorm ideas about how each of us and NCSLI can be more effective in ensuring an educated workforce for the future.

1B Electrical ITrack: Metrology Concepts/TheoryElectrical Units in the New SI: Saying Goodbye to the 1990 ValuesDr. Martin Milton, Bureau International des Poids et Mesures (BIPM)

A Comparison of Methods for Measuring High Value ResistorsDr. Harold Parks, Sandia National Laboratories

1C Laboratory QualityTrack: Metrology Skills – Technician/Bench ApplicationsThe NCSLI IDSC 134, Benefits and ApplicationsWilliam Miller, Lockheed Martin Technical Operations

A Practical Guide to Adjusting Calibration IntervalsKim Chu, KIHOMAC Incorporated

1D Climate Science Measurements ITrack: Pressing Problems – Real ResearchGreenhouse Gas and Climate Science Measurements Research at NISTJames R. Whetstone, National Institute of Standards and Technology (NIST)

SESSION 2Monday, July 28, 20142:30 pm - 4:00 pm

2A Mini-Tutorial: Converting Technical Content into Training MaterialTrack: Management/DevelopmentFacilitators: Gloria Neely, Georgia Harris, Vernon Alt This will be an interactive mini tutorial session on converting technical content to training materials. It will include: writing learning objectives, designing content and activities to achieve objectives, engaging participants in learning activities, assessing the learning event to determine whether objectives have been met. Participants should expect active engagement on all topics. This will not be a “lecture.” Examples will be provided from NCSLI resources and will reference the new NCSLI Publication on this topic.

2B Uncertainty ITrack: Metrology Concepts/TheoryUncertainty Propagation for Measurements with Multiple Output QuantitiesMichael Dobbert, Agilent Technologies

Uncertainty Tool for Large Data Acquisition SystemMihaela Fulop, NASA, Glenn Research Center

Descriptive Implementation of Prior Knowledge in the Conformity AssessmentJonathan Harben, Agilent Technologies

2C Dimensional ITrack: Metrology Skills – Technician/Bench ApplicationsMaximize Machine Volumetric Performance by Minimizing Plane Squareness ErMichael Fink, The Boeing Company

In-situ Temperature Calibration Capability for Dimensional MetrologyPrem Rachakonda, National Institute of Standards and Technology (NIST)

Ultra High Accuracy Diameter Measurement of Spheres Using InterferometryJohn Stoup, National Institute of Standards and Technology (NIST)

2D Climate Science Measurements II Track: Pressing Problems – Real ResearchImproving Climate Prediction by Calibrating the Earth, Moon, Sun, and StarsGerald Fraser, National Institute of Standards and Technology (NIST)

Airborne Particulate Matter: Metrology ChallengesGreg Smallwood, National Research Council Canada (NRC)

The Pressing Problems, Real Research track has been designed to bring to the conference world experts in exciting technical areas. All of the speakers lead significant programs at NIST or NRC-Canada, and therefore thoroughly understand the pressing societal issues and the importance of measurements in addressing them. These presentations will focus on clearly explaining the science of these issues while also investigating the relevant measurement challenges and solutions. This combination of fascinating science with a measurement perspective should make this an unforgettable series of talks for NCSLI participants.

Pressing Problems — Real Research

July 28–July 31

ORLANDO SKYLINE

NEW Track this year!


Technical Program


SESSION 3Tuesday, July 29, 20148:30 am - 10:00 am

3A Training Activities in MetrologyTrack: Management/DevelopmentRetention Strategies to Consider When Creating Training PresentationsVernon Alt, Northrop Grumman Corporation

Laboratory Activities for a Dimensional Metrology ClassJoseph Fuehne, Purdue University College of Technology

Estimating Solar Requirements to Meet U.S. Energy Needs: an Outreach EventDaniel Esposito, National Institute of Standards and Technology (NIST)

3B Traceability and Conformance Testing I Track: Metrology Concepts/TheoryTraceability Considerations for the Characterization of Measuring SystemsDr. Charles D. Ehrlich, National Institute of Standards and Technology (NIST)

Establishment of Traceability for Measurement Systems Based on TAR or TURWilliam Guthrie, National Institute of Standards and Technology (NIST)

Resolving Resolution UncertaintyMark Kuster, Pantex Metrology

3C Dimensional II Track: Metrology Skills – Technician/Bench ApplicationsRepositioning Methods: Squeezing Accuracy Out of Your Measuring MachinesTed Doiron, National Institute of Standards and Technology (NIST)

Issues in the Testing of Portable Coordinate Measuring Systems (CMS)Edward Morse, University of North Carolina at Charlotte

Estimating Thermal Effects for Granite Surface Plate CalibrationGordon Skattum, QE Solutions

3D The Future of Measurement Science Track: Pressing Problems – Real ResearchMeasurement Challenges for Schrodinger's CatCarl Williams, National Institute of Standards and Technology (NIST)

Boltzmann and Avogadro and Planck, Oh My... (and your little charge, too!)Dr. Alan Steele, National Research Council Canada (NRC)

SESSION 4Tuesday, July 29, 201411:00 am - 12:00 pm

4A Workforce Development Track: Management/DevelopmentRemoving the Skills Gap in ManufacturingBrian Pippenger, Rolls-Royce Corporation

Project-based Learning (PBL) as a Strategy for Teaching MetrologyFlora Mercader Trejo, Polytechnic University of Santa Rosa Jauregui, Mexico

4B Traceability and Conformance Testing II Track: Metrology Concepts/TheoryTaking Uncertainty In to AccountRandy Long, Laboratory Accreditation Bureau

The Role of Uncertainty of Measurement in Conformance TestingSteve Sidney, National Laboratory Association, South Africa

4C Force Track: Metrology Skills – Technician/Bench ApplicationsRe-Calibration of the NIST 4.45 MN (1000000 lbf) Deadweight MachineRick Seifarth, National Institute of Standards and Technology (NIST)

NIST 1-Kilonewton Dynamic Force Calibration SystemAkobuije Chijioke, National Institute of Standards and Technology (NIST)

4D The Future in Energy Efficiency Track: Pressing Problems – Real ResearchHost: Dr. Jim OlthoffNIST's Net-Zero Energy Residential Test FacilityHunter Fanney, National Institute of Standards and Technology (NIST)

SESSION 5Tuesday, July 29, 20142:30 pm - 4:00 pm

5A Proficiency TestingTrack: Management/QualityInterlaboratory Comparison Results Using ITS-90 Fixed-Point CellsGreg Strouse, National Institute of Standards and Technology (NIST)

Interlaboratory Comparison Best PracticesMichael Huber, Faurecia Emissions Control Technologies

Inter-Laboratory Comparison of National Metrology Institutes from 1Pa-10kPaJacob Ricker, National Institute of Standards and Technology (NIST)

5B Environmental Measurements Track: Metrology Concepts/TheoryCalibration and Uncertainty Evaluation of a Zeta PotentialYu-shan Yeh, Industrial Technology Research Institute (ITRI), Taiwan

How to Ensure the Traceability of Measurement Results in Food SectorValnei Cunha, National Institute of Metrology (INMERTO), Brazil

Calibration of Real Time Black Carbon Mass Concentration InstrumentsKevin Thomson, National Research Council Canada (NRC)

5C Electrical IITrack: Metrology Skills – Technician/Bench ApplicationsAvoiding Measurement Errors from Manipulating Data in SoftwareLogan Kunitz, National Instruments Corporation

A Self-Calibrated Method to Measure the Load Effect of the ResistorZhengkun Li, National Institute of Metrology (NIM), China

Fluke's Artifact Calibration and Its Use in Calibration of 8.5 Digit DMMsJack Somppi, Fluke Calibration

5D Nano-manufacturing and Advanced CommunicationsTrack: Pressing Problems – Real ResearchMeasurements for Nano-manufacturingDavid Seiler, National Institute of Standards and Technology (NIST)

Measurement Challenges in Advanced CommunicationsMichael Janezic, National Institute of Standards and Technology (NIST)

WALT DISNEY WORLD DOLPHIN HOTEL


SESSION 6Wednesday, July 30, 20148:30 am - 10:00 am

6A Laboratory Automation and Software Track: Management/DevelopmentUsing SAP Business Management Software to Manage Test & Measuring EquipmentGerhard P. Mihm, Technical Center for Information Technology and Electronics

Lab2Lab Electronic Exchange of Information using ATMLSuresh Ramachandran, National Instruments Corporation

Selection and Implementation of Metrological Automation SystemsMarcus Flack, Fluke Calibration

6B Temperature I Track: Metrology Concepts/TheoryCalibration Set-up for Reference Radiosondes Meeting GRUAN RequirementsHannu Sairanen, Centre for Metrology and Accreditation (MIKES)

Realization and Dissemination of the ITS-90 above 962 ˚C at NRC CanadaAndrew Todd, National Research Council of Canada (NRC)

Assessment of Thermometer Resistance BridgesMichal J. Chojnacky, National Institute of Standards and Technology (NIST)

6C Energy I Track: Metrology Skills – Technician/Bench ApplicationsMetering Technology Center Values Laboratory ServicesEdward Hass, Consumers Energy Company

An Advanced Intelligent Electronic Device PlatformRoberto Piacentini, National Instruments Corporation

Fleet Wide Monitoring: Sensors to PrognosticsPreston Johnson, National Instruments Corporation

6D Forensics/U.S. Metric Track: Pressing Problems – Real ResearchForensic Science Measurement Challenges Being Addressed at NISTMark Stolorow, National Institute of Standards and Technology (NIST)

Metric System in the U.S.Elizabeth Gentry, National Institute of Standards and Technology (NIST)

SESSION 7Wednesday, July 30, 201411:00 am - 12:00 pm

7A Laboratory Environment Track: Management/DevelopmentMetrology Performance from Comfort-Grade HVACMichael Duncan, Oak Ridge National Laboratory

Temperature and Dimensional Metrology: Uncertainty and ProductivityDr. Jim Salsbury, Mitutoyo America Corporation

7B Metrology PotpourriTrack: Metrology Concepts/TheoryMaking Your Own Volumetric Mass Density Standard Reference MaterialHy D. Tran, PhD, PE, Sandia National Laboratories

Calibration of Ultrasonic Flaw DetectorSamuel C.K. Ko, The Standards and Calibration Laboratory

7C Energy IITrack: Metrology Skills – Technician/Bench ApplicationsHigh Precision Battery Testing for Automotive and Grid ApplicationsDr. Harold Parks, Sandia National Laboratories

Unique Type of High Shock Calibration System Using Electromagnetic ExciterJiun-kai Chen, Industrial Technology Research Institute (ITRI), Taiwan

7D International Metrology Ins and OutsTrack: Pressing Problems – Real ResearchHow International Metrology Really Works: A Little Lady's Foray into an Old-Boys' ClubGeorgette Macdonald, National Research Council Canada (NRC)

Measurement science plays multiple roles in all aspects of the energy industry; from generation and delivery of power to the use of natural gas. Energy leaders, accreditation bodies, National Institute of Standards and Technology (NIST), and other National Metrology Institutes will be presenting papers.

A FOCUS ON ENERGYWEDNESDAY, JULY 30

TECHNICAL PROGRAM

July 28–July 31

2014 NCSL INTERNATIONAL WORKSHOP & SYMPOSIUMwww.ncsli.org April 2014: Metrologist 12

SESSION 8Wednesday, July 30, 20142:30 pm - 4:00 pm

8A Energy IIITrack: Management/QualityA Comparison of Primary Gas Flow Standards between 0.01 L/min and 10 L/minCasey Rombouts, Fluke Calibration

Ensuring Accurate and Safe Calibration of Electrical Safety EquipmentMichael Bailey, Transmille, Ltd

Instrumentation and Measurement Society TC 39: Measurements in Power SystemsLorenzo Peretto, University of Bologna, Italy

8B Mass/Force Metrology Track: Metrology Concepts/TheoryLab Analysis of Force Required to Fill a SyringeJoseph Fuehne, Purdue University College of Technology

Surface Science of Mass Metrology towards Redefinition of the KilogramRichard Green, National Research Council Canada (NRC)

The NIST Vacuum-to-Air Mass Calibration System: An UpdatePatrick J. Abbott, National Institute of Standards and Technology (NIST)

8C Temperature II Track: Metrology Skills – Technician/Bench ApplicationsDry Well Block Calibrators for Calibrating Industrial ThermometersChristina D. Cross, National Institute of Standards and Technology (NIST)

Interpolation of Temperature with Industrial Grade PRTs from 14 K to 273 KWeston Tew, National Institute of Standards and Technology (NIST)

Inhomogeniety in Base-Metal ThermocouplesKaren M. Garrity, National Institute of Standards and Technology (NIST)

8D The Future of the SI and Calibration Services Track: Pressing Problems – Real ResearchWho Needs Calibrations Anyway?Gregory Strouse, National Institute of Standards and Technology (NIST)

Embedded Standards: Future Opportunities for Measurement ServicesThomas O'Brian, National Institute of Standards and Technology (NIST)

SESSION 9Thursday, July 318:30 am - 10:00 am

9A Healthcare Metrology Track: Management/QualityTop 10 List: Best Lessons Learned from FDA Warning LettersWalter Nowocin, Medtronic, Inc.

Infant Incubator Qualification: An Alternative MethodRoberto Benitez Chavez, ETALONS, Mexico

What’s in Store for the ISO 14644 Revisions?Robert Mielke, AbbVie Incorporated

9B Panel: Problems in Dimensional MetrologyTrack: Metrology Concepts/TheoryCalibration of dimensional metrology standards and equipment, and testing of metrological characteristics encompasses a wide field. End users are often faced with complex requirements. This panel discussion will lead off with an update on standards activities related to dimensional metrology. The panelists will then field questions on any topic related to dimensional metrology (not necessarily related to standards). For example, the panelists welcome questions on measurement methods, calibration procedures, or uncertainty analyses. The panelists don’t promise to give you correct answers, but they promise to give you answers.Panelists: John Stoup — NIST, Dr. Jim Salsbury — Mitutoyo America, Edward Morse — UNC Charlotte, Ted Doiron — NIST, Dr. Hy Tran — Sandia National Laboratories

9C Electrical III Track: Metrology Skills – Technician/Bench ApplicationCan We Calibrate a Power Ref. SWR Using a VNA?Jorge Martins, National Instruments Corporation

Ohm’s Law: How Hard Can it be at 3000 A or 20 fA?Dean G. Jarrett, National Institute of Standards and Technology (NIST)

The North American 1 Ohm Inter-Laboratory ComparisonKai Wendler, National Research Council Canada (NRC)

SESSION 10Thursday, July 31, 201411:00 am - 12:00 pm

10A Proficiency Testing II Track: Management/QualityEvaluation of Proficiency Testing Results with a Drifting Artifact — An Example of Standard ResistorChen-Yun Hung, Industrial Technology Research Institute (ITRI), Taiwan

Proficiency Testing for Pressure Calibration at the National Voluntary Laboratory Accreditation Program (NVLAP)Douglas Olson, National Institute of Standards and Technology (NIST)

10B InstrumentationTrack: Metrology Concepts/TheoryUsing Modular Instruments to Reduce CostsDamien Gray, National Instruments Corporation

FPGAs and u Controllers in Embedded InstrumentsPaul Packebush, National Instruments Corporation

10C Weighing Instruments/Systems Track: Metrology Skills – Technician/Bench ApplicationsTraceable Mass Determination and Uncertainty Calculation According to ASTMBenno Gatzemeier, Sartorius Lab Instruments GmbH & Co. KG

Calibration Guidelines for Weighing Instruments — Recent DevelopmentsKlaus Fritsch, Mettler-Toledo AG

WALT DISNEY WORLD SWAN AND DOLPHIN HOTEL


POSTERPRESENTATIONS

Monday, July 28, 20141:30 pm - 2:30 pm

P1 Poster PresentationsTrack: Metrology Concepts — Theory1314 The Global Position System Environmental Stress Screening TestNghiem Nguyen, Raytheon Co.

1318 File Abstraction Layers for Data StorageDamien Gray, National Instruments Corporation

1343 Welch-Satterthwaite for Uncorrelated and Correlated Input QuantitiesAlberto Campillo Marcos, Agilent Technologies

1345 The Problem with Classical RepeatabilityMihaela Fulop, NASA Glenn Research Center

1360 A Novel Calibration Method and Computer Simulation for Multi-hole PitotTubeHsin-Hung Lee, Industrial Technology Research Institute (ITRI)

1365 Calibration of Optical Fiber Laser SourcesSamuel C.K. Ko, The Standards and Calibration Laboratory

1380 Using Metrology Standards to Minimize Negative Environmental ImpactsBrian Parry, The Boeing Company

1387 Uncertainty Estimation forForce MeasurementsRaymond Leung, Standards and Calibration Laboratory

1406 Development of Greenhouse Gases Measurement Standards to Achieve High Metrological Qualities for Evaluation of Pollutant Removal EfficiencyJui-Hsiang Cheng, CMS/ITRI

1411 A Perspective on Measurement Uncertainty Analysis for Commercial Aircraft Test EnginesAli Jalalzadeh-Azar, Pratt & Whitney, a United Technologies Company

1413 Reinventing Pressure & Temperature Metrology with Optical StandardsJay Hendricks, National Institute of Standards and Technology

1434 Theoretical Design Considerations to Reduce the Effect of Thermal ExpansionHenry Alexander, Perry Johnson Laboratory Accreditation, Inc

1438 Determination of Emissivity by Using Reflected Thermal RadiationFrank Liebmann, Fluke Calibration

1439 Use of a Furnace for a Thermal Radiation SourceFrank Liebmann, Fluke Calibration

1499 Improved Performance, Remote Realization, and Accessibility of the SIM Time ScaleMauricio Lopez, Centro Nacional de Metrologia, CENAM

Tuesday, July 29, 20141:30 pm - 2:30 pm

P2 Poster PresentationsTrack: Metrology Skills — Technician/Bench Applications1315 Instrument Measurement Assurance ApplicationsWilliam Miller, Lockheed Martin Technical Operations

1341 Moisture Measurement Setup for Wood Based MaterialsMaija Ojanen, Centre for Metrology and Accreditation

1361 Measurement Comparison for Product Roundness TestingKOU Chunhong, Delta Electronics (Jiang Su) Ltd.

1362 Measurement of Oscilloscopes BandwidthJian Ling Kok, Agilent Microwave Products (M) Sdn Bhd

1364 Measuring the Flashing Time Interval of LED Lights in ToysSamuel C.K. Ko, The Standards and Calibration Laboratory

1409 Tolerances in PlasticsM. Austin Creasy, Purdue University College of Technology

1433 Metrology in the Fast Lane: Metrology and Drag RacingHenry Alexander, Perry Johnson Laboratory Accreditation, Inc.

1448 Relative Humidity Calibrations with the NIST Hybrid Humidity GeneratorChristopher W. Meyer, NIST

1453 A User Friendly Dual Source High Resistance MeterMichael Frisz, Measurements International Ltd.

1455 Metrology for the Automotive Industry in MexicoSalvador Echeverria-Villagomez, Centro Nacional de Metrologia (CENAM)

1456 Designing a Road Tanker Calibration RigJackson K. Mubangizi, Uganda National Bureau of Standards

1486 Calibrating a UUT on a Remote Computer Using Fluke MET/CAL®Michael Schwartz, Cal Lab Solutions inc

1501 The Intelligent Automated RF Measurement SystemNghiem Nguyen, Raytheon Co.

1507 Mitigating Electrostatic Effects on Measurement AccuracyGreg Gumkowski, NRD, LLC.

Wednesday, July 30, 201410:00 am - 11:00 am

P3 Poster PresentationsTrack: Management/Development1323 Training German Armed Forces Calibration TechsGerhard Mihm, Technical Center for Information Technology and Electronics

1326 How to Select the Appropriate Type of Control Chart in MetrologyChen-Yun Hung, Industrial Technology Research Institute (ITRI)

1335 Traceability — We forgot the customer!Jeremy Sims, Transcat, Inc.

1337 Metrology Education in MéxicoRoberto Benitez Chavez, Etalons, S.A. DE C.V.

1342 Considerations when Choosing Automated Calibration SoftwareMichael Bailey, Transmille, Ltd.

1354 Why it is Important to Look at Artifact Calibration Shift ReportsGary Bennett, National Instruments

1371 The Transfer of Expert Tacit Knowledge in IndustryBrian Pippenger, Rolls-Royce Corp.

1379 Do You REALLY Need Measurement Uncertainties?Philip Mistretta, Transcat, Inc.

1394 Ideal vs. Reality: Metrology Education in the US and AbroadMichael Taylor, Monroe County Community College

1408 Organization of Proficiency Testing for Automotive and Motorcycle EmissionsValnei Cunha, Inmetro

1414 Hosted Calibration Management SystemsThomas P. Pessa, Exelon PowerLabs

1419 Calibration Requirements and Good Practices for Modular InstrumentsDimaries Nieves, National Instruments Corporation

1428 Development of Accreditation in Facilitating Trade in the Asia Pacific RegionWanji Yang, Taiwan Accreditation Foundation

1454 Metrology for Renewable Energies in MexicoSalvador Echeverria-Villagomez, Centro Nacional de Metrologia (CENAM)

1485 An Enterprise Resource View of Metrology Software SystemsMichael Schwartz, Cal Lab Solutions inc

July 28–July 30


Poster Presentations


ExhibitorsA.K.O. Inc. Torque Specialties DivisionABTech Inc.AccuMac CorporationAdditelAgilent TechnologiesAmerican Association for Laboratory Accreditation (A2LA)Ametek Test & Calibration InstrumentsAndeen-Hagerling, Inc.ANSI-ASQ National Accreditation Board/ACLASSAssetSmartATS MetrologyBionetics Corporation— Newark Metrology OpsBruel & Kjaer North America Inc.Cal Lab Solutions, Inc.Calibrate, Inc.Colorado Engineering Experiment Station, Inc. (CEESI)Consumers Energy Laboratory ServicesData ProofDewesoft LLCE + E Elektronik Essco Calibration LaboratoryExelon PowerlabsFlexim Americas CorporationFluke Calibration

Fowler Precision ToolsGE Measurement and Control Solutions Guildline Instruments, Ltd.ICL Calibration Laboratories, Inc. Infinite Integral Solutions, Inc. Interface, Inc.International Accreditation Service (IAS)Isotech North AmericaJM Test SystemsKing Nutronics CorporationLiberty Calibration Corps.Lockheed Martin MSTLockheed Martin Technical Operations Mahr Federal, Inc.Measurements International MEATEST, s.r.o.Mensor CorporationMettler ToledoMichell Inst. Inc.Mitutoyo America Corporation Morehouse Instrument Company National Metrology Institute of Japan (NMIJ/AIST)National Research Council Canada

NIST—Physical Measurement Laboratory Northrop Grumman Corporation Norway Labs, Inc.

NRD Advanced Static ControlNVLAPOhm-Labs, Inc.Pond Engineering Laboratories, Inc.Pratt & Whitney Measurement SystemsPrecision Environments, Inc.PresysRadian Research, Inc.Ralston InstrumentsRH Systems, LLCRice Lake Weighing/CondecRotronic SartoriusSIMCO ElectronicsTegamTektronixThe Boeing CompanyThe Modal ShopThunder Scientific Corp.Tovey EngineeringTranscat, Inc.Transmille CalibrationTrescalVaisala, Inc.Vibration Research Western Environmental Corp.WorkPlace Training, Inc.

JULY 27–July 30Exhibit Hall Schedule

Sunday, July 27Welcome Reception 7:00 pm - 9:00 pm

Monday, July 28: 7:30 AM - 4:30 PMContinental Buffet 7:30 am - 8:30 am

Closed for Lunch 12:00 pm - 1:30 pm

Dessert with the Exhibitors 1:30 pm - 2:30 pm

Monday Night Mixer! 4:00 pm - 5:00 pm

Tuesday, July 29: 7:30 AM - 4:30 PMContinental Buffet 7:30 am - 8:30 am

Closed for Lunch 12:00 pm - 1:30 pm

Dessert with the Exhibitors 1:30 pm - 2:30 pm

Wednesday, July 30: 7:30 AM - 4:30 PMContinental Buffet 7:30 am - 8:30 am

Open to the Public 9:00 am - 12:00 pm

Monday Night MixerMonday, July 28: 4:00 pm-5:00 pmEnjoy food and drinks as you meet fellow conference attendees from around the world! Take this special opportunity to sample fantastic salmon provided courtesy of Fluke Corporation.

VISIT NCSLI.ORG FOR THE COMPLETE PROGRAM

Exhibit Hall ScheduleMonday Night MixerExhibitors



WORLD METROLOGY DAY

What is World Metrology Day?World Metrology Day celebrates the signing of the Metre Convention by representatives of seventeen nations, an event which took place on May 20, 1875. This international agreement is also known as the “Treaty of the Metre.” The Convention set the framework for global collaboration in the science of measurement and its industrial, commercial and societal application, as well as coordinating the development of the metric system. At first, the treaty was just concerned with mass and length measurement, but was revised in 1921 to cover all physical measurements. In 1960 the system of units was redefined as the International System of Units (SI). The original aim of the Metre Convention remains as important today as it was in 1875. This treaty provides the basis for a coherent measurement system.

Measurements and the global energy challenge2014

Metrology

World Metrology Day20 May

www.worldmetrologyday.org


WORLD METROLOGY DAY

The availability of energy from many different sources is vital

for our lives today. The well-being of industry, commerce and

the maintenance of our quality of life depend on safe, secure,

sustainable and affordable energy.

The challenge of meeting the ever-increasing demand for

energy, whilst controlling costs and minimizing damage to the

Earth, is leading to the development of new sources of energy and

greater efficiency in its use. This progress is only possible because

providers and users of energy can have access to a globally

recognized basis for the measurement of energy in its many

different forms.

For example, measurements provide the basis for:

• consumers to compare prices from different energy suppliers,

• industry to evaluate the return on exploration for new energy

sources, and

• researchers to validate their claims for new energy technologies.

All of these are possible because there is access around the world

to a measurement system originating from the Metre Convention,

and now based on the International System of Units (SI).

The measurement of energy has always been one of the central

challenges that has shaped our system of base and derived

units. The need to measure temperature, electricity and light is

motivated by the need to quantify sources of energy and has led

to the development of the kelvin, the ampere and the candela, all

of which are base units in the SI.

The first methods for measuring temperature, electricity and

light were developed in the nineteenth century to meet the needs

of an industrial revolution powered by coal and gas. Nowadays

the challenge of measuring new forms of energy continues to

inspire research in metrology. For example, national metrology

institutes around the world are working to develop new methods:

• to ensure that the efficiency of solar photovoltaic technologies

is measured accurately,

• to improve the lifetime and performance of the materials used

in wind and wave power systems,

• to validate new approaches to reducing emissions from power

stations, and

• to underpin the complex commercial transactions taking place

in modern electricity grids.

This research involves collaboration between institutes in

different countries and the results feed in to and strengthen

the existing infrastructure for the international recognition of

measurements. In this way the metrology community contributes

to the world-wide efforts to meet the global energy challenge.

When the 2014 WMD topic was first proposed, I began to think

about what the global energy challenge is, and the role that mea-

surements and especially legal metrology play in it.

While measurements are central to most basic decisions on en-

ergy usage, there are many other aspects of the global energy chal-

lenge which are much more complex:

• global population growth;

• emerging economies;

• complex technologies;

• increasing consumer demands;

• higher quality of life; etc.

These factors may result in significant increases in demand for all

types of energy which in turn may result in environmental changes

and pollution. This demand requires redistributing existing energy

supplies, increasing energy production and developing alternative

energies. It became clear to me that I needed to break this down into

smaller, more manageable pieces of information so I could better

understand the role of legal metrology.

I began to realize that no matter how complex this challenge seems

to be, it comes down to individual choices regarding the energy we

use in our daily lives. It makes no difference whether we are talking

about national or local governments, large or small companies, or-

ganizations or individuals. However, to make good choices we need

information, much of which is based on measurements. For the re-

sults of these measurements to be useful we must have confidence in

the instruments and the processes used. To ensure this confidence,

the instruments must comply with performance requirements laid

down in internationally recognized written standards.

Many instruments under legal metrological control are linked to

our consumption of energy:

• some are directly linked, such as gas meters, electricity meters and

fuel dispensers;

• some are indirectly linked, such as the air pressure in the our car

tires; and

• others are linked to the consequences of energy production, such

as pollution from power plants, exhaust emissions from our cars,

and now, increasingly, the measurement of greenhouse gases.

The vital role that measurements and especially legal metrology

play in this global challenge is now very clear to me.

As we join together to celebrate World Metrology Day, we should

all be aware and be thankful that there are knowledgeable, highly

skilled and dedicated people, not just in the legal metrology com-

munity but across the many businesses in the energy sectors, who

are working every day to ensure that we have the systems in place to

provide accurate, internationally accepted equipment and measure-

ments. Thanks to these people we are all able to have confidence in

the decisions we make with respect to all the measurements we need

in order to address the global energy challenge.

Stephen PatorayDirector the BIML

Martin MiltonDirector of the BIPM

Messages from the BIML and BIPM Directors

WORLD METROLOGY DAY

Measurements and the global energy challengeThe world is facing a growing global energy challenge over the

coming decades. The crux of the problem is the growing energy

demand, particularly from the emerging nations, coupled with the

need to limit or reduce greenhouse gases. Add in the desire to have

diversity and security of supply and the increasing costs to extract

fossil fuels, and we see the trend is for a greater mix of energy

sources, including renewables. Diversification, combined with

demands for improvements in efficiency of energy generation,

transmission and use, mean that technology is constantly being

pushed to the limit.

To meet the challenge we need to improve our ability to

measure a whole series of parameters. For example, more accurate

measurement of the manufacturing temperature or surface form

of a turbine blade will enable efficiency improvements. Better

power quality measurements will help improve the stability of

transmission grids, which nowadays must also cope with variable

inputs from wind turbines and photovoltaic cells, etc. More

complex electrical power metering is needed to ensure the energy

we buy, or even perhaps sell, is correct.

Across the world, national metrology institutes continually

advance measurement science by developing and validating new

measurement techniques at whatever level of sophistication is

needed. They also participate in comparisons coordinated by the

Bureau International des Poids et Mesures (BIPM) to ensure the

reliability of measurement results worldwide.

Many measuring instruments are controlled by law or are subject

to regulatory control, for example the scales used to weigh goods

in a shop, instruments to measure environmental pollution, or

meters used to bill energy. The International Organization of Legal

Metrology (OIML) develops international Recommendations, the

aim of which is to align and harmonize requirements for these

types of instruments worldwide.

World Metrology Day recognizes and celebrates the contribution

of all the people that work in intergovernmental and national

organizations throughout the year on behalf of all.

About the BIPMThe signing of the Metre Convention in 1875 created the BIPM

and for the first time formalized international cooperation in

metrology. The Convention established the International Bureau

of Weights and Measures and laid the foundations for worldwide

uniformity of measurement in all aspects of our endeavors,

historically focusing on and assisting industry and trade, but today

just as vital as we tackle the grand challenges of the 21st Century

such as climate change, health, and energy. The BIPM undertakes

scientific work at the highest level on a selected set of physical and

chemical quantities. The BIPM is the hub of a worldwide network

of national metrology institutes (NMIs) which continue to realize

and disseminate the chain of traceability to the SI into national

accredited laboratories and industry.

About the OIMLIn 1955 the International Organization of Legal Metrology (OIML)

was established as an Intergovernmental Treaty Organization in

order to promote the global harmonization of legal metrology

procedures with the Bureau International de Métrologie Légale

(BIML) as the Secretariat and Headquarters of the OIML. Since

that time, the OIML has developed a worldwide technical

structure whose primary aim is to harmonize the regulations

and metrological controls applied by the national metrological

services, or related organizations.



All of us in the metrology community are saddened by the loss of

another colleague. Jay Louis Bucher, 64, passed away on April 18,

2014 at University of Wisconsin Hospital in Madison. Jay was born

on July 10, 1949 to Lyle and Marda Bucher in Pipestone, Minnesota.

Jay had more than 40 years’ experience in the calibration and

metrology career field. He joined the United States Air Force in

1971. His first assignment was at Griffiss Air Force Base in Rome,

New York. This was followed by assignments to Utapao (Thailand),

Offutt (Nebraska), Yokota (Japan), Kunsan (South Korea) and

Misawa (Japan). He was reassigned to Yokota, his last duty station

before he retired in 1995. He had many accomplishments while

in the military, including being recognized as a Distinguished

Graduate of the U.S. Air Force Technical Training School.

Jay held several positions in the United States Air Force’s

Precision Measurement Equipment Laboratories (PMEL), ranging

from bench technician to section supervisor and from Quality

Assurance Manager to Senior Calibration Laboratory Manager. He

also held a position as Senior Metrologist with Raytheon Middle

East Systems (RAYMES) and was manager of metrology services for

a leading biotechnology company. Starting in 1997 he developed,

implemented and managed a “Best-in-Class” metrology and

calibration program that exceeded the standards of ISO 9001 and

ISO 13485, and also met the requirements for cGMP (the FDA’s

QSR) for medical devices.

Jay was a member of NCSL International since 1997. He started

the Madison Wisconsin Section of NCSLI in 2000, and was

their section coordinator for 12 years. He received the Region

Coordinator of the Year Award from NCSLI in August 2006, and

again in July 2012. He has presented technical papers, hosted

technical sessions, and conducted tutorial workshops at 10 annual

NCSLI Conferences, along with numerous presentations at NCSLI

section meetings in the Twin Cities, Chicago, Indianapolis, and

Madison, Wisconsin regions.

Jay was also very active in the Measurement Science Conference

(MSC) presenting many technical papers and conducting tutorial

workshops on meeting the FDA requirements for traceable

calibration in biotech, pharmaceutical, and medical device

companies as well as workshops on paperless records. In addition,

Jay was very active in the Measurement Quality Division (MQD) of

the American Society for Quality (ASQ), serving in several different

roles over the years, including Treasurer, Chair, Publications Chair

and many others. In 2004, he received the division’s highest

honor, the Max J. Unis Award. In addition, as Managing Editor and

Publisher of The Standard, the MQD newsletter, he transitioned the

publication to a total electronic format by 2005.

Jay received a Bachelor of Science degree in Electronics

Technology in 1997, a Master of Science degree in Electronics in

2004 and a Ph.D. in Traceable Calibration Technology in 2011,

all from Almeda University. In 2003, he was recognized by the

American Society for Quality (ASQ) as a Certified Calibration

Technician (CCT).

Jay Bucher accomplished much in his lifetime and had a

profound impact on anyone with whom he came into contact.

He is remembered as much for his humor, insight and exuberant

personality as he is for the contributions he made to metrology. He

will be greatly missed.

In MemoriamDr. JAY BUCHER July 10, 1949 – April 18, 2014

Jay had more than 40 years’ experience in measurement science.


NCSLI SPECIAL FEATURE

Mea s u r emen t U n i t s

As a Metrology professional I’ve always been fascinated and intrigued about measurement units as to how they are defined and the narrative of their creation. Measurement units form the basis of meaning for measurements. A numeric value without an associated unit has no reference upon which to evaluate it. Most of us are familiar with common measurement units that give substance to our daily lives such as the inch, the second and the gallon. I have a particular interest in measurement units that are named after people from both a scientific and historical perspec-tive. With that said I would like to explore two measurement units named after people.

By Christopher L. [email protected]

Baron Loránd EötvösThe first measurement unit I would like to explore is the eotvos. The symbol of the eotvos

unit is E. The eotvos is a unit of measure of horizontal gradients of gravity, equal to one

billionth of a gal (sometimes called galileo, symbol Gal) per horizontal centimeter. The eotvos

unit is named for the physicist Baron Loránd Eötvös de Vásárosnamény born in 1848 in

Hungary. Eötvös is remembered for his experimental work on gravity, noting his research

in determining the equivalence of gravitational mass and inertial mass (weak equivalence

principle) and gravitational gradients on the Earth’s surface. Eötvös is particularly remembered

for his invention of the Eötvös pendulum, a variation of the torsion balance that measures the

direction of force of gravity as well as changes in the force of gravity’s extent in a horizontal

plane. Eötvös pendulums are often employed in mapping the distribution of masses in the

Earth’s crust in support of mine exploration, and in the search for minerals, such as oil, coal

and ores. It is interesting to note that the Eötvös pendulum was used to accurately ascertain

the equivalence of gravitational mass and inertial mass which was used by Albert Einstein in

support of his theory of general relativity.

Joseph HenryThe second measurement unit I would explore is the henry. The symbol of the henry unit

is H. The henry is used to express the phenomena of a changing magnetic field that induces

an electric current in a loop of wire or coil located within the field in terms of inductance.

An inductance of one henry requires a flux of one weber for each ampere of induced current

within a loop of wire or coil located in a changing magnetic field. The henry is a large unit

such that inductances used in electrical circuits are commonly measured in millihenrys (mH)

or microhenrys (µH). The henry measurement unit is named for Joseph Henry; an American

scientist of Scottish descent born in 1797. Henry’s interest in science was sparked at the early

age of 16 by a book titled Popular Lectures on Experimental Philosophy. Henry excelled at his

academic studies and in 1826 was appointed Professor of Mathematics and Natural Philosophy

at the Albany Academy, an independent college preparatory school in Albany, New York.

Henry was the first to coil insulated wire tightly around an iron core thereby vastly improving

the power of electromagnets. Henry also proved for an electromagnet using two electrodes

attached to a battery that it is best to wind several coils of wire in parallel, but when using

a set-up with multiple batteries, a single long coil should be employed thereby making the

telegraph feasible. In 1831 Henry created one of the first machines to use electromagnetism

for motion, the earliest forerunner of the modern DC motor. This apparatus allowed Henry

to identify the property of self inductance. Henry later went on to serve as the first secretary

of the Smithsonian Institution. As secretary of the Smithsonian Institution, Henry frequently

received visits from scientists and inventors seeking his advice. It is interesting to note that one

such scientist was Alexander Graham Bell who Henry coached throughout development of his

ground-breaking invention, the telephone.



An Opportunity to Reengineer Workforce Development

e d u c a t i o nOUTREACH

By Bill Hinton, NextEra Energy


Measurement science is a discipline in high demand, with

measurement scientists few in number. Why the discrepancy?

Metrology is engineering’s best kept secret, a problem several

organizations are aiming to eradicate together. NCSLI partners East

Coast Metrology (ECM), and NextEra Energy recently coordinated

another metrology education event along with support from

Turbocam International and the state of New Hampshire Weights

and Measures. The event was held at the Great Bay Community

College Advanced Technology and Academic Center (ATAC) in

Rochester, New Hampshire. The focus of the event - providing

continuing education students with insight into the highly

specialized field of metrology - drew in speakers Gary Confalone

from ECM, Kyle Robbins from Turbocam International and Tim

Osmer from New Hampshire State Metrology Department in

addition to keynote speaker, Bill Hinton.

Bill Hinton of NextEra Energy presented on “Metrology in the

Utility Field,” while Gary Confalone explained “Metrology and

Precision Measurement in Composites,” Kyle Robbins discussed

“Metrology in Industrial Production and Manufacturing” and Tim

Osmer presented on “Consumer Use of Metrology.” Students were

exposed to metrology industry terms, common applications for

professional measurements and how the consumer is impacted on

a daily basis.

The U.S. Department of Education Office of Career, Technical

and Adult Education (OCTAE) created a national plan centered

on the American workforce. Responding to a study by the

Organization for Economic Cooperation and Development (OECD)

that found a large

percentage of adults

are too low skilled

to compete in the

current job market,

the outreach plan

will center on

providing very job

specific skills to

program attendees.

Is hyper focusing

on a skillset going to

keep low-skill laborers

employed? Will this plan,

for example, help to connect

future and current job seekers to

open positions within metrology and

measurement services? The exciting aspect of

the Advanced Technology and Academic Center student body

is education with a defined purpose. Targeted studies with

metrology connections includes alignment and configuration of

carbon fiber weaving and layup fixtures, temperature and pressure

controls of autoclaves, programming and quality control checks

from the CNC machine and final post production testing of high

tech aerospace products. The skills these students acquire are

directly related to an international manufacturing facility that is

now located in Rochester.

Reference Recorder

Accuraterugged&Portable

Accuracy up to 0.025%.

Collects and stores up to 1 million data points.

Replaces a deadweight tester and chart recorder.

Temperature, current, voltage, and switch.

Also available in a Lab Reference configuration.

EDUCATION OUTREACH

ECM stated that they promote education

outreach events like this because “it’s

a great way to find future employees.

I can meet with these students face to

face and find out if they’ll be a good fit.

That’s how I met our current intern,” says

owner Gary Confalone. The participants

were exposed to metrology and its impact

on many industries including commercial

power generation, advanced machining

and automation, consumer and legal

metrology and critical dimensional

measurements in science, industry and

healthcare. The ability to engage the

students in an intimate setting with

examples of metrology artifacts stimulates

student engagement with real metrologists

in a Q&A session.

For metrologists and quality managers,

the goal is to discover who is interested

in the field after learning what it is. If

the individual has a strong understanding

of physics and specialized experience

in engineering (school or work related

experience) or a similar field, all that’s

left is the personality fit: Attitude and

scalability. What is desired is the eagerness

EDUCATION OUTREACH

What is desired is the eagernessto learn something new.


Gary Confalone, East Coast Metrology (ECM).

Kyle Robbins, Turbocam International.

Tim Osmer, New Hampshire State Metrology Department.

Bill Hinton, NextEra Energy.CMM in the Advanced Technology & Academic Center metrology laboratory.

GREA

T BA

Y CO

MM

UNIT

Y CO

LLEG

EAD

VANC

ED T

ECHN

OLOG

Y &

ACAD

EMIC

CEN

TER


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to learn something new. To really prepare

students, focused skills and real insight are

needed. Companies and organizations

who demonstrate a willingness to invest

in their employees and support education

outreach programs become beacons for

the unemployed. The companies that

participated in our first education outreach

event with the ATAC are a few steps ahead.

Debra Mattson, Advanced Materials

Manufacturing Program Director for Great

Bay Community College added, “Response

from students was all positive, and I am

sure we will have a good number of the new

students going into metrology as a result

of this presentation.” With investing in

metrology education and gleaning positive

feedback from the students and program

coordinators, ECM and NextEra Energy

are looking forward to making an impact

on students entering the workforce and

participating in future outreach programs.

[email protected]

EDUCATION OUTREACH

Great Bay Community College.

Debra Mattson, Advanced Materials Manufacturing Program Director, Great Bay Community College.


Toward a MeasurementInformation InfrastructureInstrument Specifications, Part 3By Mark Kuster, Pantex Metrology, Contributing Editor

Welcome to spring and hopefully some friendlier weather

than many of you have seen over the last few months. In our

Measurement Information Infrastructure column, the fall and

winter installments fleshed out a high-level data model for

electronic instrument specifications to facilitate automated

instrument selection, calibration, uncertainty propagation,

and use. Drawing on the VIM1 and common measurement

practices, we worked down from the measuring system level

through measuring instruments and measuring functions

to measurement ranges, MPE2 specifications and instrument

uncertainty models.

We omitted a number of properties that might prove valuable,

as well as some identification and nomenclature detail. For

example, if you examine a modern instrument’s documentation

set, you will likely realize that our MII model ignored an entire

technical manual or section on programming commands. So,

let’s march out into the more luxurious weather and spruce

things up.

System & Instrument PropertiesAs previously mentioned, we would like to include the human-

readable OEM3 spec sheet at the measuring system level, in a

PDF, HTML, or other universal format. OEMs will probably want

to control anything issued under their name so this data element

might equate to a locked read-only file. Figure 1 illustrates the idea.

Alternatively, the PDF file might embed the electronic data instead.

NCSLI SPECIAL FEATURE

1 International Vocabulary of Metrology, Edition 3, 2012 2 Maximum Permissible Error 3 Original Equipment Manufacturer

Figure 1. Generating MII specifications. The OEM would create the electronic data with a MII spec sheet editor and combine that with its formatting template and cryptographic signature to generate a human-readable version as typically found on vendor web sites. Instrument users might use the OEM MII spec sheet(s) directly, reformat it per their own template, merge them into a larger system, or derive their own version for limited calibrations or special applications.

Design & Testing Data

MII Spec Sheet Editor

OEM Document Template

Raw Spec Data

Human-Readable

Spec Sheet

MII Spec Sheet


SPECIAL FEATURE

As for other properties, quality spec sheets normally include the

operating conditions that govern system accuracy, performance,

and function. The VIM defines steady state, rated, limiting, and

reference operating conditions, respectively, as those influence

and measured quantity ranges (VIM: intervals) under which the

calibration remains valid, the instrument performs as designed,

the instrument avoids permanent degradation or damage, and

the instrument achieves its smallest uncertainty. The measuring

intervals in our Measuring Range data model section for the

measured, input and influence quantities already express the

steady state operating conditions. We therefore will add rated,

limiting, and reference operating conditions to the model.

Let’s also add serial number restrictions and firmware and soft-

ware versions to the identification and nomenclature elements at

this level. We may also want to list legal and safety registrations

such as UL4, CE5, etc. listings.

The instruments forming a system may vary in specification de-

tail or perhaps exist as independent entities and not overlap each

other at all. So, all the system-level elements optionally apply at

the instrument level also.

Function & Range PropertiesThe VIM speaks of resolution, resolution of a displaying device,

sensitivity, selectivity, discrimination threshold, dead band, de-

tection limit, stability, drift, variation due to influence quantities,

and step response time, all of which we assume may vary from

range to range. To determine which of those we lack, we first iden-

tify those redundant to our existing model:

• Quantities subject to calibration or measurement such as step re-

sponse time fit into our model more closely as ordinary measur-

ing functions and ranges rather than as special explicit entities.

• The Range Measurement Model section discussed last time (with

time as an influence quantity) should offer the information from

which to calculate variation due to influence quantities, sensitiv-

ity, selectivity, detection limit, stability, and drift.

• The VIM perhaps fails to fully clarify and distinguish resolution,

discrimination threshold, and dead band. If required, we might

calculate those properties from the Range Measurement Model

and display resolution they likely depend on.

• Our Standard Modeling Uncertainty data element addresses in-

strument modeling and behavior deficiencies such as hysteresis,

linearity, etc.

As a first approximation then, that leaves only something akin

to display resolution to add to the measuring range data elements.

We call it Indication Resolution so as to include material measures.

For good measure, we insert Accuracy Class into the function-

range nomenclature.

Other Loose EndsMany commercial spec sheets present data in tables and diagrams.

The computers we intend to read and write MII spec sheets have

no use for tables and graphs because the specification model pro-

vides the information required to calculate everything directly.

We humans, however, appreciate intuitive visuals, so the model

should have facilities to generate them in the human-readable

document. For that, we rely on scripting features at every model

level similar to that discussed last time for MPE and Measurement

Model definitions.

The wide variety of spec sheets encountered in metrology leads

us to believe we will want other features not yet considered. So, an

extensible data model will likely behoove us when we consider our

data format choices. XML6, for one, facilitates this.

Automation CommandsBy combining a UUT’s MII instrument specification’s MPE and

uncertainty model with those of a test or calibration laboratory’s

available standards and their calibration certificates, we may

imagine MII-aware software automatically selecting the optimum

test point set and crafting a procedure, or at least a datasheet, to

conform to the laboratory’s measurement quality requirements.

The resulting test points would include all the secondary

parameters required to qualify the measurement properly because

we have included that detail in the data model. See Fig. 2.

Ultimately however, as Fig. 2 also depicts, we would like our auto-

mation systems (METBENCH, MET/CAL®, SureCal™, TestStand™,

etc.) to interpret programming specifications in the MII spec sheet,

add the appropriate instrument commands, allow a metrologist to

select the measurement methods, and seamlessly build an auto-

mated measurement program for its own environment. So far our

data model has nothing to enable this.4 Underwriters Laboratories 5 European Conformity 6 Extensible Markup Language

Figure 2. Using MII specifications. An MII-aware lab management system would read UUT and measurement standard data and select test points to meet local measurement quality metrics (MQMs). From that and the original data, an MII-aware automation environment might create low-level instrument drivers and an automated calibration procedure per a metrologist’s measurement method choices.

MQMs

MII LMS

Test Point

Selection

UUT Spec Sheet

Standard Spec

Sheets

Standard Certificates

MII Automation Environment

Method Design

Instrument Drivers

Automated Procedure


In the final analysis, beefing up the data model to accomplish this

may take considerable effort and industry participation. The data

model should know nothing of specific automation environments

because we would like to give any vendor the flexibility to incorpo-

rate MII features into their software. At first glance, it appears we

face the challenge to develop a command model general enough to

handle any instrument and translate into any automation language.

Not so. First of all, IEEE Std. 488.2 already defined a standard

instrument command language, SCPI7, which the IVI8 Foundation

now controls along with VISA9, a standard for communication hard-

ware and protocol independence. Theoretically, the two standards

allow a program to use the same command to perform the same

function using any appropriate instrument connected through any

supported hardware interface. Actual results vary.

More to the point, a common command language doesn’t come

into play here, because each MII spec sheet would contain its own

instrument’s commands, whatever form they may take. For automa-

tion purposes, the MII spec sheet would simply embody the OEM’s

programming reference. We seek only to communicate instrument

specifications automatically to MII-aware software, so we appropri-

ately leave issues like code reuse and instrument interchangeability

to others. We might note though, that the SCPI and VISA standards

do not claim instrument interchangeability because they do not de-

lineate all the required instrumentation detail. Since MII spec sheets

would cover that hole, they might engender interchangeability or

automated reconfiguration as a side effect.

One MII implementation alternative might associate each

OEM-defined command sequence with the appropriate MII data el-

ement and embed place holders for the test point quantity values.

For instance, the measuring function and range levels might specify

:SOURce- and :MEASure-type commands, whereas the input and in-

fluence quantity data elements might specify instrument state set-

ting commands like :TRIGger and :FREQuency. The instrument-lev-

el automation commands would include initialization commands

like *RST. Command parameter values for specific mode settings in

those commands would correspond to the qualifiers describing the

linked function or range. We adopt this approach in the data model

as a first strike attempt.

An automation environment might then link back from a test

point value to the correct UUT and measurement standard rang-

es and extract the commands required to set up and perform the

measurements. Alternatively, the automation system might scan an

MII spec sheet and then compile and install a low-level instrument

driver to plug into a layered automation architecture.

As an example, suppose that a MII spec sheet defines a measuring

function and range to source a peak-to-peak signal amplitude, A,

into a 50 Ω load. Suppose further that the range defines an influ-

ence quantity, f as the signal frequency. If MII software chose the

test point

Output Amplitude, peak-to-peak, into 50 Ω

A = 5 V, f = 1 MHz

7 Standard Commands for Programmable Instruments 8 Interchangeable Virtual Instruments 9 Virtual Instrument Software Architecture

SPECIAL FEATURE


then the software might discover command formats connected to

the linked UUT range such as

:OUTPut:IMPedance 50OHM

:SOURce:FREQquency f /MHzMHz

:SOURce:VOLTage A/VV

and substitute the test point values to form the actual commands

:OUTP:IMP 50OHM

:SOUR:FREQ 1MHz

:SOUR:VOLT 5V.

Some environments might insert those commands directly

into an automated procedure; others might use the parameter

structure to build a new driver.

We have no reason to limit Automation Commands to SCPI

or anything else. A CMM10 spec sheet might tie a measurement

command such as “Measure circle Chebychev” to a specification

to make it available for use as a measurement standard or a test

on the CMM itself. Mechanical drawings adhering to Geometric

Dimensioning and Tolerancing standards perhaps represent

the ultimate dimensional spec sheet. Software already exists to

generate CMM programs from CAD11 drawings to compare parts

to specifications, so in a sense, we have special-purpose MII spec

sheets right now.

This brief section on automation commands obviously leaves

much detail to finalize, not to mention the choice of approach,

but hopefully casts some light on the possibilities. In the

meantime, we add Automation Commands data elements to our

budding model.

All Together NowAugmenting our previous model with the data elements from this

article, we have the following more complete instrument specifi-

cation data model:

Measuring System

• System Identifier

• Human-Readable Document

• Visual Aids Script

• Operating Conditions

• Measuring Instrument 1

• Measuring Instrument 2 ⋮

• Measuring Instrument NI

Measuring Instrument

• Instrument Identifier

• Human-Readable Document


• Operating Conditions

• Initialization Commands

• Measuring Function 1

• Measuring Function 2 ⋮

• Measuring Function NF

System or Instrument Identifier

• Unique ID

• Nomenclature

• Manufacturer

• Model

• Applicable Serial Numbers

• Firmware Version

• Software Version

• Specification Document Title

• Specification Document Date

• Nominal Physical Size

• Nominal Weight

• Registrations & Listings

Operating Conditions

• Rated Conditions

• Limiting Storage Conditions

• Limiting Transportation Conditions

• Limiting Operation Conditions

• Reference Conditions

Conditions

• Quantity Value Interval 1

• Quantity Value Interval 2 ⋮

• Quantity Value Interval NC

Measuring Function

• Function Identifier


• Indication Method

• Quantity Kind

• Function-Level Commands

• Range 1

• Range 2 ⋮

• Range NR

Function or Range Identifier

• Unique ID

• Nomenclature

• Accuracy Class

Measuring Range

• Range Identifier


• Full Scale Value

• Indication

– Nominal Indication Interval

– Indication Interval

– Measuring Interval

– Quantity Symbol

– Default Indication Value

– Indication Resolution

• Range-Level Commands

• Influence or Input Quantity 110 Coordinate Measuring Machine 11 Computer Aided Design

SPECIAL FEATURE


– Nominal Indication Interval

– Indication Interval

– Measuring Interval

– Quantity Symbol

– Default Quantity Value

– State Commands

• Influence or Input Quantity 2 ⋮

• Influence or Input Quantity Nq

• MPE 1

– Specification Interval

– Quantity Function

– Condition Equation 1

– Condition Equation 2 ⋮

– Condition Equation NC

– Calculation Script

– Renderer

– Visual Aids Script

• MPE 2 ⋮

• MPE NS

• Range Measurement Model

– Quantity Function

– Auxiliary Variable Definitions

– Parameter Definitions

– Standard Modeling Uncertainty

– Calculation Script

– Visual Aids Script

We will no doubt find existing and future spec sheets that

contain information this model does not address, so without

becoming politicians, we do reserve the right to revise and

extend our remarks, including some terminology changes

between traditional and VIM-compliant usage. For example we

borrowed the term Measuring “Function” from SpecTrack™ for

an instrument feature, but that tends to conflict with the VIM’s

“measurement function,” which means a mathematical function

such as our “Quantity Function.”

MII Front LinesThat does it for a first draft of our MII instrument specifications

data model. We haven’t defined exactly what kind of binary or

textual data each element represents, but we postpone that until

after we model each of our MII communication vehicles (certifi-

cates, accreditation scopes, etc.). To actually field MII spec sheets,

we lack only explicit standards and software, each driving the oth-

er in chicken-and-egg fashion. If standards or recommended prac-

tice writing bodies and software vendors put troops on the ground

to attack those obstacles, we should accomplish our MII quality

and effectiveness objectives. But truth lies in the detail that we will

refine as we receive the battlefield reports.

Speaking of action reports, two previous MII-related

software developments came to our attention since the last

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installment. We previously noted the Mudcats SpecTrack™

application, but overlooked the SpecMaster Worksheet in

the UncertaintyAnalyzer™ product from Integrated Sciences

Group. The worksheet creates and saves electronic instrument

specifications and includes an equation scripting editor with

access to defined parameter values. So, we have at least two

systems in the field progressing toward MII specifications.

Secondly, the author recently downloaded and lately read two

NPL12 reports: One13 describes NPL experience and lessons learned

from remote calibration over the internet, something we haven’t

discussed here other than mentioning Cal Lab Solution’s recent

undertaking along that line, but definitely of interest.

The other14 details an exciting experiment in creating an

example pdf calibration certificate from structured measurement

data. Exciting? Yes, not because its plot thrills, but rather because

someone undertook that already and developed an elegant

solution that we might extend and standardize for our MII test

and calibration certificates, an upcoming topic. Their strategy

constructs XSD15 and DTD16 files to describe data and document

formats. With those definitions, software digests, validates,

and processes raw XML-formatted measurement data to output

intermediate curve-fitting results and a final calibration table,

both XML files themselves. It then combines all the data with an

XML customer file and a certificate template to render a nicely

formatted pdf certificate. The process works much like what Fig.

2 envisions for spec sheets.

We might generate MII certificates similarly, but also would

imbed the electronic data in the certificate for direct ma-

chine-to-machine transmission and consumption. Kudos and

thanks to Robin Barker, Graeme Parkin and colleagues for their

prescient contributions from 2006. We will watch NPL for further

MII advances. You may download the reports and other good-

ies at http://www.npl.co.uk/mathematics-scientific-computing/

mathematics-and-modelling-for-metrology/publications/.

As always, we welcome news, thoughts, ideas, and feedback

from the MII campaign. Don’t forget the upcoming NCSLI

Workshop & Symposium mentioned elsewhere in this issue–

more on that next time.

[email protected]

12 National Physical Laboratory, the United Kingdom’s national metrology institute 13 R. M. Barker and G. Parkin, “Software Support for Metrology – Good Practice Guide No. 19 - Internet-enabled Metrology Systems,” NPL REPORT DEM-ES 012, 2006. 14 R. Barker, “XML for Data Curation,” NPL REPORT DEM-ES 008, 2006. 15 XML Schema Definition 16 Document Type Definition

SPECIAL FEATURE

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3747 Metrologist Jan 13_3737 Metrologist Jan 13 1/28/13 5:20 PM Page 1


NCSLI TECHNICAL EXCHANGE

Additel. Essco Calibration Laboratory.

Consumers Energy Laboratory Services.

February 5-7, 2014 Raleigh, NC

Exhibitors


The NCSLI Technical Exchange was held Wednesday through

Friday, February 5-7, 2014 in Raleigh, North Carolina. This

educational event in metrology training not only provides a forum

for exchanging ideas, techniques and innovations, but also offers a

valuable hand-on experience to participants.

The participants were delighted with the 16 courses, which

provided in-depth information presented by instructors who are

experts in their fields. Course instructors were representatives of

A2LA, Additel corporation, Agilent Technologies, ASL, U.S., E = mc3

Solutions, Fluke Calibration, Measurements International, NIST,

RH Systems, Sandia National Laboratories, Thunder Scientific

Corporation and Trescal.

The tutorials covered a range of metrology topics including

instrument control and calibration automation, statistical

process control, thermocouple theory, thermodynamics,

electrical metrology techniques, humidity calibration, microwave

measurement, industrial pressure, power challenges, measuring

resistance, dimensional metrology, calculating uncertainties and

ISO/IEC 17025.

Feedback from tutorial participants was very positive. Attendees

said the tutorials presented great opportunities to interact

with metrology experts and felt the courses were in-depth and

presented well, providing fundamental information for all levels

of measurement. Instructors were knowledgeable and attentive,

staying after the class to answer questions.

On Wednesday and Thursday, February 5-6, Technical

Exchange Exhibitors provided information on their respective

companies and equipment and discussed their test and

measurement challenges with attendees. Exhibitors this year

were Additel, Consumers Energy Laboratory Services, Essco

Calibration Laboratory, Kaymont, RH Systems and Thunder

Scientific Corporation.

The Testing Summit, held on Friday morning, February 5, was

moderated by Tim Osborne of Trescal. The Summit is a forum to

exchange ideas on metrology in the global testing marketplace.

This year’s Testing Summit focused on the differences of

terminology among testing and calibration laboratories and on

the issues that can arise from these differences in understanding.

The goal of the Summit was to generate ideas on how to improve

communication between the testing and calibration communities

in order to successfully meet client needs.

Overall, the Technical Exchange was a great success, with

participants coming away with more knowledge which will

enhance their day-to-day work in their labs and appreciating the

opportunity to network with colleagues and experts.

The 2015 Technical Exchange is underway and will be held

from February 11-12, 2015 again at Raleigh Marriott Crabtree

Valley Hotel in Raleigh, North Carolina. If you are interested in

presenting a tutorial for this training event please contact Mike

Frisz, at [email protected].

RH Systems. Thunder Scientific Corporation.

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Aleksei Nechaev, Dilip Shah, and Oleg Kobets. Jack Somppi.

Jeff Bennewitz. Ken Sloneker.

Tutorial Presentations


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February 11-12, 2015MARRIOTT CRABTREE VALLEY HOTEL

RALEIGH, NORTH CAROLINA

ncsli.org

The Technical Exchange, developed by NCSL International (NCSLI), is a new ed-ucational event designed to provide you regional access to low-cost, high-qual-ity metrology training solutions. At this two-day event you will get metrology training covering several fields. Each training session is taught by subject matter experts from throughout the industry.

The NCSLI Technical Exchange provides a forum for exchanging ideas, mea-surement techniques, best practices and innovations with others interested in metrology industry trends. It will build or enhance specific hands-on skills in the calibration of measurement and test equipment, and teach best practices along with introducing new and innovative calibration hardware, software and calibration services.

What is the Technical Exchange?

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Proper use of electrical safety equipment saves lives. Just

ask someone who encounters the danger of exposure on

a daily basis. We’ve all seen the utility trucks along the

side of the road with their buckets extended high in the

sky and caught a glimpse of that brave soul standing

mere inches from power lines and had that guilty

thought… I’m so glad that’s not me! Electrical power

and properly tested equipment are vital to all of us. The

service provided by those utility workers enables us to

live comfortable, healthy lives.

By Beverly Garcia, JM Test Systems


JM TEST SYSTEMS LAB TOUR

Properly tested equipment and protective

personal gear are crucial for those who

work in manufacturing facilities, where

the threat of contact with electricity is an

expected part of the workday. To these

employees, electrical safety is critical. The

Electrical Safety Laboratory (ESL), operated

by JM Test Systems in Baton Rouge, Lou-

isiana, provides electrical testing services

to companies whose employees work in

an electrical environment. JM Test Systems

was founded in 1982 to provide quality

and expedient service to industries that

need repair and N.I.S.T. traceable calibra-

tion of test and measurement equipment.

The company has grown from a two- per-

son lab to a current workforce of approxi-

mately 110 employees in five laboratories,

including the Electrical Safety Laboratory.

JM Test Systems entered the electrical

safety testing business in 2001 with lim-

ited basic services, performing dielectric

testing on gloves for the utility industry.

The electrical testing laboratory was origi-

nally staffed by six employees, working out

of a 6,000-square-foot building that had

formerly housed the JM Test Systems Cal-

ibration Laboratory. This lab team had the

ability to test about 850 pieces per week.

With ever-increasing OSHA-driven cus-

tomer demand, it became necessary for the

Electrical Safety Laboratory to expand and

hire more technicians. After years of careful

planning, in September 2013 the Laborato-

ry moved into a new 12,000-square-foot fa-

cility at the JM Test Systems corporate cam-

pus. With this large facility, production

can be increased by approximately 50 per-

cent, once all glove-testing machines are in

operation, and there is space to add more

testing equipment as demand dictates.

Experienced personnel contribute to

the success of the Electrical Safety Labo-

ratory. The staff, including former utility

industry professionals, provides service

to a growing nation-wide customer base.

These former linemen and electrical in-

dustry experts help steer the testing lab-

oratory to meet the needs of the industry

and offer services designed to assure safe-

ty at all levels.




This devoted crew serves a growing

number of “on-site” customers annually.

The Electrical Safety Laboratory has

been approved as an Accredited Testing

Laboratory to test a wide array of Lineman’s

High Voltage Protective Equipment. The

in-house operation provides cleaning and

high-voltage proof testing to ASTM/ANSI

specifications on rubber gloves, sleeves,

blankets, rubber insulating footwear and

line hose, blast blankets, phasing testers,

hot sticks to 100 kV/foot, ground clusters,

insulated hand tools and test tool repair.

They also build custom-made grounds and

stock a large inventory of all the items they

service as well as arc flash/PPE gear.

The importance of the electrical safety

testing industry cannot be overstated.

The lives that are saved as a result serve

as proof. When you see electrical linemen

and utility workers, understand that ESL is

working diligently to make their jobs safe,

as service to others is at the heart of JM Test

Systems Electrical Safety Laboratory.

[email protected]

“True heroism is remarkably sober, very undramatic. It is not the urge to surpass all others at whatever cost, but the urge to serve others, at whatever cost.”- Arthur Ashe


16 | NCSLI Measure J. Meas. Sci. www.ncsli.org

TECHNICAL PAPERS


Utah SectionMichael Coleman

The NCSLI Utah Section held its first meeting on Monday, April

21, 2014 in Logan, Utah, and was hosted by Utah State Space

Dynamics Laboratory (SDL). The busy meeting schedule included

presentations and a demonstration and concluded with a tour.

Speakers gave presentations on a variety of relevant topics.

Michael Coleman, Fluke Calibration and NCSLI Utah Section

Coordinator, spoke about metrology and calibration as a career path

for engineers and scientists. During the presentation, we watched a

video from a Dutch lab entitled “Metrology in Our Lives” as well as

a video from NIST Boulder on their new atomic clock.

Kendall Johnson, with Utah State Space Dynamics Laboratory,

gave a presentation on how metrology and calibration supports

research at his laboratory. From the Idaho National Laboratory,

Mike Stears presented an overview of the projects and research

being conducted at his facility and how calibration supports the

work being done there. Tom Wiandt reported on recent news

and updates on the SI units. In addition, Tom Harper with Fluke

Calibration presented a demonstration, “How to Realize a Triple-

Point of Water Cell.”

A big hit at the meeting was bringing in Utah State Aggie ice

cream for the afternoon break. We wrapped up the meeting with a

tour of the Space Dynamics Laboratory calibration facility.

We had 40+ people in attendance, representing 11 different

organizations, with the largest contingency coming from the

Idaho National Laboratory. We are delighted to announce that

the Space Dynamics Laboratory with Utah State University has

recently joined NCSLI! Please welcome them to the organization.

The Space Dynamics Laboratory is eager to participate and has

already expressed interest in hosting future meetings. We look

forward to their participating and to the possibility of welcoming

more new members!

[email protected]

Utah Meeting.

NCSLI REGIONAL NEWS


Mid-Atlantic SectionRob Knake

The Mid-Atlantic Region and Maryland Section hosted a two-day

event from April 9-10, 2014. The first day was a Measurement

Uncertainty Development Process training event conducted by

Dilip Shah and the second day was a meeting discussing a variety

of measurement topics. Both days were well attended and a lot of

good discussion was generated.

The meeting was hosted by Alliant Techsystems (ATK) Tactical

Propulsion and Control Division at the Allegany Ballistics

Laboratory (ABL) located in Rocket Center, West Virginia. ABL is

a diverse industrial complex employing some 1,100 people across

1,628 acres. The facility is a member of the Federal Laboratory

Consortium and is operated by ATK under contract with the Naval

Sea Systems Command (NAVSEA).

ABL was established in 1944 on the site of a former ammunitions

plant on land owned by the Army. After World War II, the plant was

transferred to the Office of Scientific Research and Development

and was involved in building propulsion devices and engines for

the solid-rocket industry. Later in the decade, ownership of ABL

was transferred to the Navy office of Naval Sea Systems Command.

In 1956, when it was producing Altair rocket stages for Vanguard

rockets, ABL was “a subsidiary of the Navy operated by the Hercules

Powder Company.” The Navy now contracts out operation of the

facility to ATK.

The second day opened with Jim Tedesco, Director of

Mission Assurance with ATK, who gave an overview of the

diverse operations at the facility. ATK production capabilities at

ABL include tactical missile propulsion and warheads; metals,

munitions and composites and fuze and electronic integration.

Dilip Shah from E=MC3 Solutions then gave an excellent

presentation on the preparation for an ANS/ISO/IEC 17025

assessment. This topic generated a lot of great discussion as there

were many organizations in attendance that are accredited or were

looking to become accredited to the standard.

Henry Zumbrun from Morehouse Instrument Co., Inc. gave

a presentation on errors in force and torque measurement. The

presentation was very interesting and provided insight on common

pitfalls to avoid when making these critical measurements.

Lastly, Chris Damson from ATK gave a sobering talk about the

back torque issues that were discovered at ATK production. In

2006, an ATK operator noticed that the torque wrench he had just

used to torque a bolt rotated in the counter-clockwise direction

after the proper torque had been achieved. When the operator

inspected the torqued bolt, he found that it was loose and could

be unscrewed by hand. Stimulating discussion followed the

presentation on this intriguing issue.

The meeting culminated with a tour of the ATK calibration

facility.

Special thanks to ATK for hosting and to all the presenters for

their excellent presentations. Also, very special thanks to Mr. Phil

Smith who helped arrange and conduct the meeting.

[email protected]

Mid-Atlantic Meeting.

NCSLI REGIONAL NEWS


Puerto Rico SectionRichard Santos

Puerto Rico Section 1225 of NCSL International held its meeting

on Thursday, January 30, 2014, at the Colegio de Ingenieros y

Agrimensores de Puerto Rico, located in San Juan. The meeting

was organized by Section Coordinator Richard Santos and was

sponsored by Transcat and Hilton Engineering.

In attendance were 41 professionals of the engineering and

pharmaceutical industry, who enjoyed talks by Ken Kolb,

metrology engineer with Transcat and Victor Ferrer, PVSR President

and validation specialist.

Ken Kolb’s presentation was “Estimating Uncertainties

in Measurement and Calibration.” He spoke about how the

uncertainty evaluation helps reveal shortcomings in the product

stream and leads to improvements in product and efficiency in

the process. His talk helped participants understand the basic

concepts of uncertainty in measurement and the reliability of the

calibration value.

Victor Ferrer spoke on the topic “Good Validation Documenta-

tion Practices and Current Good Manufacturing Practices.” The

Good Validation Documentation Practice (GVDP) is the standard

for the preparation, completion and maintenance/retention of

documentation for compliance with regulatory requirements. The

current Good Manufacturing Practices (cGMPs) represent the stan-

dards for industry for the manufacture of safe and efficacious phar-

maceutical, medical device and biotechnology products. These are

regulations and must be observed as law. This talk was a good re-

fresher course on the GVDP. It helped the participants understand

the basic principles and guidelines for conducting a good valida-

tion documentation execution for compliance with regulatory re-

quirements. It also provided basic and thorough knowledge of the

concept and philosophy of cGMPs for the pharmaceutical, medical

device and biotechnology industries.

A further benefit of the meeting was that it provided continuing

education credits for the Colegio de Ingenieros y Agronomos de

Puerto Rico.

[email protected]

NCSLI REGIONAL NEWS

Puerto Rico Meeting.


Southern Ohio/Kentucky SectionMatthew Denslow

The Southern Ohio/Kentucky Section held its spring meeting on

April 24, 2014. The Bionetics Corporation, Newark Metrology

Operations, sponsored the meeting at the Newark Metropolitan

Hotel in Newark, Ohio. Several door-prizes were provided by

meeting attendee, Ms. Jill Hammond, Technical Maintenance

Inc., presenter, Mr. Ed Lane, Morehouse Instruments Inc. and the

NCSLI Business Office.

Following breakfast, Mr. Matthew Denslow, Bionetics Training

Manager and Section Coordinator, welcomed all attendees and

reviewed the day’s agenda.

Mr. Lloyd Baker, NCSLI Mid-Western Regional Coordinator,

kicked off the day’s program with a short talk about the recent

NCSLI Board of Directors meeting. Lloyd encouraged the meeting

participants to attend our annual conference in Orlando, Florida

this year from July 28-31, 2014.

Mr. Peter Unger, President and CEO, American Association for

Laboratory Accreditation (A2LA); Chair, International Laboratory

Accreditation Cooperation (ILAC) discussed the “The Future of

Accreditation and the ISO Standards” Mr. Unger provided an

explanation and purpose of the ILAC organization. The group

discussed the impact of ILAC P10 and P14 documents. As a final

point Mr. Unger identified the ISO Standards currently under or

preparing for revision.

Mr. Jeff Gust, Corporate Metrologist with Fluke Calibration

provided two presentations. In the first presentation Mr. Gust

highlighted the results from NCSLI’s member survey on the need

to change ISO/IEC 17025. Mr. Gust points out that 100 % of each

section received at least one vote to clarify or overhaul the section

and that improvements could be made to the standard. During

the second presentation Mr. Gust explained the redefinition of the

Kilogram will impact our measurements. The proposed revision

of the Kilogram continues to bring about good discussion. A

key point made by Mr. Gust was NCSLI’s role in explaining any

changes to our members.

Mr. Dilip Shah, President, E=MC3 Solutions began the technical

portion of the program with an excerpt from the tutorial

“A Practice Application on Type A Uncertainty Data Analysis.

“This session provided examples of the proper use of repeatability/

reproducibility study data. Additionally, Mr. Shah explained

how the “degrees of freedom” are combined and impact the final

uncertainty calculation.

Concluding our technical presentations, Mr. Ed Lane, Morehouse

Instrument Company, provided an overview of ASTM E74

standard with an example of a measurement uncertainty analysis

associated the calibration of force instruments. Mr. Lane outlined

the calibration processes required by the ASTM E74 standard. Mr.

Lane further developed the uncertainty example given in ASTM

E74 appendix A providing details for each component.

The meeting concluded with remaining attendees exchanging a

completed meeting feedback form for a door prize. There were 21

people in attendance. Planning is underway for our next meeting,

October 2014.

[email protected]

Southern Ohio/Kentucky Section meeting.

NCSLI REGIONAL NEWS


NCSLI INTERNATIONAL NEWS

BackgroundThe terms accuracy, trueness and precision are defined in ISO 5725

and discussed in the chapter on Uncertainty and Accuracy of the

Springer Handbook of Metrology and Testing (Springer 2011).

Accuracy as an umbrella term generally means the agreement of

a measurement result with the “conventional” true value. For a

series of repeated measurements, accuracy can be split up into

trueness and precision.

• Precision characterizes the dispersion between the single

results.

• Trueness characterizes the difference between the mean

value of the series and the “conventional” true value.

Precision strongly depends on the conditions under which meas-

urement results are obtained.

Repeatability conditions mean that all parameters are kept as con-

stant as possible, e.g.,

a. the same measurement procedure

b. the same laboratory

c. the same operator

d. the same equipment

e. repetition within short intervals of time

Reproducibility conditions imply those conditions for a specific

measurement that may occur between different laboratories, e.g.,


b. different laboratories

c. different operators

d. different equipment

Intermediate conditions have to be specified regarding which

factors are varied and which are constant. For within-laboratory

reproducibility the following conditions are used:


b. the same laboratory

c. different operators

d. the same equipment (alternatively, different equipment)

e. repetition within long intervals of time

While the evaluation of the precision of a measurement

procedure (under repeatability conditions) is rather straightforward

for a laboratory, the trueness of the procedure is more difficult to

assess. Reference materials or reference objects play an important

role in the assessment of the trueness of a measurement procedure.

Reference MaterialsThe definitions of reference materials are given in ISO Guide 30:

• Reference Material (RM): Material or substance one or more

of whose property values are sufficiently homogeneous and

well established to be used for the calibration of an appara-

tus, the assessment of a measurement method, or for assign-

ing values to materials.

• Certified Reference Material (CRM): reference material,

accompanied by a certificate, one or more of whose property

values are certified by a procedure which establishes its

traceability to an accurate realization of the unit in which

the property values are expressed, and for which each

certified value is accompanied by an uncertainty at a stated

level of confidence.

Examples of brands for certified reference materials provided

by specific RM-producers are: Standard Reference Material SRM®

(certified reference material provided by NIST) and European Ref-

erence Material ERM® (certified reference material provided by the

ERM co-operation).

Reference materials can be categorized according to a variety of

criteria, e.g. field of application, form of material, matrix type, in-

tended use in the measurement process and specified properties.

The categorization according to the specified properties is useful

for a general overview. Reference materials are available for the

following categories of specified properties:

Accuracy, precision, and trueness are important aspects of all measurements. This Letter outlines these themes on the basis of a

guideline on “the assessment of the trueness of a measurement procedure by use of a reference material,” published by EUROLAB in

its COOK BOOK www.eurolab.org.

Letter from Europe

Accuracy, Precision and Trueness of Measurement Procedures The Role of Reference Materials

Prof. Horst Czichos BHT Berlin, University of Applied Sciences, Contributing Editor


LETTER FROM EUROPE

A. Chemical composition

Reference materials (RMs), being either pure chemical

compounds, mixtures thereof, or representative sample

matrices, either natural or with added analytes, characterized

for one or more chemical or physicochemical properties,

e.g. metal RMs (ferrous/non-ferrous and their alloys),

environmental RMs (soil, water, biological materials), gases,

solutions (e.g. pH buffers).

B. Biological and clinical properties

Materials similar to Category A, but characterized for one

or more biochemical or clinical functional property, e.g.

catalytic activity of an enzyme, taxonomic identity of a

microorganism.

C. Physical properties

Materials characterized for one or more physical properties,

e.g. optical properties (refractive index, spectral absorbance),

electrical/magnetic properties (e.g. dielectric strength,

magnetic susceptibility), radioactivity, thermodynamic

properties (e.g. thermal conductivity, thermal resistance),

physicochemical properties (e.g. viscosity, density).

D. Engineering properties

Materials characterized for one or more engineering

properties, e.g. sizing, hardness, tensile strength, surface

characteristics, impact hardness, elasticity, etc.

E. Others

E.g. materials to determine quality properties of wheat flour

like water absorption, processing and dough characteristics.

The following pictures illustrate the broad variety of reference

materials and indicate their importance for technology, economy,

society and trade.

Measurement Procedure and the Assessment of TruenessMeasurement begins with the definition of the measurand,

the quantity intended to be measured. The specification of a

measurand requires knowledge of the kind of quantity and

the characteristics of the object carrying the quantity. When

the measurand is defined, it must be related to a measurement

standard, the realization of the definition of the quantity to be

measured. The measurement procedure is a detailed description

of a measurement according to a measurement principle and to a

given measurement method. It is based on a measurement model,

including any calculation to obtain a measurement result. The

basic features of a measurement procedure are the following:

• Measurement principle: the phenomenon serving as a basis

of a measurement

• Measurement method: a generic description of a logical

organization of operations used in a measurement

• Measuring equipment: a set of one or more measuring

instruments calibrated to a measurement standard to give

information used to generate measured quantity values

within specified intervals for quantities of specified kinds.

• Measurement uncertainty: a nonnegative parameter

characterizing the dispersion of the quantity values being

attributed to a measurand. A basic method to determine

uncertainty of measurements the Guide to the expression of

uncertainty in measurement (GUM)

• Measurement result: the result of a measurement has to be

expressed as a quantity value together with its uncertainty,

including the unit of the measurand.

An assessment of the trueness of a measurement procedure can

be made if a “certified” reference material is available whose refer-

ence quantity can be measured with the measurement procedure

in question:

1. The reference quantity of the RM is measured n times

providing the single measured quantity values xi, the

mean value xm, the standard deviation s, and the standard

measurement uncertainty u = s.

2. The absolute value of the difference Δ between the certified

reference value xref and the mean measured value xm is

determined: Δ = | xm | – | xref |.


3. The difference Δ is compared with the uncertainty uΔ,

which is the combined uncertainty of the reference value

uref, taken from the certificate and the uncertainty of the

measured mean value um.

4. The measured mean xm value is compatible with the reference

value xref (i.e. there is no experimental evidence for a bias), if Δ

is smaller than k • uΔ, where k is the coverage factor, which is

usually chosen as k = 2, which corresponds with a confidence

interval of the uncertainty of approximately 95 %.

The methodology of the assessment of the trueness of a

measured procedure by use of a reference material is depicted in

the following box.

LETTER FROM EUROPE

SI units

Measurement result: measured mean quantity value: xm; uncertainty: um

Reference material

or reference

object

OBJECT

Characteristics Measurand

Reference with respect to - Chemical composition, - Geometry, Structure, - Physical property, - Engineering property - other

Measurement standard

Calibration Measurement principle Measurement method

Measurement equipment Measurement uncertainty

Traceabiliy Traceabiliy

certified reference value: xref; uncertainty: uref

Assessment the measured value xm is compatible with the reference value xref if the following criterion holds: Δ = | xm | – | xref | < k • uΔ (k: coverage factor) uΔ is the combined uncertainty: uΔ = √ (uref

2 + um2,)

Δ

xref

xm

x

x

data distributions

measured quantity

valie

reference valie

± 3 um

± 3 uref

Methodology for the Assessment of the Trueness of a Measurement Procedure

Measurement procedure

[email protected]


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