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8/20/2019 Mil-std-105e (Ansi_asq z1.4-2008)
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NOT MEASUREMENT
SENSIUYE
h
MIL-STWI05E
10 MAY 1989
SUPERSEDING
MIL-STD-105D
29 APRIL 1963
MILITARY STANDARD
SAMPLING PROCEDURES AND TABLES
FOR INSPECTION BY ATTRIBUTES
AMSC
N/A
AREA Qcil
~~~ Approved for public reiesse; dktribution is Unlimfi
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QL-” SI’D105E
DEPA~ W DEFENSE
Washbgmn, DC
20301
SAT*LDG P~
T I ND’ZABESFOR INSP=TI@JBYMTNBUES
1. Ttis
tilitarystandad
is
approved
for use
by all
Depsmmms
and
Jqencies
of - ~~~ of ~f-”
.
2.
Beneficial
~.ts Cemmm&tiom. additions,Wetions) and any
peeine.ntdatawhi~ may beef usein~this~ shouldbe
addressedto:
CnRInancier
Us.
Amy
AmamE Rem-a, Dwelopnent
and
‘+-king Ckmer
M-IN:
SK?R-BAC-WBM J. 6
Picatinnytisenal,NJ 07806-5000
by
usi..gthe
self-a=-essed&.andardizaton Dmmmt
m~
PrepSal
(DDFom 1426)~L-hq at the md of this
docmmt or letter.
ii
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ms
MZL-S’IZ+1C5Z
mRE3m*”
providessawling proce&res and referwm tablesforuse in
on the pxobabiiis.icrecu.+mce 05
e%.ts when a sa~iesof-iots or bat~s are
produ~ ti a stableenvironmrt.
Thispublicationshouldbe-usedto guide the
user in the ~kpmnt
of an
inspee.ionStratw thatprovidesa co=. eff~ive qroach to attaining
cm-:idm~ in pro&t
user is warnedof the
w-.
~liance wi”thca racaual te-&%i~ reqJ
ats. The
assumedrisksrelativeto the *sem sanple size and
~ifications shouldnot contaknrequirement for use of specific
Q.z?s,
23Z
shxld “. y provideAQL’s or H?D’s as a -~rmem.
pkns fc= coxinuous,ra’hr than lot inspection,are contm M
iii
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~L-.STD-lO5E
GmTmTs
Paragraph
1.
1.1
1.2
2.
2.1
3.
3.1
3.2
3.3
3.4
3.5
2.6
3.7
3.e
3.9
3.10
3.11
3.12
3.13
3.14
3.15
3.16
3.17
3.18
3.19
3.20
3.21
3.22
3.23
4.
4.1
4.2
4.3
4.4
4.4.1
4.4.2
4.4.3
SCOPE...............................................
-se
...........................................
*liation .......................................
~IxmPEurs- ...............................
W.
qplicable....................................
=INITIONS .........................................
Acq able Qdality Ievel WE) ....................
AverageOutgo ~Quality(lQ)....................
AveraoeOutqoingQualityWt (AOQIJ.............
Classificationof Defects.........................
CriticalDefect...................................
CriticalDefective................................
Defect............................................
D@eccive................. ........................
DefectsPer Ru@edUn its... ......................
~i~......
..................................
~aim by Attribxes
..........................
w&or Batdl......................................
Im or Batch Size.................................
Major Defect
......................................
Major Defective...................................
Minor Defect
.....................................
Minor Defeaive. ..................................
PercentDefective
.................................
~s Average
...................................
Sanple............................................
Sanple Size COde~tt=v ...........................
Salq?linglan
.....................................
unit of Procalct..................................
~mxm=’nm
Written~
................................
NmcVnfozmne ....................................
Fonmticm and
Itificatim
of ~ or =Cks. ..
...............................................
ML use
...0...........*..........................
Umkation ........ ...............................
choosingAQU .....................................
Page
1
1
1
1
1
1
2
2
2
2
2
2
2
3
3
3
3
3
3
3
3
3
3
4
4
4
4
4
4
4
4
4
5
5
5
5
5
.
iv
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mL-sm-lo5E
CcNTmrs - Conttiued.
Paragraph
~B~
4.5.1
4.5.2
4.5.3
4.6
4.7
4.7.1
4.7.2
4.7.3
4.7.4
4.8
4.9
4.9.1
4.9.2
4.9.3
4.9.4
4.10
4.lC.1
4.lC.1.A
4.1(?.1.2
4.10.1.3
4.10.1.4
4.10.2
4.11
4.12
4.12.1
4.12.2
Sarrpling........................................
RepresentativeSan@.ing
..........................
The of Sanpling
.................. ..............
Double or MQtiple Sampling......................
~on P~
.................... .......
WitdlirlgP~
.............................
Normalto Tightened
......0......................
Tight- to Normal
.....0......................
Normalto ~
..............*.....**...**...
Rduced to Normal
................................
Disconthtion of~on... .................
SanplingPlans...................................
~ion Wvel
.................0...............
Co& utters
.....................................
~aining San@ing Plan
..........................
TYF= of sapling Pkns
..........................
Determinationof~ability. ..................
P~Defective~ion. ....................
Single Sanql@ Plan.............................
Double Sa@ing Plan
.............................
FhltipleSanpling.lan..........
*..............
~ p~
forRedu*IrqeCtion .........
DefectsPer
?lundmdt?nits~ion ............
Idniting@ality Protection.....................
~s .................*.........................
~t@~merkic ~ ..................
A~ge SanpleSizeComes.......................
5. TABES
.............*...*..............*.............
Table
I.
II-A.
II-B.
II-C.
III-A.
III-B.
III-C.
Sa@e Size CodaMitters........................
SingleSan@ing Plansfor Normal-
~im Naster table)......................
SingleSmpliq Plms for Tightewd
~i~ ~=t~le) o..o-oooo==oo.=.e....
SingleSapling
Plans
for~
~ia (Mas@rtable)......................
DoubleSamplingPlans forNormal
~i~ -a~le).. oo......o.BOO.......
DcxbleSapling
Plans for
Tight-
~m ~er=e) ......................
DoubleSamplimgP1.ansforReduced
~im (Mastertable)......................
Page
5
5
5:
5
:
6
6
6
6
“7
7
7
7
7
8
8
8
8
8
8
8
9
9
9
9
9
11
13
14
15
16
17
18
19
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MIL-STW105E
mt’n’mrs-
Conthued.
Table
IV-A.
IV-B.
TV-c.
V-A.
V-B.
%3-A.
V3-3.
XI-A.
VII-B.
~*~1-
IX.
Mltiple Sa@ing Plans for Norml
Inspectim M3ster-le) ......................
M.dtipleSanplingPlans for Tightened
~im (MastertaMe) ......................
Mdtiple SamplingPlans for ReduOed
Inspection(Mastertable)......................
AverageOutgoing
uty IAmit F~s for
lwml~on (Sin@e Zq) .....-...o..
~ge Outgo* QualityLimit
Fa=ors for
TightenedIMpeCtiOn (S=le ~1~).:...-..”
uting Quality(h
Perumt Def-iue) for
Wch a Pa =
10% (forNomal Inspemion,
S~le Saxrpling)...................-..-...-*o”
LimitingQuality(inDefectsper ~
Unks) for which the Pa = 10% (forNozmal
Inspection,SingleSanplhg).-..---------------
Unliziq Quality (inP~t mfecti=) fo~
khid. “thePa = 5 (forNom@
~ionl
SingleSawling)......................
..........
LimitingQuality(fiDefectsper Hmdma
Units)for which the Pa = 5%
(f= W*
~m, Siwle S=@@
....*..............
Li,mitNmbersfor ~ Inspection............
AuerageSampleSize Cumes for DDuble and
FmltipleS.mpliq .............-...--.-......-.c-
~ltig pl= and cparatirq~amic
Cumes (andData) for:
X-A.
San@e Size~ktter A........................
X-3 .
Sanple Size~Utter B.........................
x-c. SanpleSizeMkter C..........e00-00o.......
X-D. San@e SizeCo& LetterD........................
X-E. SanpleSize~Utter E........................
X-F.
San@e SizeMletter F........................
x-G .
SanpleSizeMUtter G...............--..-..”-
X-H. ~le Size@ckletter H........................
X-J. qksM-~ J............*..”””””.”.”
X-K. SaupleSizeMIetter K.......-----------------
X-L.
~le S~M~ L........................
x-M.
SanpleSize M~M ...........e............
X-N. San@eSizeM E~N ........................
x-P.
Sal@esizeM wtterP . . . . . . . . . . . . . . . ..”....”.
x-Q.
~le S~Mk= Q.......*”+”*.==.*”+”*..=
X-R.
~le S@ Mk=R ..................=””~””
Page
20
22
24
26
27
28
29
33
31
32 “
33
34
36
38
40
42
44
46
48
50
52
54
56
58
6
62
64
vi
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x-s.
Paragraph
6
6.1
6.2
6.3
mL-sl’wlo5E
,
CCN’TS - Continued.
Page
~~e size~ ~tt~v S
........................
66
........*..............................
. . . .
v
Intf2nckci
use...................................
67
Subject’I’em (keyuofi) tist~ ................” 67
~fr~P~im Issw . . . . . . . . . . . . . . . . . . . . 67
mlmsAL. .............................
68
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F2L-S’ID-105S
1.
~~~
1.2 Pqse.
This ~li=tim establisheslot or bat~ sapling plans and
proceduresfor ~ion by attributes.
‘1’nisubli=tion shallnot & irfter-
p.retedto superm3e or confli= with any amtraCtti ~
s.
m words
“awqX”,
“a~”, “acceptable”*etc,
referonly
to the contractor’s use
of
the sanplingpkms Writ- in this
~anddonotinplyana~ W
-theGove&mmn
t to acceptany prcdom. Det
erfninationf aqability by the
Gwen ‘:=% shallk as desm~ in contractual~ts.
me Sarfplinglans
*sdhd in Ws standad m
awli-le to U’s of .01pe~t or ~~ and
are‘the.refre not suitablefor ++licationswherequality1-1s
;az.sper millionrange m be realiz05.
in
the defemive
are applicable,
a.
b.
c.
d.
e.
f.
9.
h.
ElrIctems.
Cmponents
Qerations
Materialsin process.
Su@ies in storage.
Maintenance~ations.
Data
or records.
Mmbistrative
~-
Theseplans are intendedprimarilyto be used fora continuingseries
of
lots
0:
batches.
The plans may alsobe used for the inspectionof isolatedlots or
Mches, W., in MS latter=, m = K =i~ to ~t ~ ~m
characteristic
mrves to f ind a plan whichwill yieldthe desiredprotectim
(see4.11).
2.
2.1
3.
N&. -liable.
=INITICNS
1
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FEL-S’IW105E
3.1 z
~ableQualityLevel (ML).
When a mntinuous seriesof 10Es is
considered,the AQiiis tbe qualitylevelfib, for the roses of sa@@
~.ion, is the limitof a satisfactoryprocessaverage (Se 3.19).
NOTE:
A sanpl~ plan and an AQL are chosenin accordanm with the risk assured.
Useofa@ueoflQL fora
a2rtain& fector groupof &fec5s indicam that the
ql~ PM till acoeptthe -t majorityof the lots or bata pbded the
prooess-X levelof ~ defectiwe(or&fects per
huxlredunits) in these
lots or batchesbe no greaterthan the ~ignated value
of A Thus, the AQL is
a ckignated value of ~ defective(or&facts per
hundredunits) forfich
btswill~a~+m~oftk timbythesaqlingp
~re bing used. The
~liw pl~ prfi~ here~ ~ ~ ~ tit ~ p~i~ty of a~
at the ~ignat~ A@ ~ue ~ ~ the sanplesize,~ Z~N ~Xr
:0= 1~~ samples-n for mall ones, for a givenAQL. The AQL alone does not
idelm=ifthe chanoes of aqing or rejectingindividual10Ls or batchesM m.-
dire- ~
.-y relatesto whatmightbe ~ed fruna seriesof lots
or
batches,
prm”i- * steps indi=ted h -s publi~tion aze “taken.
lt is
~sary to
=eYerto the operattigdarad.=”iscic
~ of t.te
plan to *texmine
the relative
risks.
3.3 Average
Qxqoing QualityLimit (ADQL). The M(2L is the
maximum ACQ fora
9L~ a9L~~ -lW pkn. Factorsfor
~@? ML tiues are givm M
Tabie V-A for each of “~ singlesaqlimg plans for normalirqection and in
TableV-3 for each of the singlesmpling plans foz tightened~ “on.
3.4 ClassifimEion of Defects.
A classificationf defectsis t enumerationof
pcsstiie
defects
of the unit
of pxduct
classified
amrdirq to
their seri~.
3.5 Czlti~ DefS&.
A criticaldefect is a ~fect that j~ and ~ri=ce
~mte would resultin hazardousor unsafeconditionsfor individualsUS*,
--, or
~
~upontheprodwt, ora ~fecttbat~ti
experim indicate is likely to prevent perf~
of ttE ~cal fun-on of a
major * itm SU* as a Ship,aixuaft
tank,nbsile, or ~ title.
3 6 Critidl Defective.
A criticalckfectiveis a unit of prockt uhi~
contti one or mre criti~ defectsti may also
contdn mejor and/orminor
defects.
3.7 Defect.,
A defectis any
nonconformanmof the unit of productwith
specimTEi%@l=mts .
2
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laks’m-lo5E
3.8 Def-.ive.
A def=~ive is a unit of productwhich containsone or mre
defe.s.
3.5
Defe.s
per HunckedUnits.
The nwber of defe=s per hundredunits of ~Y
gim quantityof units of productis one
hundredtimesthe mm&r of &fects
con=zinedtherein(oneor mme *fec s being possible in any unit of product)
diviti by the total nunberof units of product,i.e.:
Defects p“
=
Nunberof &fects x 100
hundredunits
Nmbar of units ~~
3.2C Impaction.
Inspectionis the processof ~imt
~gt testmt
cr o-.?m.isecmparing the unitof pmdu~. with the reqair-nts.
7 1i T
- - -
~io~ by Attribtes. Inspectim by
attributesis inspectionwhe~
eizher‘& unit of productis classifiedsimplyas defectiveor non+ef=eive, or
~he numberof defe~.sti the unit c= prcdue.
is courted,with re~st to a givm
~~:i~m or set or requirements.
3.12
tit
or -t&l.
The term lot ox katch shall man “inspectionlot” or
“i==se.ion batcb.”,i.e.,
a collee.ionof unitsof productfrom whi~ a sanple
is EC be dram and i~ed md may dif5erfrm a mll-~ion of unitsdesignate
as a 10= or bat~ for 0“= purposes(e.g., production,shipnent,etc.).
3.13 bt or BatchSize.
The lot or ~t~ size is the number of units of prtib
A a lot‘0:bata.
3.14
M3jor
Defect. A majordefecL
is
a -fact, otherthan criti-, that is
liKelyto resultin failure,or to reducemateriallythe usabilityof the unit
of productfor its int- ~-
3.15 ~a
jor
* f~i~.
0: mre majordefects,
defect.
A majordefectiveis a unit of productwhid? containSon
* may
alSO contain
rrtiordefecLsbut containsno aiti-
3.16
Minor
Defect.
Anbm~i.Sa&fti~t isnot-yto~
materiallythe usabilityof the unit of productfox its int- puzpose~m is
&par&m
fran ~
~WviIgU*~@m
tkeffeCtiWUSec
operatim
of the
unit.
3-17 MinorDef-i-. A
minordefectiveis a unit of P-a M* ~ ~
-- -— . . . —
ox more minor &facts
mtamtains
no aititi or
major*feet.
3
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GL-SB105 2
3.16
Per-m
Defective.
The percent &femive of any givm quantityof units
of produe~is one hur&4 tires the n~- of defemive units of prda~. contairEd
thereindiviti by the total mmber of units of produa, i.e.:
?ercentDefective
=
Nmber of &fectives x 100
~“ of lmits ~ed
3..19ProcessAverage. The Droces
s averageis the average~t &fective or
averagenmber of &fects pez
hw@red
u n it s wh ic h eve r
is ~li~le) of product
szhitted by the sq@ier for originalinspection. Originalinspectionis ~
firstinspectionof a
pa.z.zicula.r
uantityof produceas d.istinguis@dfranthe
~ion of productwhi~ has been
resu&nittedafterprior rejection.
3.2C Sa~le. A sampleconsi=.sof one or mre u..irsof product
drawn
fran a 10=
or &z&, the units of the sem@e being sele~beda= randomwithoutr- to their
q~z:icy.
~ nmtx= C: units of productin the sampleis the sarplesize.
3.22 SampleSize CoaeUtter.
The sanplesize code letter is a deviceused
ElO.ngWitihthe WA fcr l-tins a sapling
p lan cm a
table cf semplingplans.
3 22 Sa?’@hg Plan
A sanplingplan indc caceshe nunt?erof unitsof product
fromeat’.io= or bat&.which m to be insoect
ad (sanplesize or seriesof
sa@e sizes)and the criteriafor cke.rmi.%ngthe acceptabilityof the lot or
batch (acceptan02anc rejectionnumbers).
?.23 ‘Unit
of
Prodxz .
The unit of produ~.is the thing inspectedin o-r to
&.emme lts classif~mtion as defectiveor non-def-hive or to countthe ~“
of +.fecbs. It my be a
singlearticle,a p&ir, a set, a hmgth, an =8 ~
operation,a volme, a cmpcmmt of an end product,or tlw end prociuaitself.
The unit of p~GL may or my not be the sameas the unit of ~, SWPIY,
production,or sh.ipnent.
4.
QN=AL RmJIm=m
4.1
Written
P~ . Written
p~
.
are o~ily davelopedami made
avaalablefor* Govemmm ~
“Ve’s~,lqmnmquast. --
writtenp~ indime me of this stmdard,
they shallamply with -
mq’111aErltsof this
stmdard arxlZefermce
appropriate~ as ~.
4.2 Nonconformance
‘he extentof nonconf~
ofpro&ct sbaube=rP=-
eitherin
terns
Of peroent
Ckfectiveor in term of ckfectsper ~ titS.
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MIPST’D-105E
4.3 Fo.mationand Identificationof Uts or Bat&es.
Theproductshauke
as-led into i-tifiable lots,-lots, batches,or in - otkr manneras
may be paaibed . Ea* lot ox bat~ shall,as
far as
is practicable,mnsist
of unitsof prcduct of a singletype, grade,class,size,and composition,
manufacturedunder es-tially the sam renditions,and at
.
~ythesam
tine
The lots or bat- shall be
itified by the contractorand shallbe k
intar.in adequateand suitablestoragespace.
4.4 AQL.
4.4.1 AQL use.
The
AQL, to@ther with the SaupleSizeb& Letter,is used
f or
.
~
ln ?Lnc the sapl ing
plansp.mcw herein.
4.4.2 Iimita:ion.
The selectionor use of an AQL shallm. inplythatthe
cwcractor has the rightto sm@ y any defecEivewilt of product.
4.4.3 Chmshc ?@’&.
Diff~t ~Ls IllSye Chosenfor ~
of &fects
cms.ide.redolle.+.ivel, or for individual&fee&s.
An ML for a groupof &fe
my be tiosenin a~cion to AQM for individualdefects,or mkqraps, within
chat group. AQL values of 10.0 or lessmy be expressedeitherin ~t
&fective or *. ~fects ~- hunckd units;thoseover 10.0 ZhaU be qressed i
defe.s per “
mdmd units only.
4.5 Saxlplinq.
4.5.1 Repmsmt
ative (Stratified)Satrplinq.
When~ropriate, the rnzr&rof
unitsin the sanple shall& sel~ed in proportionto the size of subletsor
-bat-, or -s of tM lot or bat~, idmtified by q rationalcriteri
when represemat
hHaIcpMniswad 121e
uni ts
franeaal
part
of the
lot or
batdi
shallbe select”edt ranch.
4.5.2 Time of San’Plhq
A samplemay be dram afterall
the lot or batch have bi+enassembled,or sarrpleunitsmay
of the lot or bat~, in uhi~ case the size of the lot or
Sublet,
sub-batch or
the unitscaprising
be drawnduringassa
M* tillk * t e *
kefore any ample units are dram.
If tk sampleunitsare drawnduringas~l~
oftklot or batda, mdif tkrejectionnmb2ris
~m foreth lotis
Curpleted,that pomim of U lot almldy cxmpletedshallbe @ected. m a
oftkdefective ~shall bedmermined
and ammctive actiontaken,afte
&ichanewl otorbat*shgd.lk *.
4.5.3 Doubleor
Mltiple Saup ~
used,ea~ qle shallbe selecte&
WherI
&&le or
Ovarthe entire
mkiple sauplingis to be
lot or bat~.
5
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IaL-s’Iwlc5E
4. 6
~ion Pr~. Normalinspectionwink-at the startof
inspection.
Normal,tightenedor redu~ -bion shall continueundwqed for
each class of def~s or &fectiws an sumsive lotsox batd7esexq. wherethe
%it~ p~
givm klw require -. m swit~ P
~? *1
be -lied to each class of
ck fecSs oz
&2f_iveS <
Y”
4.7
%?it-
P~es .
4.7.1 Normalto Tightened.
~ normalinspectionis in
effect,ti@tened
*mim shallk institutedwhm 2 ouc of 2, 3, 4, or 5
comecutive lots or
batcheshave been rejettedon originalhspection (i.e.,ignoring~
“tted lots
0: btC S fOr thiS Fr~) .
4.?.2 Tig?l:eneeo No.mal. When tightened~ion is -b effect,no.mbal
inspecuon shailbe instituted*=I 5 consecutive10:sor baccbeshave -n
co.nsidey-a-ptable on original~
on.
4.7.3 No.malto R@xed.
When normalinspectionis in effect,reducedir++ion
shal1 be -.ituted providedthatall
of the followi~ conditionsare satisfied:
6. Tne pretig 20 lots ox
bat- (ormre, as indicatedby EYW note tc
Ta5~eVIII) have bee on no.mal~ction aiidall have ben acceptedon original
inspection;and
b. The.total nurber
of ckf-i= (orbf~) fi ~ ~~es ~ ~
p.re
eding 10 lots or batches (orSU* Ot&r mmber as was used for condition“a”
-) is equalto or lessthanthe a@i-le nmber givenin TableVIII. If
dable or mikiple
smpling is
+les only; imd
Pro@cLion is at a
RE cked~ “on
in
use,
al l
samplesinspectedshouldbe ~ti-,
steadyrate; and
is consi&rr &sirable.
4.7.4 RedWed to Normal.
shallbe institutedif any
a.
A lot or bat~
b. A le. Or batd)
4.10.1.4,or
_ ~ ~ion is in effect,normal inspection
of - follcwingomu on originalinq3acEcion:
is rejected;or
is comi-
acceptaMe underthe procedueS
of
c.
Productionbecmes
-= or dela~; or
d. Otherconditims ~ant that normalinspectionshallbe instituted.
6
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MIL-SIW105E
4. 8
Discontinuationf 1~
ion.
If the cumulative nmber of lots not
acce~.edin a sequenceof
mnsecmive LuLson originaltightmed inspection
r~achesfive,the acceptan~ prm3dures of this standardshallbe discontfiued
Inqlm un~- the provisims of *thisstandardshallnot be ~ until
mrrective actionhas ~ takZ7.
Tigthened~ion shallthenbe used as i
4.7.1had been invoked.
.
4.9
SanplinqPlans.
4.9.1 InspectionM.
The inspectionlevel&termines
the rela+~onship~
the lo: or &t* sizeand the sanplesize.
Thehspemion levelto be used for
any pa.mieti~-re@~c will be as prescribedby the contractor’swritten
P-~
-“-es.
Threein.spec.ionevels:I, II, and 111, are g:van in Table I for
ge-.-eraise (see4.1). Normally,hspee~ion Level II is us-. Hmmmr,
In~=.ion @vel I my be usedwhm lessdis=”wtion is needed,
or Ievel 111
my be used for greaterdiscrtition. Four additionalspeciallevels:
S-1, S-2, S-3, mti S-4, am gimn in the same tabieand my be used where
relaciveiysmallsanpiesizesace necessaryand largesa@ing risks can or W.
& mlerat~.
N3TE:
In the selectionof inspee.im ievelsS-1 tc S-4, ~ must be exercise
avoidAQii mm.asistentw“iti.hese ~eion levels.
Lm OLk” words, the ~
of the special
inspemion levels is to keep sanplessmallwhen ~saxy. For
in.stanae,he code iectersunderS-1 go no funk: than D, equivalentto a siql
sanpleof size 8,
but it is cf nc use to chooseS-1 if the AQL is 0.10 ~.
whichthe
mhinm ample is 125.
4.9.2
Co& Letters. Sanplesizesare designated
by
wck letters..-Table I sha
be used to findt& applicableco& letterfor the ~icular lot or batch size
and the p~iked impectl
“onlevel.
4.’3.3retainingSallp
illgPlan.
TTieAQLandthe m& lettershallbe usedto
=ain tne sanpl.irqlan franTablesII, III, or IV. Whm no sapling
plan is
availablefor a givencabination of AQL and code letter,the tablesdirectthe
user tc a differentletter.
Thesa@e size to beusedisgLvm bythenew co&
letter,not by t& originalletter. If this p~
leadsto differentsampl
sizes fo r
diff~ classesof &fects, t& code letterm
.
~ sa@e sizederivedmay be used for all
~tothe
Classesof defec+s. & an
alternativeto a sirqlesauplii
plan with an ~
~ofo, the plan
with an a~
m.mberof lwithitscomeqmmbg
ly Mqer sauplesize fo r
&signated AQL (wkre
avai lable ,
may be ~.
7
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MIL-S’ID-105E
4.9.4
Typesof SanplingPlans.
Three types of sapling plans: Single,Double,
and Wlziple, are givm h TablesII, III, and IV, respectively.Whe several
:ypes of plans are availablefor a givenAQL and code letter,any one may be used.
A decisionu to t= of plan,eithersingle,double,or titipler ~ ~l~le
for a given ~ @ * letter, will ~ly & ~ ~ * ~ison bet=
the administrativeiffitity and the ~ge sanplesizesof the availableplans.
7he averageszmplesize of multipleplans is lessthan for -Ie (~ M ~
case co.~
to si@e aqance n-- 1) and both of these m always
lessthan a si~le qle size (seeTable IX). US@lY m ~~a”~ve
difficultyfor singlesmpling and the costper unit of the sanpleare lessthan
for doubleor mltiple.
4.lG Daennina:ia of Amsmability.
4.2G.I Pe~nt Defeaive Inspection. To determinea~ ility of a lot or
bate mder percentdefectiveinspection,the appli-le. San@@ plan shallbe
used in accodance with 4.10.1.1,4.10.1.2,4.10.1-3,@ 4.3~.l.4.
4.IC.I.2 Shgie SanpLingPlan.
The n-” of sanpleunits inspecxedshallbe
qua2 tc the sanplesize givm by the plan. If tk n-v of =f-.i- f- ~
the sampleis equalto or lessthanthe aqan~ rnmber,t& lot or bat~ shall
‘m consideredaqable. If the nmber of &feccives is equal to or great-”than
the mjemion nwker,
the 10= or bat~ shallbe rejected.
4.10.1.2 DoubleSamplinqPlan.
Anuberof sa@eunkS6S?ud to the first
sa@e sizegiw by the plan shallbe inspected. If the mmber of def=ives
foundm the firstsanpleis equalto or lessthanthe first~ nmber,
the lot or bat- shallbe consi- a~le. If tb ~ of W-W
foundinthefirst sampleis equaltoorgmater than the firSt z@eCtim~l
the lot or batd shallbe rejected.
If tb nmber of &fectives fomd in &
firstsanpleis betweenthe first~c and rejectionxnzc&rs,a ~
sanpleof the sanesize shallbe ~ed. TM ~ of a-i= f- in
the fixstand secmd aanpks shallbe ammlated. If the ~tiw ~ of
*fectives isaqualto or lessthanthesemnda~
mmber, the lot or batd
shallh cmsickred a~le. If the cmdative rnmberof &fectives G equal
toorgreaterthan~~ rejectim~,t&lOtOrk* aballbe
= jetted.
4.10. 1.4 spec ial P~for~xnSJect
im.
- Xed13=d~im *
Sanplingpmoadura may t~
Withultaith=ac=pt==
or rejectionaiteria
m--” ~
*l~or=*~~be--
acceptable,but normal reinstatedstartingwith the next lot or
batch (see4.7.4.b).
8
.
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mL-Slmlo5E
4.10.2 Defectsw Hundredunits
Inspection.To &temine
~
a-ability of a
lot Or batti k-
&feCts ~“ hundredunits~
ion, t& promdure
specified
forpemem 63feGive inapecxionaboveshallbe “-, ex~ that the woti
“defects”shallbe substitutedfor
“ckfectives”
4.~1 ~i”
mg
QualityProtection.
The sanplingplans and associated~
given m this@liatim weredesignedforuse _ the units of productare
prodmed in a continuingseriesof lotsor batches mer a period of tire.~t
‘” the lot or batti is of an isolatedmm, it is ~irable to limitthe
=lec&im of sarrplinglansto those,
associatedwith a ck2signatedL mlw, Z
prouidenot lessthan a ~fied limitingqualitypmtectim
-W pldns for
this purpose-. be selectedby dmosing a LimitingQuality (L@ and a ~’s
riskto be associatedwith it.
TablesVI andVII give values of W for the
the cmnonly used ‘bonsmer’srisksof 10 ~at and 5 ~t ~bively.
If a
tiffe.mc valueof co~’
s risk is recpired,the O.C.
cumesandtheirtabu-
lazedvaluesmy be used. The conceptof IQ may also be useful in specify+q the
L-L and ~~.i
on Levelsfora seriesof lotsor bat-s, thus fixim mimmm
s*ie size-vherethereis saw
reason
foravoiding
corsmer’s risk)more than & Limking p~rtion of
singlelot or bat~..
(withmre than a-gima
def-kives (ordefects)in any
4.X2
Cum?es.
4.12.1 @crating Characteristics.
The qerathg ~ctaistic mmes
for
normal
-~ion, shownin TableX, indi~=e the pe.roentagef lots or kt~
whAtimay be ~ed to be acceptedunderthe varioussapling plans for a given
pmoess @ity. The mmes
shownare forsinglesapling;
cumes for tile and
mlziple saqling are xmtchedas closelyas p-i-le. The O.C. cumes shown
for AQIs greaterthan 10.0are based on the Poisson&ibution ti are ~li-
~le fo= defectspax hundredunits i.nsp&tion;those for~ of 10.0 or less and
sanplesizesof 80 or lessareM on the binanialdistrikmim and azz
applicableforper- defecLive~-ion; those for AQE of 10.0 or less and
sarplesizes1-- than 80 am based the Poissondistributionand m ~li-le
eim- for defeczsper hundredunits hsoect
ion,or forpercentde@ctive
inspection(thePoissm distribution&&g an ~te q~
.Onto the
timid distrih.tim - theseconditions) TaMhted mluas,
selectedvaluesor
pmhabilitiesof aqanue (Pa,in
~) are gi- f= a&
ofth CUmes -, an& in addition,for tightenedimpectx
“on,and for M-
perhundred units for ZoflO. O orlessand sauplesizesof800r less.
4.~2-2
Amage S
qle SizeOzrves.
Averageample sizemrves for~le @
mltiple sanplingam in TableIX. = showthe averagesa@e sizeswMA may
be qed to omzr un&r the varioussa@ing plans
or q
levelsof prooess
quality. The
cumailmnt of ~im aml are ~roximte
the m-t tha-m e= upon the Poissondistribution,and that the s&e
sizes
for doubleand multiplesamli.ngare
assmed to &
0.631nand 0.25n
respectively,wheren is the
size.
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MIL-SlW105E
/
SEXZIC)N
TAW3SANOG7E7VES
.
u
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SINGLE
NORM L
14
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MULTIPLE
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