View
219
Download
0
Category
Tags:
Preview:
Citation preview
May 16, 2000 1
May 16, 2000 2
USB 2.0 Compliance And Tools
USB 2.0 Compliance And Tools
Kosta KoemanKosta Koeman
Software EngineerSoftware Engineer
Intel Architecture LabsIntel Architecture Labs
IntelIntel
May 16, 2000 3
AgendaAgenda
HistoryHistory Goal of the programGoal of the program Comparison of USB 1.1 and USB 2.0Comparison of USB 1.1 and USB 2.0 Similarities with USB 1.1 Compliance ProgramSimilarities with USB 1.1 Compliance Program Differences with USB 1.1 Compliance ProgramDifferences with USB 1.1 Compliance Program
May 16, 2000 4
HistoryHistory
USB 1.1 Compliance ProgramUSB 1.1 Compliance Program– Long evolution from 1996 (USB 1.0) to today (2000)Long evolution from 1996 (USB 1.0) to today (2000)
S3
Inrush
Signal Quality, S1
USBCheck, Hidview, Interoperability
Chap 11, OHCI, Current
Chap 9, UHCI, Drop/Droop
S3
Inrush
Signal Quality, S1
USBCheck, Hidview, Interoperability
Chap 11, OHCI, Current
Chap 9, UHCI, Drop/Droop
‘96‘96
YearYear
T e s ting
T e s ting
Level
Level
‘97‘97 ‘98‘98 ‘99‘99 ‘00‘00 ‘01‘01
May 16, 2000 5
Evolution of the ProgramEvolution of the Program
The USB 2.0 Compliance Program is an extension The USB 2.0 Compliance Program is an extension of the USB 1.1 Compliance Program.of the USB 1.1 Compliance Program.– Years of experienceYears of experience– Tools already in placeTools already in place
What this means…What this means…
USB 2.0 Compliance ProgramUSB 2.0 Compliance ProgramWill Start at a High Level!Will Start at a High Level!
USB 2.0 Compliance ProgramUSB 2.0 Compliance ProgramWill Start at a High Level!Will Start at a High Level!
TodayToday TomorrowTomorrow
USB2.0USB2.0
USB1.1USB1.1
May 16, 2000 6
Goal of the ProgramGoal of the Program
Solid, robust testing at a higher frequencySolid, robust testing at a higher frequency How will this be accomplished?How will this be accomplished?
– Leverage the experience and testing infrastructure Leverage the experience and testing infrastructure from the USB 1.1 Compliance Programfrom the USB 1.1 Compliance Program
– Modify current toolsModify current tools– Develop a new tool, couple of test fixturesDevelop a new tool, couple of test fixtures– Perform all tests at full and high speedsPerform all tests at full and high speeds
May 16, 2000 7
Comparison of USB 1.1 / 2.0Comparison of USB 1.1 / 2.0
Tighter timings constraints due toTighter timings constraints due tohigher (40 x) frequency higher (40 x) frequency
Dual speed support - Transaction TranslatorDual speed support - Transaction Translator Defined characteristics of both the transmitterDefined characteristics of both the transmitter
andand receiver receiver New test modesNew test modes Same cablesSame cables
May 16, 2000 8
Similarities & DifferencesSimilarities & Differences
Power requirementsPower requirements USBCheckUSBCheck InteroperabilityInteroperability Almost All Test Almost All Test
FixturesFixtures
ElectricalsElectricals– High Speed Signal QualityHigh Speed Signal Quality
Platform TestingPlatform Testing TDR TestingTDR Testing More Extensive Hub More Extensive Hub
TestingTesting– Transaction TranslatorTransaction Translator
SimilaritiesSimilarities DifferencesDifferences
May 16, 2000 9
SimilaritiesSimilarities
Power MeasurementsPower Measurements USBCheckUSBCheck InteroperabilityInteroperability Almost All Test FixturesAlmost All Test Fixtures
May 16, 2000 10
Power MeasurementsPower Measurements
500 500 a - a - Most devicesMost devices
2.5 ma - 2.5 ma - High powered (> 100 ma)High powered (> 100 ma)
-- Remote wakeup enabled) Remote wakeup enabled)
100 ma - 100 ma - High powered (>100 ma)High powered (>100 ma)
-- Remote wakeup enabled Remote wakeup enabled
-- WOL enabled WOL enabled
SuspendedSuspended
500 ma500 maOperatingOperating
500 ma500 maConfiguredConfigured
100 ma100 maUnconfiguredUnconfigured
May 16, 2000 11
Compliance Tool USBCheckCompliance Tool USBCheck
Small extensions to Chapter 9 & Chapter 11Small extensions to Chapter 9 & Chapter 11– Chapter 9: new descriptorsChapter 9: new descriptors
2 new 2 new Get DescriptorGet Descriptor tests tests Different endpoint constraintsDifferent endpoint constraints
– Chapter 11: new status bits & test modeChapter 11: new status bits & test mode 4 new port tests: Set/Clear Port Feature, PORT_TEST/PORT_INDICATOR 4 new port tests: Set/Clear Port Feature, PORT_TEST/PORT_INDICATOR
Core functionality is already thereCore functionality is already there – Chap 9: No new requests, only function/type extensionsChap 9: No new requests, only function/type extensions– Chap 11: Same events must be handled Chap 11: Same events must be handled
Connects, disconnects, reset, suspend, etc.Connects, disconnects, reset, suspend, etc.
Test at both high and full speedsTest at both high and full speeds
May 16, 2000 12
Get Device Qualifier Screenshot Get Device Qualifier Screenshot
Compliance Tool USBCheckCompliance Tool USBCheck
May 16, 2000 13
Interoperability TestingInteroperability Testing
Co-existence withCo-existence withUSB 1.1 devicesUSB 1.1 devices
Virtually sameVirtually same– All transfer typesAll transfer types– 5 hubs deep with 5 meter 5 hubs deep with 5 meter
cables (i.e. Tier 6)cables (i.e. Tier 6)– Mix of speedsMix of speeds
Test devices at both Full Test devices at both Full and High Speedsand High Speeds
RootRoot
HS HubHS Hub
DUTDUT
HS HubHS Hub
HS HubHS Hub
Other Devices
Other Devices
FS HubFS Hub HS HubHS Hub
HS HubHS Hub
May 16, 2000 14
Similarities – Test FixturesSimilarities – Test Fixtures
CurrentCurrent
InrushInrush DropDrop
DroopDroop
Full/Low Speed Full/Low Speed Signal QualitySignal Quality
May 16, 2000 15
DifferencesDifferences
ElectricalsElectricals– Signal QualitySignal Quality
Time Domain Reflectometer (TDR)Time Domain Reflectometer (TDR) Platform TestingPlatform Testing More Extensive Hub TestingMore Extensive Hub Testing
– Transaction TranslatorTransaction Translator
May 16, 2000 16
Differences in ElectricalsDifferences in Electricals
480 MHz = 40x Frequency480 MHz = 40x Frequency– Smaller margin for error!Smaller margin for error!
Have the process and tools defined earlyHave the process and tools defined early– Oscilloscope characteristicsOscilloscope characteristics– Tools to acquire data from scope to createTools to acquire data from scope to create
eye patternseye patterns– Test modes Test modes
Used to measure, capture eye patternUsed to measure, capture eye pattern Device independent way to test devicesDevice independent way to test devices
May 16, 2000 17
Signal QualitySignal Quality
USB 2.0 spec defines required eye pattern at USB 2.0 spec defines required eye pattern at internal/external connectorsinternal/external connectors– 6 Patterns - Templates6 Patterns - Templates
4 correspond to external connectors (TP2 & TP3)4 correspond to external connectors (TP2 & TP3) 2 correspond to internal connectors (TP1 & TP4)2 correspond to internal connectors (TP1 & TP4)
– Rise / Fall TimesRise / Fall Times– Allowance for jitterAllowance for jitter– Overshoot / undershootOvershoot / undershoot
Testing will be at external connectorsTesting will be at external connectors– New test fixture for high speed signal qualityNew test fixture for high speed signal quality
May 16, 2000 18
Test PointsTest Points
TransmitterTransmitter Receiver (New)Receiver (New)
USB CableUSB Cable
Device Circuit BoardDevice Circuit Board Hub / MotherboardHub / Motherboard
BBConnectorConnector
AAConnectorConnector
TracesTraces TracesTraces
TransceiverTransceiver TransceiverTransceiver
TP4TP4 TP3TP3 TP2TP2 TP1TP1
May 16, 2000 19
Eye Patterns TemplateEye Patterns Template
0 VoltsDifferential
+ 400mVDifferential
- 400mVDifferential
Unit Interval
Level 1
Level 2
Point 1 Point 2
Point 3 Point 4
Point 5 Point 6
0% 100%
May 16, 2000 20
TemplatesTemplates
Receiver sensitivity requirements for device Receiver sensitivity requirements for device without a captive cable with signal applied at without a captive cable with signal applied at TP3 and hub when a signal is applied at TP2TP3 and hub when a signal is applied at TP2
44
Receiver sensitivity requirements for device Receiver sensitivity requirements for device with captive cable with signal applied at TP2with captive cable with signal applied at TP2
33
Transmit waveform requirements for a device Transmit waveform requirements for a device with a captive cable measured at TP2with a captive cable measured at TP2
22
Transmit waveform requirements for hub Transmit waveform requirements for hub measured at TP2 and device measured at TP3measured at TP2 and device measured at TP3
11MeaningMeaningTemplateTemplate
May 16, 2000 21
Test Point ValuesTest Point Values
* First Value in UI Following a Transition, Second Value Applies to All Others* First Value in UI Following a Transition, Second Value Applies to All Others
Template 1Template 1 Template 2Template 2 Template 3Template 3 Template 4Template 4
VoltageVoltage TimeTime VoltageVoltage TimeTime VoltageVoltage TimeTime VoltageVoltage TimeTime
Level 1Level 1525 mV / 525 mV /
425 mV *425 mV *N/AN/A
525 mV / 525 mV /
425 mV *425 mV *N/AN/A 575 mV575 mV N/AN/A 575 mV575 mV N/AN/A
Level 2Level 2-525 mV / -525 mV /
-425 mV *-425 mV *N/AN/A
-525 mV / -525 mV /
-425 mV *-425 mV *N/AN/A -575 mV-575 mV N/AN/A -575 mV-575 mV N/AN/A
TP1TP1 0 V0 V 7.5%7.5% 0 V0 V 12.5%12.5% 0 V0 V 10%10% 0 V0 V 15%15%
TP2TP2 0 V0 V 92.5%92.5% 0 0V0 0V 87.5%87.5% 0 V0 V 90%90% 0 V0 V 85%85%
TP3TP3 300 mV300 mV 37.5%37.5% 175 mV175 mV 35%35% 275 mV275 mV 40%40% 150 mV150 mV 35%35%
TP4TP4 300 mV300 mV 62.5%62.5% 175 mV175 mV 65%65% 275 mV275 mV 60%60% 150 mV150 mV 65%65%
TP5TP5 -300 mV-300 mV 37.5%37.5% -175 mV-175 mV 35%35% -275 mV-275 mV 40%40% -150 mV-150 mV 35%35%
TP6TP6 -300 mV-300 mV 62.5%62.5% -175 mV-175 mV 65%65% -275 mV-275 mV 60%60% -150 mV-150 mV 65%65%
May 16, 2000 22
Sample Eye Pattern (TP2)Sample Eye Pattern (TP2)
May 16, 2000 23
Time Domain ReflectometerTime Domain Reflectometer
Acronym: TDRAcronym: TDR Means of measuring a receiver’s impedanceMeans of measuring a receiver’s impedance
– Receiver idle: D+, D- both at 0 voltsReceiver idle: D+, D- both at 0 volts Requires new test fixtureRequires new test fixture To be run on ALL devices, hubs, and hostsTo be run on ALL devices, hubs, and hosts
May 16, 2000 24
Platform TestingPlatform Testing
Eye Pattern Testing at TP2Eye Pattern Testing at TP2– Template 1 (Transmit)Template 1 (Transmit)– Template 4 (Receive)Template 4 (Receive)
TDR Testing TDR Testing MotherboardMotherboard
A ConnectorA Connector
TransceiverTransceiver
TP2TP2
TP1TP1
PC PlatformPC Platform
TracesTraces
May 16, 2000 25
Extensive Hub TestingExtensive Hub Testing
Signal Quality – Eye PatternsSignal Quality – Eye Patterns– At TP3 (downstream) in addition to TP2 (upstream) At TP3 (downstream) in addition to TP2 (upstream) – Both transmitting (Template 1) and receivingBoth transmitting (Template 1) and receiving
(Template 4)(Template 4) Hub specific commandsHub specific commands
– Port test modesPort test modes TDR TestingTDR Testing
– All connectors (upstream B, downstream A)All connectors (upstream B, downstream A) Transaction TranslatorTransaction Translator
May 16, 2000 26
Transaction TranslatorTransaction Translator
What is a Transaction Translator?What is a Transaction Translator?– Component of the hub that handles data transfers Component of the hub that handles data transfers
to/from full and low speed downstream devicesto/from full and low speed downstream devices When is it used?When is it used?
– Active when hub is configured at Active when hub is configured at high speedhigh speed and and fullfull and/or and/or low speedlow speed devices connected devices connected downstreamdownstream Buffers data transfersBuffers data transfers Finite spaceFinite space 2 kind of buffers2 kind of buffers 1 TT per hub OR 1 TT per port1 TT per hub OR 1 TT per port
May 16, 2000 27
Transaction TranslatorTransaction Translator Hub Components Hub Components
HSHS DeviceDevice
LS LS DeviceDevice
Port 1Port 1
480 MHz480 MHz12 MHz12 MHz1.5 MHz1.5 MHz
Port 2Port 2 Port NPort N
FS FS DeviceDevice
Hub Hub RepeaterRepeater
Hub Hub RepeaterRepeater
RoutingLogic
Hub Hub ControllerController
Hub Hub ControllerController
Hub StateHub StateMachinesMachines Hub StateHub StateMachinesMachines
High speed connectionHigh speed connection
TTTT11TTTT11
TTTT22TTTT22
TTTTNNTTTTNN
May 16, 2000 28
Transaction TranslatorTransaction Translator
How will we testHow will we test– Devices & hubs of mixed speeds below hub Devices & hubs of mixed speeds below hub – Set of rigorous tests to test TT using low/full Set of rigorous tests to test TT using low/full
speed devicespeed device Perform loopbackPerform loopback Both periodic & non-periodic transfers Both periodic & non-periodic transfers
(actually all transfer types)(actually all transfer types) Check for isochrony hiccups, data integrity, etc.Check for isochrony hiccups, data integrity, etc.
May 16, 2000 29
Transaction TranslatorTransaction Translator
TT InternalsTT Internals– Separate buffers for Separate buffers for
start/complete split start/complete split (periodic) transfers (periodic) transfers
– Data sent “just in Data sent “just in time” to minimize time” to minimize buffer spacebuffer space
– Minimum 2 buffers Minimum 2 buffers for non-periodic for non-periodic transferstransfers
Start-splitFIFO
Complete-splitFIFO
StartStartHandlerHandler
StartStartHandlerHandler
CompleteCompleteHandlerHandler
CompleteCompleteHandlerHandler
Full/LowFull/LowHandlerHandlerFull/LowFull/LowHandlerHandler
TT Microframe Pipeline for Periodic Split TransactionsTT Microframe Pipeline for Periodic Split Transactions
May 16, 2000 30
Oscilloscope RequirementsOscilloscope Requirements
List of scope / probe capabilities necessaryList of scope / probe capabilities necessary– 5 G Samples/sec5 G Samples/sec– 2 GHz bandwidth2 GHz bandwidth
List of scopes / probes with these capabilitiesList of scopes / probes with these capabilities– Scope: TDS 694C – 10 GS/s, 3 GHzScope: TDS 694C – 10 GS/s, 3 GHz– Probe: P6217 Fet probe – 4 GHz, 0.4 pf typProbe: P6217 Fet probe – 4 GHz, 0.4 pf typ– More scopes and probes to be addedMore scopes and probes to be added
May 16, 2000 31
ConclusionConclusion
Two significant additions for USB2.0 ComplianceTwo significant additions for USB2.0 Compliance– Electrical TestingElectrical Testing– Transaction Translator TestingTransaction Translator Testing
Rest of stuff is the same with only slight Rest of stuff is the same with only slight modificationsmodifications
Start the with the bar Start the with the bar alreadyalready high! high!
May 16, 2000 32
Recommended