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Ion Beam Analysis

Lukhwa Rendani Physics Department University of the Western Cape, South Africa

Nolufundo Sintwa University of Fort Hare, South Africa

Sinazo Mselana University of Fort Hare, South Africa

Supervised by A.P. Kobzev Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research,

Dubna, Russia

Aim

• To determine the elemental composition of thin films on the surface solid Target

• Enables technology for thin film scientists and engineer

• Possible applications are:

– Microelectronics

– Forensic etc.

JINR Student Practice 2014 2 9/24/2014

Sinazo Mselana

University of Fort Hare

Part 1: Accelerator & PIXE

JINR Student Practice 2014 4 9/24/2014

Parameters of EG-5 Accelerator

• Energy Region : 0.9-3.5Mev

• Beam intensity for H+ :30μA

• Beam intensity for He+ :10μA

• Energy Spread <500 eV

• Number of beam lines : 6

JINR Student Practice 2014 5 9/24/2014

PIXE- Particle Induced X-ray Emission Method

• Proton beams are mainly used

– Ionization of atom

– Si(Li) Detector

– Energy resolution about 150eV

JINR Student Practice 2014 6 9/24/2014

Moseley’s law

Moseley law

• Rc – Rydberg’s constant

• Z – atomic number

• Sn – screening constant

• n – main quantum number

• ν - frequency of X-ray quantum

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PIXE Results

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Aerosol analysis by PIXE & RBS

JINR Student Practice 2014 9 9/24/2014

Nolufundo Sintwa

University of Fort Hare

Part 2:RBS-Rutherford Backscattering Spectrometry Method

• Near-surface layer analysis of solids

• Elemental composition

• depth profiling of individual elements

• Very sensitive for heavy elements

• Less sensitive for light elements

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Experimental chamber

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RBS

• Kinematic Factor

• Cross-section

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RBS Program used for the analysis of experimental results was SIMNRA

Experimental condition

• Calibration – Offset=27.95keV

– Energy/channel=2.185

• Number of particles – 1.56E11

• Thickness – Nb =161nm

400 600 800

0

500

1000

1500

2000

2500

3000

3500

4000

Co

un

ts

channel

Energy [keV]

experimental

simulated

Sb

Nb

substrate: Si

E=2297keV

=1700

JINR Student Practice 2014 14 9/24/2014

Rendani Lukhwa

University of the Western Cape

Part 3:ERD-Elastic Recoil Detection

• Forward Recoil

• Good for light elements(H,D)

• Al foil

JINR Student Practice 2014 16 9/24/2014

RBS

200 400 600

0

1000

2000

3000

4000

5000

Cou

nts

channel

experimental

simulated

C 41%

H 19%

Si 40%

H 13%

C 45%

Si 42%

H 13.5%

Si 86.5%

H 3%

Si 97%

JINR Student Practice 2014 17 9/24/2014

ERD

200 400 600

50

100

150

200

250

300

Cou

nts

channel

experimental

simulated

Si 40%

H 19%

C 41%

H 13%

C 45%

Si 42%H 13.5%

Si 86.5%

H 3%

Si 97%

JINR Student Practice 2014 18 9/24/2014

Conclusion

• Three methods were used in order to obtain information about elements depth contents for different elements from hydrogen to barium

• Sensitivity of method for heavy elements less than 0.001 atomic %

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Acknowledgements

• Dr Mirosław Kulik

9/24/2014 JINR Student Practice 2014 20

Thanks for your attention

9/24/2014 JINR Student Practice 2014 21

From left to right : Dr A.P Kobzev, Sintwa Nolufundo, Lukhwa Rendani, Sinazo Mselana and Dr Mirosław Kulik

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