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OIM Analysis
OIM scan data will be analyzed in form of Map, Chart, Plot and combined
them. It will be analyze the texture or micro structure to know therelationship between these texture and properties of the sample.
Information from OIM scan data analysis will depends on capability
or knowledge of people who analyze the data.
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OIM Analysis
OIM scan data is analyzed in form of Map, Chart, Plot and combined them.
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In OIM a project contains all of the documents created duringan analysis session.
Project
A chart that combines results from any partition in theproject
OIM Datasets
Partitions. Essentially subsets of the data that meet some
user prescribed criteria.
Texture plots (of intensities) such as a Pole Figures or
ODFs.
A Texture this contains all of the results for a given
calculations. I.e. for a user prescribed set of parameters.
A Chart e.g. grain size distribution, IQ distribution
A discrete orientation plot such as a pole figure or an ODF
I.e. discrete points plotted in Euler space.
A map
Project Tree
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Layer structure of the program
Parameters which control the program and analysis
Preference
Project
Dataset Dataset Dataset
Partition Partition Partition Partition
Parameters which control whole program.
Functions which affect to all partition
under each Dataset
Parameters which define properties of analysis for
each partition.Grain size, boundaries, etc
[ Multi Chart ]
The parameters or functions will affects to all under that level.
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OIM Analysis
Lets draw OIM map
Each scan data will be opened under Project.The scan data is called as Dataset. And
partition, All data, will be created
automatically. Map, Plot, or Chat will be
drawn under partition.
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Practice:
Lets draw OIM map using Alpha-Steel
Open Alpha-Steel data and draw following maps using Quick Gen buttons
Image Quality map (IQ map)
Inverse Pole Figure mapIPF map Grain map (Unique Grain Color map)
IQ map IPF map Grain map
Lets use these Quick Gen buttons.
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Maps
Boundaries
Rotation AngleRotation Axis
Axis/Angle
Grain
Phase
CSL
Shape Ellipses
ReconstructedReconstructed Twins
Gray Scale
Image Quality
Confidence IndexFit
Detector Signal
Grain Size
Grain Shape Orientation
Grain Shape Aspect Ratio
Grain Average IQGrain Average CI
Grain Average Video Signal
Kernel Average Misorientation
Grain Orientation Spread
Grain Average Misorientation
Grain Reference Orientation
DeviationTaylor Factor
Schmid Factor
Import Data
Color Scale
Image QualityConfidence Index
Fit
Detector Signal
Phase
EDS
Inverse Pole Figure
Crystal DirectionCrystal Orientation
Euler Angle RGB
Unique Grain Color
Grain Size
Grain Shape Orientation
Grain Shape Aspect RatioGrain Average IQ
Grain Average CI
Grain Average Fit
Grain Average Video Signal
Kernel Average Misorientation
Grain Orientation Spread
Grain Average MisorientationTaylor Factor
Schmid Factor
Elastic Stiffness
Twin Parent/Daughter
Import Data
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Maps
Non-Orientation Scalar maps IQ, CI, fit, Other detectors (FSD,
SED, X-Ray), phase
Grain Based Maps size, shape, avg IQ, orientation spreadOrientation based maps IPF map (2D), Euler Angle map,
Component maps
Misorientation Based Maps local misorientation (strain)
Property Maps Taylor or Schmid Factor, Elastic Modulus
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21.6
84.9
Image Quality : 195.3
Image Quality : 62.6
Maps: Image Quality map
IQ map is drawn based on the peak intensity of Hough transformation. If the pattern is
clear which means the crystal has less distortion. If IQ value is low, that point has more
distortion with crystal, or contaminated or damaged.
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Maps: Orientation map
Inverse Pole FigureIPF map)
Normal
Direction
Transverse
Direction
Reference
Direction
In case of IPF map, it should be first specified some sample plane, such as ND plane, then
find which crystal plane becomes parallel to this specified sample plane. Then each pixelis pained depends on the crystal plane using right color key.
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Orientation map such as IPF map is made based on sample coordinate, not the
sample surface. If ND sample plane is specified, the crystal plane which parallel to
the ND normal plane for each pixel. It doesnt mean the same as sample surface.
So it should be always careful about sample coordinate system.
TD(Y)
RD(X)
(X)
(Y)
(Z)
ND(Z)
NDTD
RD
Maps: IPF map
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NDTD
RD
Maps: IPF map
Sample Surface
normal direction If we want to know the crystalindices of this fractures surface,
we need to know the plane
normal direction.
If we find the plane normal
direction, (RD,TD,ND), is (1,3,11),
Then we can know the crystal
indices of this fractures surface
by input these data to specify
sample surface.
RD
TDND
If we select Map Data at Status bar text in
Preference shown by red arrows, then after
specifying the sample surface, the point dataspecify cursor will be shown as below. .
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Maps: Orientation map
Crystal Direction Map It picked up the pixels which has specified crystalDirection along with also specified sample direction. Itspecify only one direction. It doesnt care the rotation
around specified sample direction.
(It is not the crystal plane normal direction. )
Specify sample direction
Specify crystal direction or crystal plane normal.
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Maps: Orientation map
Crystal Orientation Map It pick up the pixels which has the specific crystalorientation shown by (hkl) presentation. (hkl) showsthe crystal plane parallel to the sample ND normal plane.
shows the crystal direction of sample RD direction.
(hkl) normal direction and is perpendicular.
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Maps: Area fraction of specified data
It is also possible to know area fraction of each specified area of Crystal
Direction map or Crystal Orientation map.
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(10 0 3)
IPF map Sn sample Crystal Direction map
Difference of IPF Maps and Crystal Direction Map
PF and IPF are defined by crystal plane,
not crystal direction. It is common thatcrystal plane normal and crystal
direction with same Millar indices are
not the same.
Pixels which has
crystal direction is nearly
same as (11 0 1) plane
normal, not (10 0 3).
Pick up the grains which (10 0 3)
plane becomes normal to the
sample ND plane.
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Maps: Map Color
Map color can be selected following color bar
list. Or it can be specified by user preferences.
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Practice:
Lets draw Crystal Direction Map using Sn-Solder scan data.
1 2
Put 1, 1, 2 either Crystal Direction(1) or
Pole(Plane) (2) and see the difference.
P ti
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Practice
Lets paint in different color for following area in Crystal Direction Map.
Specify (001) plane normal along with ND direction with following rejoin.
0 55 1010 1515 20
G O
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Grains in OIM
Grains in OIM is defined by Tolerance Angle and Minimum Grain Size (number of grains).
Neighbor pixels within this tolerance angle are considered to belong to the same grain and ifpixels equal or more than Minimum Grain Size are connected within the Tolerance angle, they
are considered as independent gain. This definition is same as connecting boundary more
than Tolerance angle and make closed loop or touch to the scan boundary. Under this
definition, we may see the boundary more than Tolerance Angle in grains as shown in below.
A
B C
G i i OIM
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Grains in Unique Grain Color map are very much depends on the grain definition (Tolerance
Angle and Minimum Grain Size). As following example of Alpha-Steel, we can see big changesof grain size depending on the definition. Users need to think how they define the grain
thinking about their objects of Analysis.
Tolerance Angle =
2 deg.
Grains in OIM
Tolerance Angle =
5 deg.
Tolerance Angle =
3 deg.
P titi P ti
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Partitions Properties
The definition of Grain is one of the most important parameter.
If we change some
parameters in PartitionProperties, all the maps,
charts and plots under
this partition are affected.
Minimum angle to separate pixels
into two grains
Minimum number of pixels to
consists of grains
Specify that the edged
grains are included ornot in the analysis.
P ti
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Practice
Lets check the changes of grains by changing the definition of grain.
See the difference of grains by changing the parameter of Tolerance Angle and Minimum
Grain Size in Partition Property .
Data : Alpha_Steel Grain Tolerance Angle = 3 and 5 deg.
P titi P ti
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Partitions Properties
CI, IQ, Video Signal (SEM singnal)can be used to filter the scan data.Mathematical operant can be used to combine the filter condition.
Partition Properties
If we change some
parameters in Partition
Properties, all the maps,
charts and plots under
this partition are affected.
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P titi P ti
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Partitions Properties
IQ > 50 is set in Partition/Formula. This
means pixels which has IQ value more than
50 will be used for analysis.
The condition specified in Partition/Formula
will affect all data under this partition.
P titi P ti
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Partitions Properties
It is included not desirable data for analysis.
The data with pixels IQ < 50 are
excluded from the analysis.
Practice
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Practice
Lets check how parameters in Formula in Partition Property will affects to the
analysis of scan data.
Data : Cu IC Line Check IQ or CI to remove un-necessary data from the
scan data.
M Mi i t ti M
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Grain Orientation Spread
For a given grain calculate theaverage misorientation between all
data points in the grain.
Grain Average Misorientation
For a given grain calculate theaverage misorientation between all
neighboring data points in the grain.
Kernel Average Misorientation
For a given data point calculate theaverage misorientation between the
data point and all of its neighbors
(exclude misorientations greater than
some prescribed value - 5 in this
case)
Maps: Misorientation Map
Maps: Misorientation Map
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Grain Reference Orientation DeviationShow the deviation of each point in the grain with respect to a reference orientation. Two
types of references are possible: 1) The average orientation for the grain and 2) the
orientation of the point in the grain with the lowest Average Kernel Misorientation.
Maps: Misorientation Map
Grain Average Misorientation map
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0.0mm 3.0mm 5.0mm 7.0mm 8.0mm
7.0mm
Grain Average Misorientation map
Cross section of Al ample under bending test was
observed. Grain Average Misorientaion maps were
made for each bended condition. We can see that the
Grain Average Misorientation Value is increasingaccording to bending angle.
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Maps: Phase map
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Maps: Phase map
All dataPartition
Maps: Phase map
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Maps: Phase map
In case of multi phase data, Allpartition and partitions for each
Phase will be made
automatically.
Maps: Phase map
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Maps: Phase map
CI map of above
phase map.
CI map of
appropriate scan.
If two phases with same crystal structure, it is not
possible to distinguish these two phases. Then it
becomes messy map.
Grain Boundary in OIM
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If edge between two pixels exceeds the specified rotation angle, the edgeis considered as boundary.
g
OIM has three types of boundaries.
Basic boundaries which is used for boundary
fraction. It contains all sub-grain boundary.
Boundary to define grains
Boundary must be closed or connected to scan
boundaries.
(Same as the definition in material science)
Boundaries which are used to boundaries.
These boundaries are defined by rotation angle
or axis angle, twins or CLS.This one segment becomes
a unit of grain boundaries.
Grain Boundary in OIM
Boundary menu in OIM Software
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Boundary menu in OIM Software
Select the type of boundary
from this area.
Definition of Grain boundary
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Definition of Grain boundary
Grain 1 Grain 2
Boundary plane
Boundary
Two parameters are necessary todefine boundary character.
1. Rotation Angle/ Common Axis
2. Boundary plane
EBSD doesnt have info in depth direction. So there is
no info about Boundary plane in EBSD analysis.
* It is not possible to distinguish these two
difference without boundary plane info.
Boundaries
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Rotation Angle A line segment is drawn between two neighboring points if themisorientation falls in a given range (e.g. between 5 and 15 degrees)
Axis/Angle A line segment is drawn between two neighboring points if themisorientation between the two points is within a given tolerance of a
specified ideal misorientation where defined by an axis/angle pair (e.g. 60degrees about ).
Grain A line segment is drawn between two neighboring points if they belong totwo different grains.
Phase A line segment is drawn between two neighboring points if they belong totwo different phases.
CSL A line segment is drawn between two neighboring points if they are within agiven tolerance of specified CSL (coincident site lattice boundary).
Shape Ellipses An ellipse is fit to each grain in the map and then overlaid on the map.
Boundaries
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Baoundary: Rotation Angle
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Baoundary: Rotation Angle
Rotation Angle
A line segment is drawn between two neighboring points if the
misorientation falls in a given range. (60 5 in this example.)
This is very basic way to show the boundary in OIM. This boundary
is just for display. And it is not necessary to be closed loop.
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Preferences
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Preferences
OIM-A5.2
Boundary : Minimum Misorientation
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Boundary : Minimum Misorientation
Attention must be paid that the Rotation Angle boundaries which rotation angle is less than
Minimum Boundary Misorientation will be ignored to display the boundary.
minimum boundary misorientation
= 2 degrees
minimum boundary misorientation
= 0.5 degrees
Practice
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Practice
Lets draw rotation angle boundary using Rolled Steel data.
Draw rotation angle boundary with rotation Angle , 1~55~15 and15~180(65) deg. on Image Quality map.
Change Minimum Boundary Misorientation value in Preference.
Boundaries: Axis/Angle
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Rotation Angle A line segment isdrawn between two neighboring points if
the misorientation falls in a given range.
(60 5 in this example.)
Rotation Axis A line segment is drawn
between two neighboring points if the
two orientations have specified
directions aligned within a specified
tolerance. ( crystal directions
aligned within 5 of each other in this
example.)
Axis/Angle A line segment is drawn
between two neighboring points if the
misorientation between the two points is
within a given tolerance of a specified
ideal misorientation where defined by an
axis/angle pair. (within 10 of 60
about in this example.)
Axis/Angle
Boundaries: Axis/Angle
Boundaries: CSL
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CSL A line segment isdrawn between two
neighboring points if they
are within a given tolerance
of specified CSL (coincident
site lattice boundary).Coincident site lattice
boundaries are special
boundaries where a given
fraction of the atoms at the
boundary are in coincident
positions. The numberfraction of coincident atom
sites are given by 1/. An
example is given for 5
which corresponds to a
36.9 rotation about .The tolerance is given by
K/n. The default settingscorrespond to Brandons
criterion (K=15 and n = ).
Boundaries: CSL
Equivalency in Grain Boundary
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Rotated 70.5 deg/
Rotated 60 deg/
Equivalency in Grain Boundary
Ni Annealed twins
1
2
Grain boundaries are calculated based on
relationship between rotation angle and common
axis. Sometimes two (or more) different rotation
angle and common axis relations show the same
relations.
Grain 1 is..
These areexactly same.
Practice
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Practice
Lets draw the following boundaries using Ni-Std_small-area data.
Rotation angle: Rotation angle more than 15 deg.
Axis Angle : 60 deg rotation around common axis.
CSL boundary : 3 boundary
Boundaries: Reconstructed
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Reconstructed A line is fit to a set of grain boundary line
segments and drawn on the map. It is drawn between two triplejunctions.
*Reconstructed Twins Reconstructed boundaries can be
colored according to their fit to specific twin boundary criteria
both in terms of misorientation and twin plane/boundary alignment.
First the average misorientation of the segments the reconstructedboundary represents is calculated. In this case the average
misorientation must be within 9of a 60rotation about
(the primary recrystallization twin in fcc materials) and the (111)
plane trace must also be aligned with 9 of the reconstructed
boundary.
Extraction of Twins from Orientation Imaging Microscopy Scan Data S. I. Wright, R. J. Larsen,
Journal of Microscopy, 205, 245-252 (2002).
Boundaries: Reconstructed
Grains without twin boundaries
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Grains without twin boundaries
It is possible to recognize grainswithout twin boundaries.
If you want to remove just coherent twins, specify here.
Add twin boundary condition to
be removed.
Specify twin boundary
indecies to be removed.
Rotation Angle
Common Rotation axis
Practice
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act ce
Lets draw a Unique Grain Color map without twin boundaries using Ni-
Std_smalloarea data.
Sub menu for Map display
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p p y
Additional functions for Map display.
Map/FlexView
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p
Unit Cell, Pole Figure and
Reconstructed EBSD patternof the point specified by cursor
will be shown in both Flyby or
Static mode on FlexView tag.
Chart
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Image Quality
Confidence Index
FitVideo Signal
Grain Size (points)
Grain Size (diameter)
Grain Size (area)
Grain Size (ASTM)
Grain Size (Intercept)
Grain Shape Orientation
Grain Shape Aspect Ratio
Grain Average IQ
Grain Average CI
Grain Average Fit
Grain Average Video Signal
Grain Orientation SpreadGrain Average Misorientation
Kernel Average Misorientation
Crystal Orientation
Crystal Direction
Pole Plot
Pseudo Rocking Curve
Kearns ParameterTaylor Factor
Schmid Factor
Elastic Stiffness
Misorientation Angle
Misorientation Profile
CSL BoundariesCSL Deviation
GBCD
Boundary Density
Texture Fiber
Texture Index
Texture Gradient
EDS
Phase
All data shown in Maps or Plots can be
shown in Chart, too. There are several
Chart only data in the menu.
Chart Menu in OIM
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Select required chart
in Type and set
detail condition by
opening Edit.
Charts: Grain Size
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Grain Size (points): Number of measurement points in a grain
Grain Size (diameter): The diameter (D) is calculated from the area (A) assuming the grain is a circle: D
= (4A/)1/2.
Grain Size (area): The area (A) of a grain is the number (N) of points in the grain multiplied by a factor of
the step size (s). For square grids: A = Ns2. For hexagonal grids: A = N3/2s2
Grain Size (ASTM): G = -6.64*log10(D) - 2.95 where D is the grain diameter given in mm
Grain Size (Intercept): Vertical or linear intercepts
Charts: Grain Size
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The area (A) of a grain is the number (N) of points in the grain
multiplied by a factor of the step size (s).
For square grids: A = Ns2
For hexagonal grids: A = N3/2s2The diameter (D) is calculated from the area (A) assuming thegrain is a circle: D = (4A/)1/2.
Data used for making chart is shown in right side.
Charts: Grain Size
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Calculation methods for Averaging.
Average by Number method
Average by Area Fraction method
Total area: 100
8
8
25
59
Average by Number method
100/4 = 25
Average by Area Fraction method
8*0.16 + 25*0.25 + 59*0.59
= 42.34
Practice
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Lets draw Grain Size chart using Alpha-Steel data.
Draw a chart using Log scale or Liner Scale.
Check what happen when Tolerance for grain recognition in Partition
Properties.
Chart : Crystal Direction
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y
Cumulative
Chart : Misorientation Profile
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Map data can be plot in addition to
Misorientation data.
IQ ValueMisorientation between neighbor pixels
Misorientation against start point
Practice
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Lets make Profile Vector chart using Alpha-Steel map data. Draw a line on the
map and make the misorientation chart.
Use this Profile Vector icon.
Chart : Misorientation Angle
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Misorientation Angle chart shows the
misorientation angle of boundaries in the map.
We can see that the low angle boundaries are
major part of boundaries.
Chart : Graphics
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All Map data and Plot data can be shown in chart
format. Also there are several chart only menus.
Setting detail condition for the chart.
Chart: Graphics
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We can change Chart style
using Graphic properties.
Practice
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1. Lets draw Misorientation chart using Ni-Std_small-area.
2. Change character size or make the Chart in 3D format.
Chart : Boundary Density
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Boundary Density shows the density of the
boundaries with specified angle (total lengthof specified boundaries divided by area) in
cumulative format.
Example of partial annealed steel
20% 60% 85%
Multi Chart
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Practice
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1. Draw charts for IQ value of phase using Dual Phase Titanium.
2. Draw multi chart for IQ values of both phase and phase using Dual
Phase Titanium.
Pole Figure, Inverse Pole Figure, ODF
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Pole Figure
Inverse Pole Figure
Euler spaceBunge
Kocks
Roe
Rodrigues Orientation
Rodrigues MisorientationAxis/Angle Misorientation
Discrete Plots Al Evaporation Film
IPF map (ND) IPF map (RD)
Lets think about Pole Figure, Inverse Pole Figure and ODF
using this example.
Pole Figure : Specify some crystal plane and show the relationship between that crystal plane
normal and sample coordinate using stereo projection.
Inverse Pole Figure :
Specify some sample plane such as ND plane and show the crystal plane normal
which becomes parallel to the specified sample plane.
Discrete Plots : Pole Figure
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Specify Crystal plane
Data : Al-film
Any crystal plane can be specified, butgenerally it uses (001), (101) and (111) planes
in case of cubic.
Edit detail display condition
Discrete Plots : Inverse Pole Figure
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Specify sample plane normal by vector value. Data : Al-film
Any sample plane can be specified, butgenerally it uses RD, TD, ND planes.
Select Inverse Pole Figure
[RD, TD, ND] components are shown.
Discrete Plots: ODF plot
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Euler angles of each pixel are plot
directly in 3D display. There is 90
degrees symmetry in cubic, so it is
shown in (90, 90, 90) deg area. 3D
display is not so convenient. It isgenerally shown using 2 asconstant value as shown in left.
We can see that the orientations
are continuously changed.
In ODF plot, one point can display
complete orientation.
Data : Al-film
Select Inverse Euler Space
Practice
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Lets draw Pole Figure, Inverse Pole Figure and ODF of Al Extrusion data, and
think about features in texture of data.
IPF(ND) map
Intensity Plots : Pole Figure
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Data : Al-film
If the points in Pole Figures overlap each other, we cannot tell how many points are
overlapped. Then we need to convert this discrete plot to intensity plot.
There are two methods to calculate intensity of Pole
Figure or inverse Pole Figure or ODF, Harmonic Series
Expansion and Discrete Binning methods. Level key is calculated based on perfect random
distribution. Perfect random becomes intensity 1.
And number of intensity means multiple of perfect
random.
Intensity Plots : Calculation methods
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Data : Al-film
We cannot see so much difference between the results of these two methods in case of Al film
sample, except absolute intensity. But generally it becomes very difficult to calculate the
intensity around the center (around ND axis in the following case) in Discrete Binning . Becauseof that the area becomes infinity small at the center. Harmonic Series Expansion doesnt have
such problem. So Harmonic Series Expansion is better to calculate intensity.
Harmonic Series Expansion Discrete Binning
Intensity Plots : Calculation methods
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Data : Ni-Std_small-area
Harmonic Series Expansion is generally better to calculate the intensity. But like following case, a
group of very strong single peak , such as single crystal, the intensity plot becomes very strange
as follows. It becomes from oscillation term of series expansion calculation. The intensity is veryclose to 1, so there is actually no problem. But it looks very bad. There is no such problem with
Discrete Intensity method.
Harmonic Series Expansion Discrete Binning
Resolution of Intensity calculation.
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L=16
=5
L=16
=2
If we improve the resolution, the peakbecomes shaper, and looks like more real
plot. But it will take a lot of time for
calculation.
Intensity Plots : Adjust display
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Edit the display methods ofintensity plot by clicking Edit and
open scale window.
There will be three major factors to be
adjusted.
1. Iselect ntensity plot or Counter plot.
2. Scale can be set as absolute value
scale.
3. Display color, B&W or Color display.
1
2
3
Practice
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Lets make Pole Figure and Inverse Pole Figure in absolute scale using Al-Bend_00and Al-Bend_80. The compare it how they are different.
Pole Figure of Al-Bend_00
Practice
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These are examples of Pole Figure and Inverse Pole Figure. If this sample has these PF and IPF,
please think how IPF map of this sample should look like.
ND TD
RD
Practice
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IPF maps of previous sample look like as follows.
IPF map (ND)IPF map (RD) IPF map (TD)
Highlighting
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Highlight is a function to make relationship among Maps, Plots and Charts. It is very
effective to show some specific features of the texture.
Highlighting: Toolbar
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Record: record highlighting results in
the Interactive pane of themap window.
Undo Back to previous situation ofHighlighting.
Redo Move forward from Undo situation.Clear Clear all highlight data
Show Interactive Properties by click
right mouse and select properties.
Specify detail of displayed info
in Interactive page.
Highlighting: Toolbar
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Highlight the point clicked.
Highlight all orientations within
a given tolerance of the point
clicked.
Define the color to be used.
Highlighting: Toolbar
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Highlight all orientations withingrain and color them according to
the angular distance from the
point clicked.
Define the color to be used.
Highlighting: Toolbar
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Calculate misorientation between two
points.
Calculate misorientations at a triple
junction. Actually it repeats two points
misorientation calculation three times.
Highlighting: Toolbar
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Displays a crystal direction
parallel to a line.
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Highlighting: Toolbar
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Angular tolerance used for various
highlighting modes.
Tolerance = 30 Tolerance = 15
Define the (hkl) for the plane traces.
Use the average grain orientations
when calculating misorientations.
Highlighting: Toolbar
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Find all points in the scan within the
angular tolerance of the point clicked in
discrete plot.
Calculate the misorientation between
two points in a discrete plot
Define the color to be used.
Highlighting: Toolbar
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Select a color gradient multiple point highlights.
Select a color for individual
highlights.
Highlighted -> Partition
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Crystal Direction map along with TD
direction within 10 deg of CVD-Ta data.
Practice
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Lets separate grains into Recrystallized grains and Non-recrystallized grains ofPart-Rx Steel data. Then draw boundary density for both two groups of grains.
Please try to use Multi chart to show the difference of boundary density.
IQ of Part-Rx Steel data
Clean Up
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Sometimes there are isolated points that are not indexed correctly or at all due todust particles or pits on the surface. Various clean up schemes are available to
assign these points an orientation based on their neighbors.
Some danger in Clean Up procedure
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This is an example of Clean-upresult by Grain Dilation method. IfClean-up is done by not appropriatemethod it makes artifact to the data.
On the other hand if Grain boundaryfeatures are studied it is notappropriate to analyze them with manybad points at grain boundary like theleft map. Clean-up is necessary in thiscase. Users need to judge what is done inClean-up procedures and also needto check the results are reasonableor containing artifacts.
Clean-Up menu
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OIM Analysis Software has manyClean-up methods as shown in
left Figure. Users need to select
suitable ways to do clean up the
data.
As shown before, Clean-up may
introduce artifacts. So the user
has to check the results
comparing with original data and
find if it is reasonable or
introducing unacceptable artifacts.
Grain CI Standardization
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Grain CI Standardization is check CI values of allpixels in recognized grains and change their CIvalues to the highest one in the grains as follows.This method does not change any orientationdata and only helps to identify points that arecorrectly indexed but may have had a lowerconfidence index.
Grain CI Standardization
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Grain CI Standardization
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As-collected
CI>0.1 96.5%
Grain CI Standardization
CI>0.1 98.9%
Grain CI Standardization
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IPF map (CI>0.3)CI map
Before Clean Up
CI Chart
After Clean Up
Only CI values are changed. Any other date will be stay same.
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Clean up
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However, it is important to make sure that the resulting microstructure makes sense also
watch the texture and grain boundary changes.
Grain DilationCu IC Lines data
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Cu IC Lines data
Clean up by Grain Dilation
method w/o single iteration.IPF Filtered the clean up data by IQ>50.
If single iteration is checked, Grain Dilation Clean up stop the
procedure after it cleans up (expands) the data one pixel layer.
Clean up with single
Iteration
After clean up process, it some
artifacts are introduced, there are
some cases we can remove those
artifacts by filtering the data by
other parameters such as IQ, CIWe should be careful that those
cleaned up pixels has modified
orientation data, CI data.
Grain Dilation (Single Iteration)
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Original IPF 1st Iteration 2nd Iteration 3rd Iteration
4th
Iteration 5th
Iteration 6th
Iteration 7th
Iteration
Practice
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Lets compare the Misorientation chart of Cu_Cold-Rolled92 data before andafter clean up. ( Use Grain Dilation method.)
Data Process at DataSet level
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If you use the data processfunctions in red box, all the
partition data under this dataset
will be affected by these
processes.
Coarsen removes pixels
every two pixels and the
data 1/4 size.
Rotation
R i i d f d
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Rotate orientation data of dataset.
Be careful!! It rotate only orientation data. It
is not rotate the image data. The image
(grain shape) stay same and only the
orientation data is rotated. So after this
rotate process, there happens discrepancy
between image data and orientation data.
Practice
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Lets draw IPF(ND) map and Pole Figure of CVD-Ta data. The rotate the dataaround RD axis by 90 deg. and check the difference from original data.
Crop
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Cut out the specified area and make it as a new dataset.
Select Single Rectangle or Multiple
Polygons. In case of Multiple Polygons,
continuous left click specify the area
and final right click close the polygon.
Merge
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Datasets can be merged
together.
The relative positioning
of the datasets is
controlled by the user.
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Practice
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1. Crop one grain from Steel_Fcc-Bcc data and check the orientationrelationship between FCC phase and BCC phase.
2. Merge Al-FSW1, Al-FSW2 and Al-FSW3 data and make them as one dataset.
Templates
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The conditions to make Map, Plot, Chart can
be saved as Templates. The apply these
templates to other data to draw Map, Plot
and Chart with same condition.
Save Template
Apply Template to the Partition
Templates
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Map, Plot and Chart conditions can be saved as individual templates. Not only individual
templates, all Map, Plot and Chart conditions can be saved as one partition Template .It is very convenient to draw same series of data for different dataset .
Map, Plot and Chart conditions are saved as one
template at Partition level.
When Partition Template is applied, it must be
done at one level higher, Dataset level.
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Batch Processor
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A tool to apply a partition template to multiple
sets of data.
Includes Rotate, Cleanup, Crop, and Export
functions.
An alignment function to align consecutive
sets of data for a sequence of scans, e.g.
from serial sectioning or slices in time.
Recommended